JPS5578534A - Pressure-contact type semiconductor device - Google Patents

Pressure-contact type semiconductor device

Info

Publication number
JPS5578534A
JPS5578534A JP15224678A JP15224678A JPS5578534A JP S5578534 A JPS5578534 A JP S5578534A JP 15224678 A JP15224678 A JP 15224678A JP 15224678 A JP15224678 A JP 15224678A JP S5578534 A JPS5578534 A JP S5578534A
Authority
JP
Japan
Prior art keywords
conductor
plate
outer periphery
cut
harder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15224678A
Other languages
Japanese (ja)
Inventor
Mitsuo Odate
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP15224678A priority Critical patent/JPS5578534A/en
Publication of JPS5578534A publication Critical patent/JPS5578534A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To prevent plastic deformation and to minimize friction force by arranging a metal harder than a main electrode conductor in a cut provided on the outer periphery of a contact zone with a thermal compensation plate working as one electrode of a semiconductor element.
CONSTITUTION: A thermal compensation plate 3 to work as electrode is provided on one side of a semiconductor element, and an anode conductor 6 is provided on the plate 3. Then, a cut 12 is provided on the overall outer periphery on the conductor 6 side of a contact zone of the plate 3 with the conductor 6, and a metallic ring 13 of molybdenum, tungsten, titanium, rhodium, chrome, etc. which is harder than copper constituting the conductor 6 is arranged in the cut 12. According to this constitution, the ring 13 and the plate 3 are easy to slide with each other even when a presoure applied to the direction P indicated by an arrow is small, the outer periphery of an end of the conductor 6 is prevented from drooping through plastic deformation as the ring 13 is harder than the conductor 6, and thus curvatures of the conductor 6 and the plate 3 are reduced to zero to secure contact entirely through the whole surface by compression.
COPYRIGHT: (C)1980,JPO&Japio
JP15224678A 1978-12-08 1978-12-08 Pressure-contact type semiconductor device Pending JPS5578534A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15224678A JPS5578534A (en) 1978-12-08 1978-12-08 Pressure-contact type semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15224678A JPS5578534A (en) 1978-12-08 1978-12-08 Pressure-contact type semiconductor device

Publications (1)

Publication Number Publication Date
JPS5578534A true JPS5578534A (en) 1980-06-13

Family

ID=15536284

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15224678A Pending JPS5578534A (en) 1978-12-08 1978-12-08 Pressure-contact type semiconductor device

Country Status (1)

Country Link
JP (1) JPS5578534A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6235527A (en) * 1985-08-08 1987-02-16 Mitsubishi Electric Corp Semiconductor device
JP2013160542A (en) * 2012-02-02 2013-08-19 Honda Motor Co Ltd Inspection method and inspection apparatus for semiconductor chip

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6235527A (en) * 1985-08-08 1987-02-16 Mitsubishi Electric Corp Semiconductor device
JP2013160542A (en) * 2012-02-02 2013-08-19 Honda Motor Co Ltd Inspection method and inspection apparatus for semiconductor chip

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