JPS5584093A - Bubble memory test equipment - Google Patents

Bubble memory test equipment

Info

Publication number
JPS5584093A
JPS5584093A JP16084178A JP16084178A JPS5584093A JP S5584093 A JPS5584093 A JP S5584093A JP 16084178 A JP16084178 A JP 16084178A JP 16084178 A JP16084178 A JP 16084178A JP S5584093 A JPS5584093 A JP S5584093A
Authority
JP
Japan
Prior art keywords
driven
test
control circuit
block address
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16084178A
Other languages
Japanese (ja)
Inventor
Tsunesuke Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP16084178A priority Critical patent/JPS5584093A/en
Publication of JPS5584093A publication Critical patent/JPS5584093A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To secure an accurate test for the bubble memory in a short time by varying the test parameters in sequence with every operation of the block address.
CONSTITUTION: When test pattern parameter rotary magnetic field HR given from computer 9 is applied to control circuit 13, the amplitude and the phase of field HR from computer 9 vary in sequence and every block address via multiplexer 43 controlled by delay circuit 44 as well as D/A converter 42 which connects address counter 41 varying the block address with every field HR. Thus rotary magnetic field driver 5 is driven. In the same way, the amplitude and the phase vary with every data block via control circuit 11 for transfer gate pulse current IT of the test parameter, annihilator current pulse IA, data pattern pulse current IG and others each. Thus current pulse driver 3 is driven and then the bubble chip of wafer 1 is driven. And thus the corresponding reading signals are detected via signal detection circuit 4 and similar control circuit 12.
COPYRIGHT: (C)1980,JPO&Japio
JP16084178A 1978-12-19 1978-12-19 Bubble memory test equipment Pending JPS5584093A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16084178A JPS5584093A (en) 1978-12-19 1978-12-19 Bubble memory test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16084178A JPS5584093A (en) 1978-12-19 1978-12-19 Bubble memory test equipment

Publications (1)

Publication Number Publication Date
JPS5584093A true JPS5584093A (en) 1980-06-24

Family

ID=15723556

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16084178A Pending JPS5584093A (en) 1978-12-19 1978-12-19 Bubble memory test equipment

Country Status (1)

Country Link
JP (1) JPS5584093A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57117176A (en) * 1981-01-14 1982-07-21 Hitachi Ltd Noise processing method for magnetic bubble memory device
JPS59121687A (en) * 1982-12-27 1984-07-13 Fujitsu Ltd Method for testing bubble memory element
JPS59180880A (en) * 1983-03-31 1984-10-15 Fujitsu Ltd Test method of magnetic bubble memory element
JPH0611448U (en) * 1991-08-28 1994-02-15 渡辺泰株式会社 Assembling tool of pillar and cross member

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57117176A (en) * 1981-01-14 1982-07-21 Hitachi Ltd Noise processing method for magnetic bubble memory device
JPS59121687A (en) * 1982-12-27 1984-07-13 Fujitsu Ltd Method for testing bubble memory element
JPS59180880A (en) * 1983-03-31 1984-10-15 Fujitsu Ltd Test method of magnetic bubble memory element
JPH0611448U (en) * 1991-08-28 1994-02-15 渡辺泰株式会社 Assembling tool of pillar and cross member

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