JPS5582060A - Surface potentiometer having plurality of probes - Google Patents

Surface potentiometer having plurality of probes

Info

Publication number
JPS5582060A
JPS5582060A JP15419978A JP15419978A JPS5582060A JP S5582060 A JPS5582060 A JP S5582060A JP 15419978 A JP15419978 A JP 15419978A JP 15419978 A JP15419978 A JP 15419978A JP S5582060 A JPS5582060 A JP S5582060A
Authority
JP
Japan
Prior art keywords
probes
circuit
main body
surface potential
selection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15419978A
Other languages
Japanese (ja)
Inventor
Minoru Aoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP15419978A priority Critical patent/JPS5582060A/en
Publication of JPS5582060A publication Critical patent/JPS5582060A/en
Pending legal-status Critical Current

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  • Measurement Of Current Or Voltage (AREA)

Abstract

PURPOSE: To sequentially enable to measure the surface potential for a plurality of parts with one main body without moving the probes, by connecting a plurality of probes to the main body constituting the surface potential and providing the selection circuit selectively inputting the detection signal of an arbitrary probe among a plurality of probes to the said main body.
CONSTITUTION: A plurality of probes P1WPn are connected to the fixed terminals S1WSn of the selection circuit 2 consisting of the analog multiplexer and electromagnetic relays of the surface potentiometer main body 1, and the signal processing circuit C processing the detection signal in response to the surface potential detected with the probes P1WPn is connected to the selection terminal T of the circuit 2. With the said constitution, when the surface potentials V1WVn are measrued with the parts of plurality 3aW3n of measured body 3, one of the probes P1WPn corresponding to the measuring parts 3aW3n is selected with the selection of the terminal T of the circuit 2 by the signal from the control circuit 4 to sequentially measure the surface potential.
COPYRIGHT: (C)1980,JPO&Japio
JP15419978A 1978-12-15 1978-12-15 Surface potentiometer having plurality of probes Pending JPS5582060A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15419978A JPS5582060A (en) 1978-12-15 1978-12-15 Surface potentiometer having plurality of probes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15419978A JPS5582060A (en) 1978-12-15 1978-12-15 Surface potentiometer having plurality of probes

Publications (1)

Publication Number Publication Date
JPS5582060A true JPS5582060A (en) 1980-06-20

Family

ID=15578997

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15419978A Pending JPS5582060A (en) 1978-12-15 1978-12-15 Surface potentiometer having plurality of probes

Country Status (1)

Country Link
JP (1) JPS5582060A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4656595A (en) * 1982-04-19 1987-04-07 Sentralinstitutt For Industriell Forskning Method and a device for monitoring large metal structures

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4656595A (en) * 1982-04-19 1987-04-07 Sentralinstitutt For Industriell Forskning Method and a device for monitoring large metal structures

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