JPS5541654A - Electron beam deflector - Google Patents
Electron beam deflectorInfo
- Publication number
- JPS5541654A JPS5541654A JP11462878A JP11462878A JPS5541654A JP S5541654 A JPS5541654 A JP S5541654A JP 11462878 A JP11462878 A JP 11462878A JP 11462878 A JP11462878 A JP 11462878A JP S5541654 A JPS5541654 A JP S5541654A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic
- deflector
- field type
- magnetic field
- deflecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Electron Beam Exposure (AREA)
Abstract
PURPOSE: To make the promotion of improvement of the frequency characteristic, without causing an error of positioning, by such means that, near around a magnetic field type deflector, be arranged an electrostatic deflector, with its deflecting plate insulator applied a non-magnetic conductive material, to make both of the deflecting center coinciding.
CONSTITUTION: The constitution comprises an electrostatic deflector, in which a non-magnetic conductive material 22 is applied to surfaces of an insulator 21 plate, and a magnetic field type deflector, consisting of a deflecting coil 23 and a magnetic substance 24 like ferrite, and deflection centers of the both deflectors are made coinciding. In this way, a worsening of magnetic response, caused by an eddy current of the magnetic field type deflector, can be prevented, thus the dynamic characteristic (frequency characteristic) can be improved.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP53114628A JPS5854462B2 (en) | 1978-09-20 | 1978-09-20 | electron beam deflector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP53114628A JPS5854462B2 (en) | 1978-09-20 | 1978-09-20 | electron beam deflector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5541654A true JPS5541654A (en) | 1980-03-24 |
| JPS5854462B2 JPS5854462B2 (en) | 1983-12-05 |
Family
ID=14642597
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP53114628A Expired JPS5854462B2 (en) | 1978-09-20 | 1978-09-20 | electron beam deflector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5854462B2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS585952A (en) * | 1981-07-03 | 1983-01-13 | Hitachi Ltd | Charged-particle focusing deflecting device |
| US4774355A (en) * | 1986-09-18 | 1988-09-27 | Mitsubishi Petrochemical Co., Ltd. | Process for preparing pentaerythritol-tetrakis(3-alkylthio-propionate) |
| US4779046A (en) * | 1985-06-28 | 1988-10-18 | Cameca | Electron beam integrated circuit tester |
| JPH08124505A (en) * | 1994-10-27 | 1996-05-17 | Nikon Corp | Electromagnetic lens and method of manufacturing the electromagnetic lens |
-
1978
- 1978-09-20 JP JP53114628A patent/JPS5854462B2/en not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS585952A (en) * | 1981-07-03 | 1983-01-13 | Hitachi Ltd | Charged-particle focusing deflecting device |
| US4779046A (en) * | 1985-06-28 | 1988-10-18 | Cameca | Electron beam integrated circuit tester |
| US4774355A (en) * | 1986-09-18 | 1988-09-27 | Mitsubishi Petrochemical Co., Ltd. | Process for preparing pentaerythritol-tetrakis(3-alkylthio-propionate) |
| JPH08124505A (en) * | 1994-10-27 | 1996-05-17 | Nikon Corp | Electromagnetic lens and method of manufacturing the electromagnetic lens |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5854462B2 (en) | 1983-12-05 |
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