JPS5728331A - Electronic beam exposing system - Google Patents

Electronic beam exposing system

Info

Publication number
JPS5728331A
JPS5728331A JP10344380A JP10344380A JPS5728331A JP S5728331 A JPS5728331 A JP S5728331A JP 10344380 A JP10344380 A JP 10344380A JP 10344380 A JP10344380 A JP 10344380A JP S5728331 A JPS5728331 A JP S5728331A
Authority
JP
Japan
Prior art keywords
information
pattern
unit scanning
inverted
describing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10344380A
Other languages
English (en)
Inventor
Seigo Igaki
Yoshiaki Goto
Yasuo Furukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP10344380A priority Critical patent/JPS5728331A/ja
Publication of JPS5728331A publication Critical patent/JPS5728331A/ja
Pending legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3174Particle-beam lithography, e.g. electron beam lithography

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Electron Beam Exposure (AREA)
JP10344380A 1980-07-28 1980-07-28 Electronic beam exposing system Pending JPS5728331A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10344380A JPS5728331A (en) 1980-07-28 1980-07-28 Electronic beam exposing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10344380A JPS5728331A (en) 1980-07-28 1980-07-28 Electronic beam exposing system

Publications (1)

Publication Number Publication Date
JPS5728331A true JPS5728331A (en) 1982-02-16

Family

ID=14354169

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10344380A Pending JPS5728331A (en) 1980-07-28 1980-07-28 Electronic beam exposing system

Country Status (1)

Country Link
JP (1) JPS5728331A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0244712A (ja) * 1988-08-05 1990-02-14 Toshiba Mach Co Ltd 線対称パターンを含むパターンの描画方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0244712A (ja) * 1988-08-05 1990-02-14 Toshiba Mach Co Ltd 線対称パターンを含むパターンの描画方法

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