JPS51139268A - Method of producing pattern - Google Patents
Method of producing patternInfo
- Publication number
- JPS51139268A JPS51139268A JP6288175A JP6288175A JPS51139268A JP S51139268 A JPS51139268 A JP S51139268A JP 6288175 A JP6288175 A JP 6288175A JP 6288175 A JP6288175 A JP 6288175A JP S51139268 A JPS51139268 A JP S51139268A
- Authority
- JP
- Japan
- Prior art keywords
- patterns
- producing pattern
- transparent
- different
- resist
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/20—Dry etching; Plasma etching; Reactive-ion etching
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Drying Of Semiconductors (AREA)
- Weting (AREA)
Abstract
PURPOSE: To simultaneously form two patterns of different structures by causing exposure of a resist formed on two-layer substance by using a mask having patterns which are non-transparent and semi-transparent with respect to the exposure light to thereby form patterns of different resist thicknesses and then etching the two layers.
COPYRIGHT: (C)1976,JPO&Japio
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50062881A JPS609342B2 (en) | 1975-05-28 | 1975-05-28 | How to make a pattern |
| DE19762623688 DE2623688A1 (en) | 1975-05-28 | 1976-05-26 | Pattern prodn. for semiconductors and magnetic bubbles - photosensitive varnish film is applied on at least two laminated layers on substrate (NL301176) |
| NL7605809A NL7605809A (en) | 1975-05-28 | 1976-05-28 | METHOD OF FORMING A PATTERN AND OBTAINED PRODUCTION. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50062881A JPS609342B2 (en) | 1975-05-28 | 1975-05-28 | How to make a pattern |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS51139268A true JPS51139268A (en) | 1976-12-01 |
| JPS609342B2 JPS609342B2 (en) | 1985-03-09 |
Family
ID=13213039
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50062881A Expired JPS609342B2 (en) | 1975-05-28 | 1975-05-28 | How to make a pattern |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPS609342B2 (en) |
| DE (1) | DE2623688A1 (en) |
| NL (1) | NL7605809A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5635137A (en) * | 1979-08-31 | 1981-04-07 | Nec Corp | Photomask |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4244799A (en) * | 1978-09-11 | 1981-01-13 | Bell Telephone Laboratories, Incorporated | Fabrication of integrated circuits utilizing thick high-resolution patterns |
| AT382040B (en) * | 1983-03-01 | 1986-12-29 | Guenther Stangl | METHOD FOR PRODUCING OPTICALLY STRUCTURED FILTERS FOR ELECTROMAGNETIC RADIATION AND OPTICALLY STRUCTURED FILTERS |
| US5589303A (en) * | 1994-12-30 | 1996-12-31 | Lucent Technologies Inc. | Self-aligned opaque regions for attenuating phase-shifting masks |
-
1975
- 1975-05-28 JP JP50062881A patent/JPS609342B2/en not_active Expired
-
1976
- 1976-05-26 DE DE19762623688 patent/DE2623688A1/en active Pending
- 1976-05-28 NL NL7605809A patent/NL7605809A/en not_active Application Discontinuation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5635137A (en) * | 1979-08-31 | 1981-04-07 | Nec Corp | Photomask |
Also Published As
| Publication number | Publication date |
|---|---|
| NL7605809A (en) | 1976-11-30 |
| JPS609342B2 (en) | 1985-03-09 |
| DE2623688A1 (en) | 1976-12-02 |
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