JPS5743439A - Selective oxidation isolation type semiconductor device - Google Patents
Selective oxidation isolation type semiconductor deviceInfo
- Publication number
- JPS5743439A JPS5743439A JP56104464A JP10446481A JPS5743439A JP S5743439 A JPS5743439 A JP S5743439A JP 56104464 A JP56104464 A JP 56104464A JP 10446481 A JP10446481 A JP 10446481A JP S5743439 A JPS5743439 A JP S5743439A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- semiconductor device
- film
- emitter
- type semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/01—Manufacture or treatment
- H10D64/011—Manufacture or treatment of electrodes ohmically coupled to a semiconductor
- H10D64/0111—Manufacture or treatment of electrodes ohmically coupled to a semiconductor to Group IV semiconductors
- H10D64/0113—Manufacture or treatment of electrodes ohmically coupled to a semiconductor to Group IV semiconductors the conductive layers comprising highly doped semiconductor materials, e.g. polysilicon layers or amorphous silicon layers
Landscapes
- Local Oxidation Of Silicon (AREA)
- Bipolar Transistors (AREA)
- Element Separation (AREA)
Abstract
PURPOSE:To prevent the shortcircuit between an emitter and a base of a semiconductor device by forming an aluminum film (electrode) via a polycrystalline silicon layer at a bird beak part. CONSTITUTION:After an element isolating SiO2 film 6 is formed, a P type impurity is diffused throug a polycrystalline silicon layer 7, thereby forming a base region 9, the part to be formed with an emitter region is covered as a mask with an Si3N4 film 10, and the layer 7 is selectively oxidized. Then, the film 10 used as the mask is removed to expose the layer 7, and an emitter diffusion is performed through the layer 7. Then this layer 7 is used as a contacting unit between the emitter region and the aluminum electrode as it is.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56104464A JPS5743439A (en) | 1981-07-06 | 1981-07-06 | Selective oxidation isolation type semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56104464A JPS5743439A (en) | 1981-07-06 | 1981-07-06 | Selective oxidation isolation type semiconductor device |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5642377A Division JPS53142185A (en) | 1977-05-18 | 1977-05-18 | Manufacture of walled emitter type semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5743439A true JPS5743439A (en) | 1982-03-11 |
Family
ID=14381304
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56104464A Pending JPS5743439A (en) | 1981-07-06 | 1981-07-06 | Selective oxidation isolation type semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5743439A (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5140866A (en) * | 1974-10-04 | 1976-04-06 | Nippon Electric Co | |
| JPS524433A (en) * | 1975-06-30 | 1977-01-13 | Matsushita Electric Works Ltd | Composite plating method |
-
1981
- 1981-07-06 JP JP56104464A patent/JPS5743439A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5140866A (en) * | 1974-10-04 | 1976-04-06 | Nippon Electric Co | |
| JPS524433A (en) * | 1975-06-30 | 1977-01-13 | Matsushita Electric Works Ltd | Composite plating method |
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