JPS5283082A - Large scale integrated circuit chip - Google Patents

Large scale integrated circuit chip

Info

Publication number
JPS5283082A
JPS5283082A JP15813175A JP15813175A JPS5283082A JP S5283082 A JPS5283082 A JP S5283082A JP 15813175 A JP15813175 A JP 15813175A JP 15813175 A JP15813175 A JP 15813175A JP S5283082 A JPS5283082 A JP S5283082A
Authority
JP
Japan
Prior art keywords
integrated circuit
large scale
circuit chip
scale integrated
module
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15813175A
Other languages
Japanese (ja)
Other versions
JPS6366056B2 (en
Inventor
Takao Uehara
Junichi Tanahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP15813175A priority Critical patent/JPS5283082A/en
Publication of JPS5283082A publication Critical patent/JPS5283082A/en
Publication of JPS6366056B2 publication Critical patent/JPS6366056B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90Masterslice integrated circuits

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:Simple individual module inspections are made possible by dividing the entire part of logic circuits to plural parts, composing each part with a plurality of identical modules and providing the test-purpose module of a predetermined function to each part.
JP15813175A 1975-12-30 1975-12-30 Large scale integrated circuit chip Granted JPS5283082A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15813175A JPS5283082A (en) 1975-12-30 1975-12-30 Large scale integrated circuit chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15813175A JPS5283082A (en) 1975-12-30 1975-12-30 Large scale integrated circuit chip

Publications (2)

Publication Number Publication Date
JPS5283082A true JPS5283082A (en) 1977-07-11
JPS6366056B2 JPS6366056B2 (en) 1988-12-19

Family

ID=15664947

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15813175A Granted JPS5283082A (en) 1975-12-30 1975-12-30 Large scale integrated circuit chip

Country Status (1)

Country Link
JP (1) JPS5283082A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54122058A (en) * 1978-03-09 1979-09-21 Motorola Inc On chip ram mutually connected to microprocessor bus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54122058A (en) * 1978-03-09 1979-09-21 Motorola Inc On chip ram mutually connected to microprocessor bus

Also Published As

Publication number Publication date
JPS6366056B2 (en) 1988-12-19

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