JPS55154452A - Concentration controlling method of halogen acid salt - Google Patents
Concentration controlling method of halogen acid saltInfo
- Publication number
- JPS55154452A JPS55154452A JP6177879A JP6177879A JPS55154452A JP S55154452 A JPS55154452 A JP S55154452A JP 6177879 A JP6177879 A JP 6177879A JP 6177879 A JP6177879 A JP 6177879A JP S55154452 A JPS55154452 A JP S55154452A
- Authority
- JP
- Japan
- Prior art keywords
- controlled
- solution
- concentration
- halogen acid
- acid salt
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H10P70/15—Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
Landscapes
- Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
- Treating Waste Gases (AREA)
- Gas Separation By Absorption (AREA)
- Control Of Non-Electrical Variables (AREA)
Abstract
PURPOSE:To control the concentration of halogen acid slat by using the hydrogen peroxide solution which has been controlled of its pH through addition of a buffer as a control reagent. CONSTITUTION:The hydrogen peroxide solution which has been controlled to 6-12 (preferably 8-10) in pH through addition of a buffer (for example, sodium citrate and NaOH) is used. Part of the solution to be controlled (solution of halogenite or hypohalogenite) 1 to be circulated through a filter 2 is fed to a mixing tank 5 through a defoaming tank 4 by a metering pump 3, at the same instant of which the above-mentioned control reagent 6 is fed into the mixing tank 5 by the pump 3 so that both are let to react and the solution to be controlled is treated. On the other hand, if the concentration of the solution to be controlled decreases owing to the above-mentioned treatment, a control circuit 8 is operated by the signal of an oxidation-reduction potential meter 7 to freshly supply the solution 9 to be controlled so as to become the specified controlled concentration.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6177879A JPS55154452A (en) | 1979-05-18 | 1979-05-18 | Concentration controlling method of halogen acid salt |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6177879A JPS55154452A (en) | 1979-05-18 | 1979-05-18 | Concentration controlling method of halogen acid salt |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55154452A true JPS55154452A (en) | 1980-12-02 |
| JPS6315547B2 JPS6315547B2 (en) | 1988-04-05 |
Family
ID=13180881
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6177879A Granted JPS55154452A (en) | 1979-05-18 | 1979-05-18 | Concentration controlling method of halogen acid salt |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55154452A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0390254A3 (en) * | 1989-03-25 | 1991-11-27 | Koninklijke Philips Electronics N.V. | Method for stabilizing cleaning baths for si wafers, especially for semiconductor devices |
| EP0681318A1 (en) * | 1994-04-28 | 1995-11-08 | Wacker Siltronic Gesellschaft für Halbleitermaterialien Aktiengesellschaft | Process for treating a semiconducting material with an acid containing liquid |
| EP2389581A4 (en) * | 2009-01-26 | 2014-10-22 | Mi Llc | CATIONIC EXCHANGE CAPACITY TITRATION UNIT |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56152862A (en) * | 1980-04-28 | 1981-11-26 | Teijin Ltd | Flame-retardant resin composition |
-
1979
- 1979-05-18 JP JP6177879A patent/JPS55154452A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56152862A (en) * | 1980-04-28 | 1981-11-26 | Teijin Ltd | Flame-retardant resin composition |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0390254A3 (en) * | 1989-03-25 | 1991-11-27 | Koninklijke Philips Electronics N.V. | Method for stabilizing cleaning baths for si wafers, especially for semiconductor devices |
| EP0681318A1 (en) * | 1994-04-28 | 1995-11-08 | Wacker Siltronic Gesellschaft für Halbleitermaterialien Aktiengesellschaft | Process for treating a semiconducting material with an acid containing liquid |
| EP2389581A4 (en) * | 2009-01-26 | 2014-10-22 | Mi Llc | CATIONIC EXCHANGE CAPACITY TITRATION UNIT |
| US9011775B2 (en) | 2009-01-26 | 2015-04-21 | M-I L.L.C. | Cation exchange capacity titration unit |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6315547B2 (en) | 1988-04-05 |
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