JPS56105653A - Gold bump forming method of semiconductor device - Google Patents
Gold bump forming method of semiconductor deviceInfo
- Publication number
- JPS56105653A JPS56105653A JP861380A JP861380A JPS56105653A JP S56105653 A JPS56105653 A JP S56105653A JP 861380 A JP861380 A JP 861380A JP 861380 A JP861380 A JP 861380A JP S56105653 A JPS56105653 A JP S56105653A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- bump
- resist mask
- metal
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
Landscapes
- Wire Bonding (AREA)
Abstract
PURPOSE:To contrive an increase of junction strength by removing a conducting metal layer and subsequently forming the Au bump by applying an electroplating, after a three layers structure of a groundwork metal, intermediate metal and conducting metal is accumulated on a substrate and a resist mask is mounted. CONSTITUTION:An SiO2 film 3 is formed with an opening to allow the Cr groundwork layer 4, Au intermediate layer 5a and Cu conductive layer 8 to be layer-built on an Al electrode 2 on the Si substrate 1. The resist mask 6 is applied to eause the Cu layer 8 to be etched, the Au 5a to be exposed and the Au bump to be formed by the electroplating. Then, by removing the resist mask 6 and etching the Cu 8, Au 5a, Cr 4 with the Au bump 7 as a mask, the Au bump 7 extremely high in junction strength is finished. With such a method, the adhesive strength is not decreased at 11 by the remained resist thin film as conventional.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP861380A JPS56105653A (en) | 1980-01-28 | 1980-01-28 | Gold bump forming method of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP861380A JPS56105653A (en) | 1980-01-28 | 1980-01-28 | Gold bump forming method of semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56105653A true JPS56105653A (en) | 1981-08-22 |
Family
ID=11697795
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP861380A Pending JPS56105653A (en) | 1980-01-28 | 1980-01-28 | Gold bump forming method of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56105653A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6442842A (en) * | 1987-08-10 | 1989-02-15 | Nec Corp | Manufacture of semiconductor device |
| US5665639A (en) * | 1994-02-23 | 1997-09-09 | Cypress Semiconductor Corp. | Process for manufacturing a semiconductor device bump electrode using a rapid thermal anneal |
| WO2005053012A1 (en) * | 2003-11-29 | 2005-06-09 | Infineon Technologies Ag | Method for galvanising and forming a contact boss |
-
1980
- 1980-01-28 JP JP861380A patent/JPS56105653A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6442842A (en) * | 1987-08-10 | 1989-02-15 | Nec Corp | Manufacture of semiconductor device |
| US5665639A (en) * | 1994-02-23 | 1997-09-09 | Cypress Semiconductor Corp. | Process for manufacturing a semiconductor device bump electrode using a rapid thermal anneal |
| WO2005053012A1 (en) * | 2003-11-29 | 2005-06-09 | Infineon Technologies Ag | Method for galvanising and forming a contact boss |
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