JPS5296072A - Apparatus for measuring complex dielectric constant - Google Patents
Apparatus for measuring complex dielectric constantInfo
- Publication number
- JPS5296072A JPS5296072A JP1263476A JP1263476A JPS5296072A JP S5296072 A JPS5296072 A JP S5296072A JP 1263476 A JP1263476 A JP 1263476A JP 1263476 A JP1263476 A JP 1263476A JP S5296072 A JPS5296072 A JP S5296072A
- Authority
- JP
- Japan
- Prior art keywords
- dielectric constant
- complex dielectric
- measuring complex
- antennas
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 abstract 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Abstract
PURPOSE: To provide an apparatus for measuring complex dielectric constant, in which rotary mechanism is provided at the junction to external measuring circuit, and loop-shaped antennas can be moved continuously in the direction of strain, while keeping the plane of these antennas perpendicular to the axis of dielectric sleeve member, whereby measurement can be made easy remarkably.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1263476A JPS6022306B2 (en) | 1976-02-06 | 1976-02-06 | Complex permittivity measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1263476A JPS6022306B2 (en) | 1976-02-06 | 1976-02-06 | Complex permittivity measurement device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5296072A true JPS5296072A (en) | 1977-08-12 |
| JPS6022306B2 JPS6022306B2 (en) | 1985-06-01 |
Family
ID=11810801
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1263476A Expired JPS6022306B2 (en) | 1976-02-06 | 1976-02-06 | Complex permittivity measurement device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6022306B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56128584U (en) * | 1980-02-29 | 1981-09-30 |
-
1976
- 1976-02-06 JP JP1263476A patent/JPS6022306B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56128584U (en) * | 1980-02-29 | 1981-09-30 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6022306B2 (en) | 1985-06-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS51134558A (en) | Measuring unit | |
| JPS51142372A (en) | Time measuring device | |
| JPS5256384A (en) | Coaxial cable for coupling | |
| JPS52141276A (en) | Magnetic measurement device by shaft shaped magnetometer | |
| JPS5380247A (en) | Position detector | |
| JPS5343553A (en) | Test piece size measuring apparatus | |
| JPS5224078A (en) | Ic use measuring device | |
| JPS5230474A (en) | Apparatus for measuring power line current | |
| JPS5244673A (en) | Loss angle measuring instrument | |
| JPS5240386A (en) | Temperature measuring probe | |
| JPS5220076A (en) | Dew-point measurement device | |
| JPS51136469A (en) | Power measuring operation circuit | |
| JPS5248817A (en) | Indicating equipment | |
| JPS51147351A (en) | Contact for measuring diameter | |
| JPS51139365A (en) | Device of measuring current flowing in a conductor | |
| JPS53168A (en) | Measuring equipment for striking time of string instruments | |
| JPS5258947A (en) | Measuring device for solids | |
| JPS5370882A (en) | Measurement for width of magnetic domain | |
| JPS5367461A (en) | Vernier calipers | |
| JPS51136468A (en) | Torque detector | |
| JPS5212857A (en) | Dimension-measuring device | |
| JPS51130251A (en) | Triangular rule | |
| JPS5244480A (en) | Improcess measuring device for non-circula material | |
| JPS51137382A (en) | Measuring method for junction point within semi conductor wafer | |
| JPS5249869A (en) | High sensitivity high stabilization reactance measuring device for low impedance |