JPS557654A - Measuring unit for variance of refractive index - Google Patents

Measuring unit for variance of refractive index

Info

Publication number
JPS557654A
JPS557654A JP8062978A JP8062978A JPS557654A JP S557654 A JPS557654 A JP S557654A JP 8062978 A JP8062978 A JP 8062978A JP 8062978 A JP8062978 A JP 8062978A JP S557654 A JPS557654 A JP S557654A
Authority
JP
Japan
Prior art keywords
angle
light
stand
deviation
test piece
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8062978A
Other languages
Japanese (ja)
Other versions
JPS581743B2 (en
Inventor
Nobuyuki Imoto
Akira Sugimura
Kazuhiro Oguro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP8062978A priority Critical patent/JPS581743B2/en
Publication of JPS557654A publication Critical patent/JPS557654A/en
Publication of JPS581743B2 publication Critical patent/JPS581743B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To enable the variance on the wave length of the prism type test piece with high accuracy, by turning the test piece stand so that light is incident to the photo detector fixed near the minimum angle of deviation. CONSTITUTION:When the light from the wave length variable light source 1 emits the incident surface of the test piece prism 5 vertically, the read-in angle of the test piece stand 6 is adjusted to zero. Next, the stand 6 is turned and stopped around the position where the angle of deviation when the light is deflected is minimized, and the angle phi1 at that time is read. Further, the light position detector 4 is fixed at the position receiving this light and the wave length alpha of the light source 1 is changed by DELTAalpha. Since the angle of deviation is changed, the angle of the stand 6 is shifted by DELTAphi1 so that the angle of deviation is not moved by using the detector 4 fixed. The variance on wave length of the refractive index can be obtained from the measurement of prism vertical angle alpha, DELTAphi1, phi and DELTAlambda. Thus, since the turning angle of the test stand can be extended, high accuracy measurement can be made.
JP8062978A 1978-07-03 1978-07-03 Refractive index dispersion measuring device Expired JPS581743B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8062978A JPS581743B2 (en) 1978-07-03 1978-07-03 Refractive index dispersion measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8062978A JPS581743B2 (en) 1978-07-03 1978-07-03 Refractive index dispersion measuring device

Publications (2)

Publication Number Publication Date
JPS557654A true JPS557654A (en) 1980-01-19
JPS581743B2 JPS581743B2 (en) 1983-01-12

Family

ID=13723638

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8062978A Expired JPS581743B2 (en) 1978-07-03 1978-07-03 Refractive index dispersion measuring device

Country Status (1)

Country Link
JP (1) JPS581743B2 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02244106A (en) * 1989-03-17 1990-09-28 Hitachi Ltd Method for measuring thin film optical constants and optical integrated circuits or semiconductor devices fabricated using the method
KR200450894Y1 (en) * 2008-06-11 2010-11-08 이언칠 Refractive index measuring device
KR101027756B1 (en) 2009-08-27 2011-04-11 최제인 Optical Fiber Principle Experiment Device
CN103048118A (en) * 2012-08-24 2013-04-17 王艳文 Method for quickly positioning minimum deviation angle of triple prism
CN105044032A (en) * 2015-06-25 2015-11-11 陕西师范大学 Experimental device and experimental method for demonstrating relationship between liquid refractive index and temperature
CN106404715A (en) * 2016-08-29 2017-02-15 湖北新华光信息材料有限公司 Refractive index measurement method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02244106A (en) * 1989-03-17 1990-09-28 Hitachi Ltd Method for measuring thin film optical constants and optical integrated circuits or semiconductor devices fabricated using the method
KR200450894Y1 (en) * 2008-06-11 2010-11-08 이언칠 Refractive index measuring device
KR101027756B1 (en) 2009-08-27 2011-04-11 최제인 Optical Fiber Principle Experiment Device
CN103048118A (en) * 2012-08-24 2013-04-17 王艳文 Method for quickly positioning minimum deviation angle of triple prism
CN105044032A (en) * 2015-06-25 2015-11-11 陕西师范大学 Experimental device and experimental method for demonstrating relationship between liquid refractive index and temperature
CN106404715A (en) * 2016-08-29 2017-02-15 湖北新华光信息材料有限公司 Refractive index measurement method

Also Published As

Publication number Publication date
JPS581743B2 (en) 1983-01-12

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