JPS574560A - Testing method of mos integrated circuit - Google Patents
Testing method of mos integrated circuitInfo
- Publication number
- JPS574560A JPS574560A JP7860380A JP7860380A JPS574560A JP S574560 A JPS574560 A JP S574560A JP 7860380 A JP7860380 A JP 7860380A JP 7860380 A JP7860380 A JP 7860380A JP S574560 A JPS574560 A JP S574560A
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- test
- current
- consumption current
- measured value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To detect the fault in the MOS type integrated circuit being under the life test, by comparing the consumed current measured by a voltage which varies stepwise during the test and the consumption current before the test. CONSTITUTION:The MOS type integrated circuit 1 to be tested is connected to a current device 3 which generates a step shaped voltage via a current measuring device 2 for measuring the consumption current. Every time a clock signal comes from a clock signal generator 4, the consumption current of the integrated circuit 1 is measured at each step of the step shaped voltage. By the operation of a switch 7 the measured value before the test is stored in a first memory 8, and the measured value during the test is stored in a second memory 9. Then, the contents of the memories 8 and 9 are read out and applied on a comparator 14. Thus the values of the consumption current at the same step of the step shaped voltage are compared, and the output is generated by the comparator 14 when the measured value is changed. In this way the integrated circuit can be tested by a simple method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7860380A JPS574560A (en) | 1980-06-10 | 1980-06-10 | Testing method of mos integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7860380A JPS574560A (en) | 1980-06-10 | 1980-06-10 | Testing method of mos integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS574560A true JPS574560A (en) | 1982-01-11 |
Family
ID=13666466
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7860380A Pending JPS574560A (en) | 1980-06-10 | 1980-06-10 | Testing method of mos integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS574560A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6810344B1 (en) | 1999-11-11 | 2004-10-26 | Kabushiki Kaisha Toshiba | Semiconductor testing method and semiconductor testing apparatus for semiconductor devices, and program for executing semiconductor testing method |
-
1980
- 1980-06-10 JP JP7860380A patent/JPS574560A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6810344B1 (en) | 1999-11-11 | 2004-10-26 | Kabushiki Kaisha Toshiba | Semiconductor testing method and semiconductor testing apparatus for semiconductor devices, and program for executing semiconductor testing method |
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