JPS545667A - Test method for semiconductor device - Google Patents

Test method for semiconductor device

Info

Publication number
JPS545667A
JPS545667A JP7129677A JP7129677A JPS545667A JP S545667 A JPS545667 A JP S545667A JP 7129677 A JP7129677 A JP 7129677A JP 7129677 A JP7129677 A JP 7129677A JP S545667 A JPS545667 A JP S545667A
Authority
JP
Japan
Prior art keywords
semiconductor device
test method
test
semiconductor
hear
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7129677A
Other languages
Japanese (ja)
Inventor
Tsuyoshi Shiragasawa
Masaharu Noyori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP7129677A priority Critical patent/JPS545667A/en
Publication of JPS545667A publication Critical patent/JPS545667A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To carry out a test for the semiconductor device in a short time and in a simple way, by printing the heating power to the semiconductor device to have self-generation of hear for the semiconductor to increase the temperature and then conducting the high temperature characteristic test.
COPYRIGHT: (C)1979,JPO&Japio
JP7129677A 1977-06-15 1977-06-15 Test method for semiconductor device Pending JPS545667A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7129677A JPS545667A (en) 1977-06-15 1977-06-15 Test method for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7129677A JPS545667A (en) 1977-06-15 1977-06-15 Test method for semiconductor device

Publications (1)

Publication Number Publication Date
JPS545667A true JPS545667A (en) 1979-01-17

Family

ID=13456556

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7129677A Pending JPS545667A (en) 1977-06-15 1977-06-15 Test method for semiconductor device

Country Status (1)

Country Link
JP (1) JPS545667A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02236895A (en) * 1990-02-23 1990-09-19 Hitachi Ltd semiconductor integrated circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02236895A (en) * 1990-02-23 1990-09-19 Hitachi Ltd semiconductor integrated circuit

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