JPS56167344A - Integrated circuit chip - Google Patents

Integrated circuit chip

Info

Publication number
JPS56167344A
JPS56167344A JP7027180A JP7027180A JPS56167344A JP S56167344 A JPS56167344 A JP S56167344A JP 7027180 A JP7027180 A JP 7027180A JP 7027180 A JP7027180 A JP 7027180A JP S56167344 A JPS56167344 A JP S56167344A
Authority
JP
Japan
Prior art keywords
circuit
circuits
voltage
memory array
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7027180A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6351276B2 (de
Inventor
Masaaki Yano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP7027180A priority Critical patent/JPS56167344A/ja
Publication of JPS56167344A publication Critical patent/JPS56167344A/ja
Publication of JPS6351276B2 publication Critical patent/JPS6351276B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Non-Volatile Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP7027180A 1980-05-27 1980-05-27 Integrated circuit chip Granted JPS56167344A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7027180A JPS56167344A (en) 1980-05-27 1980-05-27 Integrated circuit chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7027180A JPS56167344A (en) 1980-05-27 1980-05-27 Integrated circuit chip

Publications (2)

Publication Number Publication Date
JPS56167344A true JPS56167344A (en) 1981-12-23
JPS6351276B2 JPS6351276B2 (de) 1988-10-13

Family

ID=13426685

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7027180A Granted JPS56167344A (en) 1980-05-27 1980-05-27 Integrated circuit chip

Country Status (1)

Country Link
JP (1) JPS56167344A (de)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53128240A (en) * 1977-04-13 1978-11-09 Philips Nv Integrated circuit
JPS5415650A (en) * 1977-06-21 1979-02-05 Handotai Kenkyu Shinkokai Semiconductor ic

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53128240A (en) * 1977-04-13 1978-11-09 Philips Nv Integrated circuit
JPS5415650A (en) * 1977-06-21 1979-02-05 Handotai Kenkyu Shinkokai Semiconductor ic

Also Published As

Publication number Publication date
JPS6351276B2 (de) 1988-10-13

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