JPS5772082A - Device for testing logic circuit - Google Patents
Device for testing logic circuitInfo
- Publication number
- JPS5772082A JPS5772082A JP55148989A JP14898980A JPS5772082A JP S5772082 A JPS5772082 A JP S5772082A JP 55148989 A JP55148989 A JP 55148989A JP 14898980 A JP14898980 A JP 14898980A JP S5772082 A JPS5772082 A JP S5772082A
- Authority
- JP
- Japan
- Prior art keywords
- output signal
- signal
- high speed
- output
- under test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To make it possible to perform tests even though the output of an IC under test varies at a high speed, by adding a high speed buffer register, wherein varying state of the output of the IC under test in time domain is stored every time a strobe signal whose speed is faster than the operating cycle of a testing device, to a measuring system. CONSTITUTION:A level comparator 20 is connected to the IC under test 10 which receives an input signal 102, executes logic operation, and outputs an output signal 103. The output signal 103 is compared with a reference voltage level input signal 201. The output signal of the comparator 20 is inputted to an input terminal 501 of the high speed buffer register 50 to which the high speed strobe signal 504 is inputted. To said register 50, a selecting circuit 60, which selectively receives an output signal 503 of the register 50 and the output signal 202, is connected. An output signal 601 from said circuit 60 is supplied to a pattern comparator 40 and compared with a comparing pattern input logic signal 401, and an output signal 402 is outputted to a testing device control system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55148989A JPS5772082A (en) | 1980-10-24 | 1980-10-24 | Device for testing logic circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55148989A JPS5772082A (en) | 1980-10-24 | 1980-10-24 | Device for testing logic circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5772082A true JPS5772082A (en) | 1982-05-06 |
| JPH026027B2 JPH026027B2 (en) | 1990-02-07 |
Family
ID=15465207
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55148989A Granted JPS5772082A (en) | 1980-10-24 | 1980-10-24 | Device for testing logic circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5772082A (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5413241A (en) * | 1977-07-01 | 1979-01-31 | Takeda Riken Ind Co Ltd | Ic tester |
| JPS553456U (en) * | 1978-06-21 | 1980-01-10 |
-
1980
- 1980-10-24 JP JP55148989A patent/JPS5772082A/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5413241A (en) * | 1977-07-01 | 1979-01-31 | Takeda Riken Ind Co Ltd | Ic tester |
| JPS553456U (en) * | 1978-06-21 | 1980-01-10 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH026027B2 (en) | 1990-02-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR890004450B1 (en) | Test vector indexing method & apparatus | |
| KR950033511A (en) | How to use the device's border-scan port to do a partial scan of the device | |
| KR900005472A (en) | Check buffer / register | |
| GB1498125A (en) | Digital circuit module test system | |
| GB1523060A (en) | Printed circuit board tester | |
| EP0098399A2 (en) | Test circuitry for determining turn-on and turn-off delays of logic circuits | |
| JPS5772082A (en) | Device for testing logic circuit | |
| KR950010412B1 (en) | Integreated circuit testing device | |
| DE69030209D1 (en) | Event-enabled test architecture for integrated circuits | |
| GB1121324A (en) | An improved method of testing dynamic response | |
| KR900008788B1 (en) | Semiconductor integrated circuit device having testing circuit | |
| JPS578858A (en) | Integrated circuit package | |
| JPS57169683A (en) | Measuring device for electric current consumption | |
| JPS57169684A (en) | Testing system for integrated circuit element | |
| SU382983A1 (en) | AUTOMATIC TEST DEVICE | |
| JP2944307B2 (en) | A / D converter non-linearity inspection method | |
| JPS562045A (en) | Inspection unit for random logic circuit | |
| SU725048A1 (en) | Arrangement for measuring dynamic parameters of microcircuits | |
| RU2020498C1 (en) | Device for control of contacting of integrated circuits | |
| JPS57111714A (en) | Integrated circuit | |
| JPS5760414A (en) | Automatic testing device of electric power source | |
| JPS5855873A (en) | Ic tester | |
| KR930009149B1 (en) | Digital IC Logic Level Generator Circuit for Device Inspection Equipment | |
| SU1383231A1 (en) | Device for checking quality of ic contact | |
| JPS56140448A (en) | Logical operation circuit |