JPS5459267U - - Google Patents
Info
- Publication number
- JPS5459267U JPS5459267U JP13188077U JP13188077U JPS5459267U JP S5459267 U JPS5459267 U JP S5459267U JP 13188077 U JP13188077 U JP 13188077U JP 13188077 U JP13188077 U JP 13188077U JP S5459267 U JPS5459267 U JP S5459267U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13188077U JPS5459267U (de) | 1977-10-03 | 1977-10-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13188077U JPS5459267U (de) | 1977-10-03 | 1977-10-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5459267U true JPS5459267U (de) | 1979-04-24 |
Family
ID=29098887
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13188077U Pending JPS5459267U (de) | 1977-10-03 | 1977-10-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5459267U (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000200812A (ja) * | 1990-02-16 | 2000-07-18 | Glenn J Leedy | 高密度探触点を使用した集積回路の製作および試験方法 |
-
1977
- 1977-10-03 JP JP13188077U patent/JPS5459267U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000200812A (ja) * | 1990-02-16 | 2000-07-18 | Glenn J Leedy | 高密度探触点を使用した集積回路の製作および試験方法 |