JPS5548649A - Defect detecting device - Google Patents
Defect detecting deviceInfo
- Publication number
- JPS5548649A JPS5548649A JP12148278A JP12148278A JPS5548649A JP S5548649 A JPS5548649 A JP S5548649A JP 12148278 A JP12148278 A JP 12148278A JP 12148278 A JP12148278 A JP 12148278A JP S5548649 A JPS5548649 A JP S5548649A
- Authority
- JP
- Japan
- Prior art keywords
- detectors
- defect
- detection output
- clock
- shift
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 title abstract 5
- 238000001514 detection method Methods 0.000 abstract 6
- 230000003111 delayed effect Effects 0.000 abstract 1
- 238000009434 installation Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
PURPOSE: To enhance the S/N and thus to ensure the high-accuracy detection for the defect by giving the prescribed delay process via the clock which is based on the shift velocity of the detected object and thus securing the simultaneous generation of the detection output for plural detectors arranged in the carrier direction.
CONSTITUTION: With application of the shift velocity signal of the detected object through velocity detector 9, clock pulse generator 8 generates the clock featuring the cycle suited to the shift velocity and then applies the clock signals to analog signal delay circuits 51, 52... corresponding to eddy current type defect detectors 41, 42... which are installed in sequence in the shift direction. As a result, the detection output given from detectors 41, 42... are delayed in accordance with the installation positions of these detectors, and thus an addition is given by supposing that detectors 41, 42... have the simultaneous generation of the detection output through adder 6 to increase the defect detection output. As a result, the S/N can be enhanced to ensure the high-accuracy detection of the defect for the mobile object.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12148278A JPS5548649A (en) | 1978-10-04 | 1978-10-04 | Defect detecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12148278A JPS5548649A (en) | 1978-10-04 | 1978-10-04 | Defect detecting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5548649A true JPS5548649A (en) | 1980-04-07 |
Family
ID=14812242
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12148278A Pending JPS5548649A (en) | 1978-10-04 | 1978-10-04 | Defect detecting device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5548649A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6128860A (en) * | 1984-03-29 | 1986-02-08 | Sanyo Tokushu Seikou Kk | Rotary flaw detection device |
| JPS6285856A (en) * | 1985-10-11 | 1987-04-20 | Sanyo Tokushu Seiko Kk | Penetrating flaw detection device |
| US5068608A (en) * | 1989-10-30 | 1991-11-26 | Westinghouse Electric Corp. | Multiple coil eddy current probe system and method for determining the length of a discontinuity |
| JPH07146277A (en) * | 1993-11-25 | 1995-06-06 | Sumitomo Electric Ind Ltd | Non-destructive inspection device |
| WO2017077570A1 (en) * | 2015-11-02 | 2017-05-11 | 三菱電機株式会社 | Wire rope flaw detection device |
| JP2022013394A (en) * | 2020-07-03 | 2022-01-18 | 株式会社島津製作所 | Wire rope inspection device, wire rope inspection system and wire rope inspection method |
-
1978
- 1978-10-04 JP JP12148278A patent/JPS5548649A/en active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6128860A (en) * | 1984-03-29 | 1986-02-08 | Sanyo Tokushu Seikou Kk | Rotary flaw detection device |
| JPS6285856A (en) * | 1985-10-11 | 1987-04-20 | Sanyo Tokushu Seiko Kk | Penetrating flaw detection device |
| US5068608A (en) * | 1989-10-30 | 1991-11-26 | Westinghouse Electric Corp. | Multiple coil eddy current probe system and method for determining the length of a discontinuity |
| JPH07146277A (en) * | 1993-11-25 | 1995-06-06 | Sumitomo Electric Ind Ltd | Non-destructive inspection device |
| WO2017077570A1 (en) * | 2015-11-02 | 2017-05-11 | 三菱電機株式会社 | Wire rope flaw detection device |
| JP6161819B1 (en) * | 2015-11-02 | 2017-07-12 | 三菱電機株式会社 | Wire rope flaw detector |
| KR20180059874A (en) * | 2015-11-02 | 2018-06-05 | 미쓰비시덴키 가부시키가이샤 | Wire rope tester |
| US10514362B2 (en) | 2015-11-02 | 2019-12-24 | Mitsubishi Electric Corporation | Wire rope flaw detection device |
| DE112015007083B4 (en) | 2015-11-02 | 2022-06-23 | Mitsubishi Electric Corporation | DEVICE FOR DETECTING WIRE ROPE DEFECTS |
| JP2022013394A (en) * | 2020-07-03 | 2022-01-18 | 株式会社島津製作所 | Wire rope inspection device, wire rope inspection system and wire rope inspection method |
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