JPS57101714A - Measuring method for film thickness - Google Patents
Measuring method for film thicknessInfo
- Publication number
- JPS57101714A JPS57101714A JP55179447A JP17944780A JPS57101714A JP S57101714 A JPS57101714 A JP S57101714A JP 55179447 A JP55179447 A JP 55179447A JP 17944780 A JP17944780 A JP 17944780A JP S57101714 A JPS57101714 A JP S57101714A
- Authority
- JP
- Japan
- Prior art keywords
- film
- thickness
- oxidized
- anodizing
- film thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
PURPOSE:To measure a film thickness with simplicity, by utilizing the phenomenon that thickness of a film oxidized by anodizing increases over thickness of the film before being oxidized at a constant rate. CONSTITUTION:In a process a, an anodizing liquid 4 is dropped on a multilayer thin film 2 piled on a substrate 1. And, in a process b, an anode is oxidized. And, in a process e, height of swelling portion of an anodized film 9 on the multilayer film 2 is measured by using a roughness gauge 11. And finally, by measuring the swelling rate of film thickness of surface first layer by anodizing in advance by using another specimen, thikness of a surface first layer 9' is calculated by the result.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55179447A JPS57101714A (en) | 1980-12-17 | 1980-12-17 | Measuring method for film thickness |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55179447A JPS57101714A (en) | 1980-12-17 | 1980-12-17 | Measuring method for film thickness |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57101714A true JPS57101714A (en) | 1982-06-24 |
Family
ID=16066012
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55179447A Pending JPS57101714A (en) | 1980-12-17 | 1980-12-17 | Measuring method for film thickness |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57101714A (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4852486A (en) * | 1971-11-02 | 1973-07-23 |
-
1980
- 1980-12-17 JP JP55179447A patent/JPS57101714A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4852486A (en) * | 1971-11-02 | 1973-07-23 |
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