JPS5533069A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS5533069A JPS5533069A JP10597778A JP10597778A JPS5533069A JP S5533069 A JPS5533069 A JP S5533069A JP 10597778 A JP10597778 A JP 10597778A JP 10597778 A JP10597778 A JP 10597778A JP S5533069 A JPS5533069 A JP S5533069A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- type
- gate
- drain
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/13—Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
- H10D62/149—Source or drain regions of field-effect devices
- H10D62/151—Source or drain regions of field-effect devices of IGFETs
Landscapes
- Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE: To increase the current capacity of a semiconductor device by providing an N-type buried layer under the inverted layer direclty under the gate insulated film of a P-type substrate to be connected to a drain layer and connecting a source layer to one end of the inverted layer to thereby form a stereoscopic channel.
CONSTITUTION: After As ion is implanted through a resist mask 13 in a depth of 6,000Å on a P-type silicon substrate 1 to form an N+ type layer 7 and to then remove the resist, a field oxide film 6 is formed with Si3N4 mask. At this time the layer 7 is activated. Then B ion injection layer 14 is formed in a depth of approx. 1,000Å from the surface and returned to the same conductivity type as the substrate to thereby compensate the N+ type buried layer end to thus obtain desired threshold voltage thereat. Then, a gate oxide film 2 and poly-silicon gate electrode 3 are formed, N+ type source 4 and drain 5 are formed to make the electrode 3 conductive. Then it is coated with PSG 11 to thus form an electrode 12. Since this structure provides three-dimensional conductive state of channel, it increases the current capacity not to concentrate the electric field at the drain end under the gate to thereby provide high dielectricity.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10597778A JPS5533069A (en) | 1978-08-30 | 1978-08-30 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10597778A JPS5533069A (en) | 1978-08-30 | 1978-08-30 | Semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5533069A true JPS5533069A (en) | 1980-03-08 |
| JPS6314503B2 JPS6314503B2 (en) | 1988-03-31 |
Family
ID=14421807
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10597778A Granted JPS5533069A (en) | 1978-08-30 | 1978-08-30 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5533069A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60134467A (en) * | 1983-12-23 | 1985-07-17 | Hitachi Ltd | Semiconductor device |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5265685A (en) * | 1975-11-27 | 1977-05-31 | Mitsubishi Electric Corp | Insulated gate type field effect semiconductor device |
| JPS5315773A (en) * | 1976-07-28 | 1978-02-14 | Hitachi Ltd | Mis type semiconductor device and its production |
| JPS5367372A (en) * | 1976-11-29 | 1978-06-15 | Hitachi Ltd | Mos-type field effect transistor |
-
1978
- 1978-08-30 JP JP10597778A patent/JPS5533069A/en active Granted
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5265685A (en) * | 1975-11-27 | 1977-05-31 | Mitsubishi Electric Corp | Insulated gate type field effect semiconductor device |
| JPS5315773A (en) * | 1976-07-28 | 1978-02-14 | Hitachi Ltd | Mis type semiconductor device and its production |
| JPS5367372A (en) * | 1976-11-29 | 1978-06-15 | Hitachi Ltd | Mos-type field effect transistor |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60134467A (en) * | 1983-12-23 | 1985-07-17 | Hitachi Ltd | Semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6314503B2 (en) | 1988-03-31 |
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