JPS544063A - Low pressure deposition method for impurity - Google Patents
Low pressure deposition method for impurityInfo
- Publication number
- JPS544063A JPS544063A JP6890877A JP6890877A JPS544063A JP S544063 A JPS544063 A JP S544063A JP 6890877 A JP6890877 A JP 6890877A JP 6890877 A JP6890877 A JP 6890877A JP S544063 A JPS544063 A JP S544063A
- Authority
- JP
- Japan
- Prior art keywords
- impurity
- deposition method
- low pressure
- pressure deposition
- dispersion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Bipolar Transistors (AREA)
Abstract
PURPOSE: To reduce the dispersion in the specific resistance of diffusion layer, by performing deposition at a low temperature at first and performing it at normal temperature after forming a given film thickness, in impurity deposition method.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6890877A JPS544063A (en) | 1977-06-13 | 1977-06-13 | Low pressure deposition method for impurity |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6890877A JPS544063A (en) | 1977-06-13 | 1977-06-13 | Low pressure deposition method for impurity |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS544063A true JPS544063A (en) | 1979-01-12 |
Family
ID=13387212
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6890877A Pending JPS544063A (en) | 1977-06-13 | 1977-06-13 | Low pressure deposition method for impurity |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS544063A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112466985A (en) * | 2020-10-30 | 2021-03-09 | 江苏润阳悦达光伏科技有限公司 | Low-pressure diffusion process for improving uniformity of diffusion sheet resistance single chip |
-
1977
- 1977-06-13 JP JP6890877A patent/JPS544063A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112466985A (en) * | 2020-10-30 | 2021-03-09 | 江苏润阳悦达光伏科技有限公司 | Low-pressure diffusion process for improving uniformity of diffusion sheet resistance single chip |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS5421265A (en) | Forming method of semiconductor oxide film | |
| JPS53108389A (en) | Manufacture for semiconductor device | |
| JPS5312274A (en) | Production of mask for x-ray exposure | |
| JPS52110570A (en) | Forming method of silicon epitaxial layer | |
| JPS5430797A (en) | Formation method of substrate for liquid-crystal cell | |
| JPS5253659A (en) | Production of semiconductor element | |
| JPS5215261A (en) | Method of forming films | |
| JPS5386177A (en) | Production of semiconductor device | |
| JPS53133366A (en) | Impurity diffusion method | |
| JPS53130979A (en) | Manufacture for semiconductor device | |
| JPS5376747A (en) | Forming method of insulation film | |
| JPS5349943A (en) | Impurity diffusion method | |
| JPS53112668A (en) | Preparing method for oxide film | |
| JPS5335375A (en) | Heating method | |
| JPS5329676A (en) | Gas treating method of semiconductor wafers | |
| JPS5317063A (en) | Impurity diffusion method | |
| JPS523196A (en) | Method of manufacturing a thin film device | |
| JPS53128978A (en) | Impurity diffusion method | |
| JPS53136958A (en) | Selective impurity diffusion method into semiconductor substrate | |
| JPS546782A (en) | Semiconductor device and its manufacture | |
| JPS53142870A (en) | Manufacture for semiconductor device | |
| JPS5339858A (en) | Impurity diffusion method | |
| JPS5367387A (en) | Production of semiconductor device | |
| JPS5372482A (en) | Manufacture for semiconductor device | |
| JPS52143759A (en) | Impurity diffusion method for semiconductor wafers |