JPS5224873B2 - - Google Patents

Info

Publication number
JPS5224873B2
JPS5224873B2 JP10366971A JP10366971A JPS5224873B2 JP S5224873 B2 JPS5224873 B2 JP S5224873B2 JP 10366971 A JP10366971 A JP 10366971A JP 10366971 A JP10366971 A JP 10366971A JP S5224873 B2 JPS5224873 B2 JP S5224873B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10366971A
Other versions
JPS4869572A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10366971A priority Critical patent/JPS5224873B2/ja
Publication of JPS4869572A publication Critical patent/JPS4869572A/ja
Publication of JPS5224873B2 publication Critical patent/JPS5224873B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Measuring Fluid Pressure (AREA)
JP10366971A 1971-12-22 1971-12-22 Expired JPS5224873B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10366971A JPS5224873B2 (ja) 1971-12-22 1971-12-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10366971A JPS5224873B2 (ja) 1971-12-22 1971-12-22

Publications (2)

Publication Number Publication Date
JPS4869572A JPS4869572A (ja) 1973-09-21
JPS5224873B2 true JPS5224873B2 (ja) 1977-07-04

Family

ID=14360183

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10366971A Expired JPS5224873B2 (ja) 1971-12-22 1971-12-22

Country Status (1)

Country Link
JP (1) JPS5224873B2 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57128042A (en) * 1981-01-30 1982-08-09 Fujitsu Ltd Inspecting method for semiconductor device
JPS62190844A (ja) * 1986-02-18 1987-08-21 Fujitsu Ltd 低温用プロ−バ

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57128042A (en) * 1981-01-30 1982-08-09 Fujitsu Ltd Inspecting method for semiconductor device
JPS62190844A (ja) * 1986-02-18 1987-08-21 Fujitsu Ltd 低温用プロ−バ

Also Published As

Publication number Publication date
JPS4869572A (ja) 1973-09-21

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