JPS5228240A - Semiconductor ic performance test method - Google Patents

Semiconductor ic performance test method

Info

Publication number
JPS5228240A
JPS5228240A JP50103983A JP10398375A JPS5228240A JP S5228240 A JPS5228240 A JP S5228240A JP 50103983 A JP50103983 A JP 50103983A JP 10398375 A JP10398375 A JP 10398375A JP S5228240 A JPS5228240 A JP S5228240A
Authority
JP
Japan
Prior art keywords
performance test
semiconductor
test method
synchronization
conducted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50103983A
Other languages
Japanese (ja)
Inventor
Eiji Wada
Yoichi Asano
Yoshikazu Suzumura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP50103983A priority Critical patent/JPS5228240A/en
Publication of JPS5228240A publication Critical patent/JPS5228240A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: A synchronous detection test pattern is output in the device to be tested and performance test is conducted by stopping synchronization program at the same time when synchronous signals are detected. Thus idle time for synchronization is eliminated to improve efficiency and reliability.
COPYRIGHT: (C)1977,JPO&Japio
JP50103983A 1975-08-29 1975-08-29 Semiconductor ic performance test method Pending JPS5228240A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50103983A JPS5228240A (en) 1975-08-29 1975-08-29 Semiconductor ic performance test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50103983A JPS5228240A (en) 1975-08-29 1975-08-29 Semiconductor ic performance test method

Publications (1)

Publication Number Publication Date
JPS5228240A true JPS5228240A (en) 1977-03-03

Family

ID=14368535

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50103983A Pending JPS5228240A (en) 1975-08-29 1975-08-29 Semiconductor ic performance test method

Country Status (1)

Country Link
JP (1) JPS5228240A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02131313U (en) * 1989-04-05 1990-10-31

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02131313U (en) * 1989-04-05 1990-10-31

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