JPS57101714A - Measuring method for film thickness - Google Patents

Measuring method for film thickness

Info

Publication number
JPS57101714A
JPS57101714A JP55179447A JP17944780A JPS57101714A JP S57101714 A JPS57101714 A JP S57101714A JP 55179447 A JP55179447 A JP 55179447A JP 17944780 A JP17944780 A JP 17944780A JP S57101714 A JPS57101714 A JP S57101714A
Authority
JP
Japan
Prior art keywords
film
thickness
oxidized
anodizing
film thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55179447A
Other languages
English (en)
Inventor
Shinichiro Ishihara
Takashi Hirao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP55179447A priority Critical patent/JPS57101714A/ja
Publication of JPS57101714A publication Critical patent/JPS57101714A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP55179447A 1980-12-17 1980-12-17 Measuring method for film thickness Pending JPS57101714A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55179447A JPS57101714A (en) 1980-12-17 1980-12-17 Measuring method for film thickness

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55179447A JPS57101714A (en) 1980-12-17 1980-12-17 Measuring method for film thickness

Publications (1)

Publication Number Publication Date
JPS57101714A true JPS57101714A (en) 1982-06-24

Family

ID=16066012

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55179447A Pending JPS57101714A (en) 1980-12-17 1980-12-17 Measuring method for film thickness

Country Status (1)

Country Link
JP (1) JPS57101714A (ja)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4852486A (ja) * 1971-11-02 1973-07-23

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4852486A (ja) * 1971-11-02 1973-07-23

Similar Documents

Publication Publication Date Title
ES442045A1 (es) Procedimiento para preparar una hoja de medicion de presi- on.
FI840544A0 (fi) Av pao mekaniskt eller elektrokemiskt saett uppruggat aluminium framstaellt skiv,- folie,- eller bandformat material, foerfarande foer dess framstaellning och dess anvaendning som baerarmaterial foer offsettryckplattor
JPS538165A (en) Thickness measuring method of thin film material and thin film material thickness measuring apparatus
JPS522452A (en) Method and apparatus for measuring plate thickness
GB2004375A (en) Measuring hardness of deposited films
JPS6439533A (en) Pressure sensitive foil
JPS5421797A (en) Coating film deterioration detecting method
JPS56111481A (en) Measuring device for electron beam diameter
GB1405964A (en) Method and apparatus for determining the surface area of a workpiece
JPS5563708A (en) Thickness measuring method for anticorrosive film
JPS5683028A (en) Manufacture of semiconductor device
JPS6431034A (en) Indentation hardness testing method
JPS5560804A (en) Measuring method for film thickness
JPS5567609A (en) Measuring method of surface area
JPS5756291A (en) Printing method for metallic plate
LOEB et al. Slime Analysis of painted steel panels immersed in Biscayne Bay, Miami Beach, Florida[Final Report, Dec. 1978- Aug. 1980]
Patrie Inherent Stresses and Flexibility of Anodically Produced Oxide Films
JPS55131710A (en) Method for measuring thickness of thin film layer
JPS57128074A (en) Semiconductor pressure sensor
JPS5380250A (en) Film thickness measuring method of garmet films
Komine et al. High-speed ellipsometer and its application to the process line
JPS5794643A (en) Laminated type oxygen sensor element
JPS5599063A (en) Measuring apparatus for oxygen concentration
JPS57156881A (en) Measuring method of coating rate in case of rolling press-contact of composite strip
JPS56143537A (en) Manufacture of magnetic recording medium