JPS5754048A - Sekigaisengazonyoruijokanshisochi - Google Patents

Sekigaisengazonyoruijokanshisochi

Info

Publication number
JPS5754048A
JPS5754048A JP12410680A JP12410680A JPS5754048A JP S5754048 A JPS5754048 A JP S5754048A JP 12410680 A JP12410680 A JP 12410680A JP 12410680 A JP12410680 A JP 12410680A JP S5754048 A JPS5754048 A JP S5754048A
Authority
JP
Japan
Prior art keywords
picture image
temperature distribution
camera
infrared ray
abnormal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12410680A
Other languages
English (en)
Other versions
JPS6110262B2 (ja
Inventor
Hajime Inaba
Yukio Ono
Mitsuo Hiraizumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP12410680A priority Critical patent/JPS5754048A/ja
Publication of JPS5754048A publication Critical patent/JPS5754048A/ja
Publication of JPS6110262B2 publication Critical patent/JPS6110262B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/33—Director till display
    • G05B2219/33284—Remote diagnostic

Landscapes

  • Machine Tool Sensing Apparatuses (AREA)
  • Alarm Systems (AREA)
JP12410680A 1980-09-09 1980-09-09 Sekigaisengazonyoruijokanshisochi Granted JPS5754048A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12410680A JPS5754048A (ja) 1980-09-09 1980-09-09 Sekigaisengazonyoruijokanshisochi

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12410680A JPS5754048A (ja) 1980-09-09 1980-09-09 Sekigaisengazonyoruijokanshisochi

Publications (2)

Publication Number Publication Date
JPS5754048A true JPS5754048A (ja) 1982-03-31
JPS6110262B2 JPS6110262B2 (ja) 1986-03-28

Family

ID=14877062

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12410680A Granted JPS5754048A (ja) 1980-09-09 1980-09-09 Sekigaisengazonyoruijokanshisochi

Country Status (1)

Country Link
JP (1) JPS5754048A (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5924942A (ja) * 1982-07-29 1984-02-08 Fanuc Ltd 数値制御装置
JP2015141084A (ja) * 2014-01-28 2015-08-03 三菱重工業株式会社 画像補正方法、これを用いる検査方法及び検査装置
WO2018073900A1 (ja) * 2016-10-18 2018-04-26 株式会社オプティム コンピュータシステム、物体の診断方法及びプログラム
CN108247424A (zh) * 2016-12-28 2018-07-06 大族激光科技产业集团股份有限公司 一种机床加工温度的测试方法及装置
CN116297680A (zh) * 2023-03-31 2023-06-23 成都优艾维智能科技有限责任公司 一种基于无人机电力巡检红外缺陷判定方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3388034B2 (ja) * 1994-08-31 2003-03-17 株式会社東芝 分布計測データによる機器状態の監視方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5924942A (ja) * 1982-07-29 1984-02-08 Fanuc Ltd 数値制御装置
JP2015141084A (ja) * 2014-01-28 2015-08-03 三菱重工業株式会社 画像補正方法、これを用いる検査方法及び検査装置
WO2018073900A1 (ja) * 2016-10-18 2018-04-26 株式会社オプティム コンピュータシステム、物体の診断方法及びプログラム
CN108247424A (zh) * 2016-12-28 2018-07-06 大族激光科技产业集团股份有限公司 一种机床加工温度的测试方法及装置
CN108247424B (zh) * 2016-12-28 2020-06-02 大族激光科技产业集团股份有限公司 一种机床加工温度的测试方法及装置
CN116297680A (zh) * 2023-03-31 2023-06-23 成都优艾维智能科技有限责任公司 一种基于无人机电力巡检红外缺陷判定方法

Also Published As

Publication number Publication date
JPS6110262B2 (ja) 1986-03-28

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