JPS5516273A - Method of measuring critical value characteristic of thyristor - Google Patents

Method of measuring critical value characteristic of thyristor

Info

Publication number
JPS5516273A
JPS5516273A JP8958578A JP8958578A JPS5516273A JP S5516273 A JPS5516273 A JP S5516273A JP 8958578 A JP8958578 A JP 8958578A JP 8958578 A JP8958578 A JP 8958578A JP S5516273 A JPS5516273 A JP S5516273A
Authority
JP
Japan
Prior art keywords
measurement
power source
binary coded
coded decimal
decimal number
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8958578A
Other languages
Japanese (ja)
Inventor
Koichi Kiyota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP8958578A priority Critical patent/JPS5516273A/en
Publication of JPS5516273A publication Critical patent/JPS5516273A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To sharply shorten measuring time, by setting the quantity of application measurement by increasing the number of operation per decimal one figure by the singleness or mutual addition of each figure of binary coded decimal number.
CONSTITUTION: After bringing a gate power source to prescribed anode voltage by means of a power source 3, the gate power source is set to value corresponding to the quantity of measurement 8 corresponding to binary coded decimal number, gate voltage is applied while the energizing of a SCR is detected by means of an ON detecting circuit 5, and the gate power source 4 is set to value corresponding to (8+1) when OFF and ON-OFF is decided in the same manner as mentioned above. The measurement of the figure is completed on the assumption that the energizing exists outside the maximum measurement range if the energizing is in OFF yet and there are gate trigger currents between both set points (8 and 9) if it is in ON. When it is in ON at the set point 8, the measurement of binary coded decimal number four figures can be finished if the quantity of measurement corresponding to the next lower figure 4 of binary coded decimal number is set and the ON-OFF decision of the SCR is maximally repeated at four times.
COPYRIGHT: (C)1980,JPO&Japio
JP8958578A 1978-07-21 1978-07-21 Method of measuring critical value characteristic of thyristor Pending JPS5516273A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8958578A JPS5516273A (en) 1978-07-21 1978-07-21 Method of measuring critical value characteristic of thyristor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8958578A JPS5516273A (en) 1978-07-21 1978-07-21 Method of measuring critical value characteristic of thyristor

Publications (1)

Publication Number Publication Date
JPS5516273A true JPS5516273A (en) 1980-02-04

Family

ID=13974853

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8958578A Pending JPS5516273A (en) 1978-07-21 1978-07-21 Method of measuring critical value characteristic of thyristor

Country Status (1)

Country Link
JP (1) JPS5516273A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010037583A (en) * 1999-10-18 2001-05-15 박용종 Device of judging leakage voltage and gate control function of thyrister

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010037583A (en) * 1999-10-18 2001-05-15 박용종 Device of judging leakage voltage and gate control function of thyrister

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