JPS5453560A - Temperature test method - Google Patents

Temperature test method

Info

Publication number
JPS5453560A
JPS5453560A JP11904477A JP11904477A JPS5453560A JP S5453560 A JPS5453560 A JP S5453560A JP 11904477 A JP11904477 A JP 11904477A JP 11904477 A JP11904477 A JP 11904477A JP S5453560 A JPS5453560 A JP S5453560A
Authority
JP
Japan
Prior art keywords
temperature
detector
tested
test
frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11904477A
Other languages
Japanese (ja)
Inventor
Hajime Uehara
Shigeo Shimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP11904477A priority Critical patent/JPS5453560A/en
Publication of JPS5453560A publication Critical patent/JPS5453560A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To perform temperature test easily and at low cost at the location of the set being tested, without using conventional thermostat, by placing the set being tested into a test apparatus surrounded with heat insulating material of which temperature may be maintained constantly, and utilizing the heat generation of the set itself.
CONSTITUTION: A temperature test apparatus is composed of a structure frame 1, heat insulating material 2 to cover said frame, temperature detector 3 permitting temperature setting, and a fan 4 to exhaust the air in the frame in cooperation with said detector. An electronic set being tested 6 is placed in this apparatus, and the test temperature is set by the temperature detector 3, then the set 6 is energized or actuated. Due to the heat generation of the set 6, the temperature in the apparatus rises until exceeding the temperature set by the temperature detector 3. At that time, the temperature detector 3 is operated to move the fan 4 until the temperature in the apparatus is lowered to the preset temperature
COPYRIGHT: (C)1979,JPO&Japio
JP11904477A 1977-10-05 1977-10-05 Temperature test method Pending JPS5453560A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11904477A JPS5453560A (en) 1977-10-05 1977-10-05 Temperature test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11904477A JPS5453560A (en) 1977-10-05 1977-10-05 Temperature test method

Publications (1)

Publication Number Publication Date
JPS5453560A true JPS5453560A (en) 1979-04-26

Family

ID=14751533

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11904477A Pending JPS5453560A (en) 1977-10-05 1977-10-05 Temperature test method

Country Status (1)

Country Link
JP (1) JPS5453560A (en)

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