JPS55112573A - Conductivity measuring method - Google Patents

Conductivity measuring method

Info

Publication number
JPS55112573A
JPS55112573A JP1939079A JP1939079A JPS55112573A JP S55112573 A JPS55112573 A JP S55112573A JP 1939079 A JP1939079 A JP 1939079A JP 1939079 A JP1939079 A JP 1939079A JP S55112573 A JPS55112573 A JP S55112573A
Authority
JP
Japan
Prior art keywords
sample
measure
conductivity
basis
operate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1939079A
Other languages
Japanese (ja)
Inventor
Teruo Takagi
Masaomi Kondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP1939079A priority Critical patent/JPS55112573A/en
Publication of JPS55112573A publication Critical patent/JPS55112573A/en
Pending legal-status Critical Current

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  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE: To reduce the number of processes and make it possible to measure conductivity in a short time by obtaining the resistance value and the sectional area of a conductive material by operations and by obtaining conductivity of the conductive material from these operation results by operations.
CONSTITUTION: Sample 1 is set on sample stand, and dimension measuring equipment 2 is turned around sample 1 to measure outside dimensions of each part, and micro computer 6 is used to operate the sectional area of sample 1 on a basis of obtained measure values. Simultaneously, a constant current is flowed from constant current source 4 to sample 1, and voltage drop between two points A and B of sample 1 is measured at this time by high-precision voltmeter 5, and micro computer 6 is used to operate the resistance value per unit length of sample 1 on a basis of the measure value and the current value. Next, micro computer 6 is used to operate conductivity of sample 1 on a basis of the sectional area and the resistance value per unit length of sample 1.
COPYRIGHT: (C)1980,JPO&Japio
JP1939079A 1979-02-21 1979-02-21 Conductivity measuring method Pending JPS55112573A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1939079A JPS55112573A (en) 1979-02-21 1979-02-21 Conductivity measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1939079A JPS55112573A (en) 1979-02-21 1979-02-21 Conductivity measuring method

Publications (1)

Publication Number Publication Date
JPS55112573A true JPS55112573A (en) 1980-08-30

Family

ID=11997948

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1939079A Pending JPS55112573A (en) 1979-02-21 1979-02-21 Conductivity measuring method

Country Status (1)

Country Link
JP (1) JPS55112573A (en)

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