JPS5590861A - High-frequency coaxial probe - Google Patents

High-frequency coaxial probe

Info

Publication number
JPS5590861A
JPS5590861A JP16480778A JP16480778A JPS5590861A JP S5590861 A JPS5590861 A JP S5590861A JP 16480778 A JP16480778 A JP 16480778A JP 16480778 A JP16480778 A JP 16480778A JP S5590861 A JPS5590861 A JP S5590861A
Authority
JP
Japan
Prior art keywords
probe
folded
coaxial line
frequency coaxial
coaxial probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16480778A
Other languages
Japanese (ja)
Other versions
JPS623906B2 (en
Inventor
Katsuhiko Suyama
Hirotsugu Kusakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP16480778A priority Critical patent/JPS5590861A/en
Publication of JPS5590861A publication Critical patent/JPS5590861A/en
Publication of JPS623906B2 publication Critical patent/JPS623906B2/ja
Granted legal-status Critical Current

Links

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  • Measuring Leads Or Probes (AREA)

Abstract

PURPOSE: To make it possible to shorten the length of a probe by providing a folded coaxial line, and a probe connected to the core at the folded point, and terminating both ends of the coaxial line with characteristic impedance of the coaxial line.
CONSTITUTION: A coaxial lines 6 is folded and the core and a probe 3 are connected to each other at this folded point, and a terminal resistance is mounted on the end of the coaxial line. The value of the terminal resistance is made equal to the characteristic impedance, whereby even at the end part of the line, multiple reflction of signal pulses can be prevented. By this procedure, the length of the probe can be reduced to about 1mm, and hence it is possible to obtain a probe most adapted to the measurement of the high-frequency characteristic.
COPYRIGHT: (C)1980,JPO&Japio
JP16480778A 1978-12-28 1978-12-28 High-frequency coaxial probe Granted JPS5590861A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16480778A JPS5590861A (en) 1978-12-28 1978-12-28 High-frequency coaxial probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16480778A JPS5590861A (en) 1978-12-28 1978-12-28 High-frequency coaxial probe

Publications (2)

Publication Number Publication Date
JPS5590861A true JPS5590861A (en) 1980-07-09
JPS623906B2 JPS623906B2 (en) 1987-01-27

Family

ID=15800284

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16480778A Granted JPS5590861A (en) 1978-12-28 1978-12-28 High-frequency coaxial probe

Country Status (1)

Country Link
JP (1) JPS5590861A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6047432A (en) * 1983-08-26 1985-03-14 Nippon Telegr & Teleph Corp <Ntt> Coaxial high-frequency probe
EP1186895A1 (en) * 2000-09-07 2002-03-13 Lucent Technologies Inc. Improved RF test probe
WO2012041578A1 (en) * 2010-09-27 2012-04-05 Ingun Prüfmittelbau Gmbh High frequency test probe
KR20180072204A (en) 2016-12-21 2018-06-29 주식회사 아이지에스피 A method and an apparatus using the result of collective quality measurement as selection criteria of a bulk of grains
KR20180072218A (en) 2016-12-21 2018-06-29 주식회사 아이지에스피 A sorting device measuring collective quality of grains under selection

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6047432A (en) * 1983-08-26 1985-03-14 Nippon Telegr & Teleph Corp <Ntt> Coaxial high-frequency probe
EP1186895A1 (en) * 2000-09-07 2002-03-13 Lucent Technologies Inc. Improved RF test probe
US6753676B1 (en) 2000-09-07 2004-06-22 Lucent Technologies Inc. RF test probe
WO2012041578A1 (en) * 2010-09-27 2012-04-05 Ingun Prüfmittelbau Gmbh High frequency test probe
KR20180072204A (en) 2016-12-21 2018-06-29 주식회사 아이지에스피 A method and an apparatus using the result of collective quality measurement as selection criteria of a bulk of grains
KR20180072218A (en) 2016-12-21 2018-06-29 주식회사 아이지에스피 A sorting device measuring collective quality of grains under selection

Also Published As

Publication number Publication date
JPS623906B2 (en) 1987-01-27

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