JPS5585248A - Flaw detecting probe for non-destructive inspection - Google Patents
Flaw detecting probe for non-destructive inspectionInfo
- Publication number
- JPS5585248A JPS5585248A JP15741178A JP15741178A JPS5585248A JP S5585248 A JPS5585248 A JP S5585248A JP 15741178 A JP15741178 A JP 15741178A JP 15741178 A JP15741178 A JP 15741178A JP S5585248 A JPS5585248 A JP S5585248A
- Authority
- JP
- Japan
- Prior art keywords
- fins
- destructive inspection
- detecting probe
- case
- flaw detecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 title abstract 3
- 230000001066 destructive effect Effects 0.000 title 1
- 238000007689 inspection Methods 0.000 title 1
- 238000010276 construction Methods 0.000 abstract 1
- 238000010348 incorporation Methods 0.000 abstract 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
PURPOSE: To facilitate replacement of aligning fins by mutually fastening thereof with a circular elastic member empolying a multi-split construction.
CONSTITUTION: The replacement of the aligning fins is made by shifting a circular elastic body 19 to the probe body 5 while the probe body 5 is left mounted without disassembling the case 3a, the case 3b and parts 6 and 7 in the case. After the incorporation of the parts into the cases 3a and 3b, the alighning fins can be set. Thus, there will be no damage to the aligning fins during the assembly.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15741178A JPS5585248A (en) | 1978-12-22 | 1978-12-22 | Flaw detecting probe for non-destructive inspection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15741178A JPS5585248A (en) | 1978-12-22 | 1978-12-22 | Flaw detecting probe for non-destructive inspection |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5585248A true JPS5585248A (en) | 1980-06-27 |
Family
ID=15649038
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15741178A Pending JPS5585248A (en) | 1978-12-22 | 1978-12-22 | Flaw detecting probe for non-destructive inspection |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5585248A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5969275A (en) * | 1998-06-08 | 1999-10-19 | Zetec, Inc. | Probe with replaceable centering feet |
-
1978
- 1978-12-22 JP JP15741178A patent/JPS5585248A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5969275A (en) * | 1998-06-08 | 1999-10-19 | Zetec, Inc. | Probe with replaceable centering feet |
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