JPS5337385A - Inspecting method of arrayed devices - Google Patents

Inspecting method of arrayed devices

Info

Publication number
JPS5337385A
JPS5337385A JP11185176A JP11185176A JPS5337385A JP S5337385 A JPS5337385 A JP S5337385A JP 11185176 A JP11185176 A JP 11185176A JP 11185176 A JP11185176 A JP 11185176A JP S5337385 A JPS5337385 A JP S5337385A
Authority
JP
Japan
Prior art keywords
inspecting method
arrayed
arrayed devices
direct current
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11185176A
Other languages
Japanese (ja)
Inventor
Tadashi Iwashimizu
Kunio Hatano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11185176A priority Critical patent/JPS5337385A/en
Publication of JPS5337385A publication Critical patent/JPS5337385A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: Direct current defects at the input and output parts of semiconductor pellets by arrayed common wirings are simply and positively detected by detecting the direct current defects of the semiconductor pellets from the heat evolving condition of the semiconductor elements.
COPYRIGHT: (C)1978,JPO&Japio
JP11185176A 1976-09-20 1976-09-20 Inspecting method of arrayed devices Pending JPS5337385A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11185176A JPS5337385A (en) 1976-09-20 1976-09-20 Inspecting method of arrayed devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11185176A JPS5337385A (en) 1976-09-20 1976-09-20 Inspecting method of arrayed devices

Publications (1)

Publication Number Publication Date
JPS5337385A true JPS5337385A (en) 1978-04-06

Family

ID=14571744

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11185176A Pending JPS5337385A (en) 1976-09-20 1976-09-20 Inspecting method of arrayed devices

Country Status (1)

Country Link
JP (1) JPS5337385A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54151375A (en) * 1978-05-19 1979-11-28 Nec Corp Inspection method for semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54151375A (en) * 1978-05-19 1979-11-28 Nec Corp Inspection method for semiconductor device

Similar Documents

Publication Publication Date Title
JPS5216178A (en) Airtightness testing device
JPS5439576A (en) Inspection method for semiconductor device
JPS5347737A (en) Detection circuit for process request
JPS5210032A (en) Construction method of semiconductor memory unit
JPS5295166A (en) Wafer dryer
JPS53120278A (en) Classifying device for semiconductor element
JPS5357878A (en) Peak value detector
JPS5344098A (en) Detecting apparatus of upper and lower limit
JPS5387669A (en) Inspecting system for integrated circuit device
JPS52131455A (en) Semiconductor device
JPS52130521A (en) Color solid pickup unit
JPS5338266A (en) Screening method of semiconductors and device for the same
JPS53131129A (en) Arangement for stamping or stepping apparatus for detecting number of stamping
JPS5214846A (en) Unbalance detection relaying system
JPS531433A (en) Processing system for fan stop
JPS5422549A (en) Equipment power source alarm circuit
JPS5389676A (en) Extracting method for non-defective or defective semiconductor pelletsbased on memory means
JPS52110184A (en) Apparatus for inspecting joint portion of paper bags
JPS5442635A (en) Inspection method
JPS52114869A (en) Fault detector of analogue controller
JPS51132969A (en) Semiconductor device
JPS543442A (en) Abnormality detection system for logic element
JPS52111318A (en) Inspection unit
JPS52147967A (en) Test method for p-n junction depth
JPS5377448A (en) Trouble detection unit of direct current amplifier