JPS5593591A - Driving system of semiconductor memory device - Google Patents
Driving system of semiconductor memory deviceInfo
- Publication number
- JPS5593591A JPS5593591A JP16511878A JP16511878A JPS5593591A JP S5593591 A JPS5593591 A JP S5593591A JP 16511878 A JP16511878 A JP 16511878A JP 16511878 A JP16511878 A JP 16511878A JP S5593591 A JPS5593591 A JP S5593591A
- Authority
- JP
- Japan
- Prior art keywords
- gate
- gates
- substrate
- silicon
- information
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/68—Floating-gate IGFETs
- H10D30/681—Floating-gate IGFETs having only two programming levels
Landscapes
- Read Only Memory (AREA)
- Non-Volatile Memory (AREA)
Abstract
PURPOSE:To make it possible to write, read and erase information with a low voltage and secure non-volatilization of information by extending a floating gate onto an insulating film for field to make the floating gate opposite to two kinds of control gate. CONSTITUTION:Oxide film 12 for field, an n<+>-type source region, an n<+>-type drain region, gate oxide film 15, silicon floating gate 16, silicon first control gate 171, silicon second control gate 172, and phsphosilicate glass film 18 are formed on p- type silicon semiconductor substrate 11. Then, capacity C1 is formed between substrate 11 and gate 15, and capacity C2 is formed between gates 16 and 171, and capacity C3 is formed between gates 16 and 172, and C3>0 is defined. For information write, a prescribed voltage for write is applied to gates 171 and 172, and due to the polarity, a positive or negative charge is injected to gate 16 from the substrate 11 side. For information read, a prescribed voltage is applied to one of gates 171 and 172, and the other is set to the same potential as substrate 11.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP53165118A JPS6025030B2 (en) | 1978-12-29 | 1978-12-29 | Drive method of semiconductor memory device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP53165118A JPS6025030B2 (en) | 1978-12-29 | 1978-12-29 | Drive method of semiconductor memory device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5593591A true JPS5593591A (en) | 1980-07-16 |
| JPS6025030B2 JPS6025030B2 (en) | 1985-06-15 |
Family
ID=15806246
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP53165118A Expired JPS6025030B2 (en) | 1978-12-29 | 1978-12-29 | Drive method of semiconductor memory device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6025030B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5823390A (en) * | 1981-07-30 | 1983-02-12 | Toshiba Corp | Semiconductor storage device |
| JP2001168213A (en) * | 1999-12-03 | 2001-06-22 | Fujitsu Ltd | Semiconductor memory device and method of manufacturing the same |
-
1978
- 1978-12-29 JP JP53165118A patent/JPS6025030B2/en not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5823390A (en) * | 1981-07-30 | 1983-02-12 | Toshiba Corp | Semiconductor storage device |
| JP2001168213A (en) * | 1999-12-03 | 2001-06-22 | Fujitsu Ltd | Semiconductor memory device and method of manufacturing the same |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6025030B2 (en) | 1985-06-15 |
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