JPS5284766A - Method of and apparatus for calibrating thickness meter - Google Patents

Method of and apparatus for calibrating thickness meter

Info

Publication number
JPS5284766A
JPS5284766A JP7389876A JP7389876A JPS5284766A JP S5284766 A JPS5284766 A JP S5284766A JP 7389876 A JP7389876 A JP 7389876A JP 7389876 A JP7389876 A JP 7389876A JP S5284766 A JPS5284766 A JP S5284766A
Authority
JP
Japan
Prior art keywords
thickness meter
calibrating
calibrating thickness
meter
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7389876A
Other languages
English (en)
Inventor
Fuarage Kuroodo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Weston Instruments Inc
Original Assignee
Weston Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Weston Instruments Inc filed Critical Weston Instruments Inc
Publication of JPS5284766A publication Critical patent/JPS5284766A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP7389876A 1972-02-15 1976-06-24 Method of and apparatus for calibrating thickness meter Pending JPS5284766A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US22645772A 1972-02-15 1972-02-15

Publications (1)

Publication Number Publication Date
JPS5284766A true JPS5284766A (en) 1977-07-14

Family

ID=22848979

Family Applications (4)

Application Number Title Priority Date Filing Date
JP48018823A Expired JPS6055763B2 (ja) 1972-02-15 1973-02-15 厚み測定装置
JP7389876A Pending JPS5284766A (en) 1972-02-15 1976-06-24 Method of and apparatus for calibrating thickness meter
JP53030913A Expired JPS6055764B2 (ja) 1972-02-15 1978-03-17 厚み測定装置
JP60155873A Pending JPS61274211A (ja) 1972-02-15 1985-07-15 厚み測定装置

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP48018823A Expired JPS6055763B2 (ja) 1972-02-15 1973-02-15 厚み測定装置

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP53030913A Expired JPS6055764B2 (ja) 1972-02-15 1978-03-17 厚み測定装置
JP60155873A Pending JPS61274211A (ja) 1972-02-15 1985-07-15 厚み測定装置

Country Status (5)

Country Link
JP (4) JPS6055763B2 (ja)
CA (1) CA990417A (ja)
DE (1) DE2307391A1 (ja)
FR (1) FR2172254B1 (ja)
GB (2) GB1427751A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58150809A (ja) * 1982-02-25 1983-09-07 Toshiba Corp 非接触放射線厚み計及びその校正方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4119846A (en) * 1977-02-03 1978-10-10 Sangamo Weston, Inc. Non-contacting gage apparatus and method
US4328697A (en) * 1979-05-23 1982-05-11 Lucas Industries Limited Transducer calibration device
GB2088045B (en) 1980-10-28 1984-09-26 Coal Industry Patents Ltd Signal processing systems
DE3206832A1 (de) * 1982-02-23 1983-09-01 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Beruehrungsfrei messendes dickenmessgeraet
RU2235974C1 (ru) * 2003-06-18 2004-09-10 Открытое акционерное общество "Новосибирский завод химконцентратов" Устройство для измерения толщины тепловыделяющих элементов
CN111016830B (zh) * 2019-10-24 2023-06-27 惠州市德赛西威汽车电子股份有限公司 一种电压脉冲防错处理系统及方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3180985A (en) * 1962-05-14 1965-04-27 Electronic Automation Systems Standardization of radiation-absorption type density gages
US3524063A (en) * 1967-10-12 1970-08-11 Bethlehem Steel Corp Multirange radiation thickness gauge

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58150809A (ja) * 1982-02-25 1983-09-07 Toshiba Corp 非接触放射線厚み計及びその校正方法

Also Published As

Publication number Publication date
DE2307391A1 (de) 1973-08-23
CA990417A (en) 1976-06-01
FR2172254B1 (ja) 1976-04-09
GB1427752A (en) 1976-03-10
GB1427751A (en) 1976-03-10
JPS6055763B2 (ja) 1985-12-06
FR2172254A1 (ja) 1973-09-28
JPS53134469A (en) 1978-11-24
JPS61274211A (ja) 1986-12-04
JPS48104569A (ja) 1973-12-27
JPS6055764B2 (ja) 1985-12-06

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