JPS5759111A - Measuring method for film thickness - Google Patents
Measuring method for film thicknessInfo
- Publication number
- JPS5759111A JPS5759111A JP55134906A JP13490680A JPS5759111A JP S5759111 A JPS5759111 A JP S5759111A JP 55134906 A JP55134906 A JP 55134906A JP 13490680 A JP13490680 A JP 13490680A JP S5759111 A JPS5759111 A JP S5759111A
- Authority
- JP
- Japan
- Prior art keywords
- light
- pressure
- film
- container
- film thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
PURPOSE:To measure the thickness of a film nondestructively by irradiating a thin- film sample, contained in a container held under constant pressure with constant capacity, with light and by detecting variations in pressure in the container. CONSTITUTION:Light from a light source 1 is passed through a lens 2 and a monochromatic meter 3 to obtain monochromatic light, which is projected on a sample S in a measurement container 6 through a chopper 4 and a lens 5. Variations in pressure originating from the generation of heat due to light absorption are amplified by a lock-in amplifier 10, synchronizing with the chopper 4, after passing through a pressure sensor 8 and a preamplifier 9, and its output is sent to a computer 11 and a recorder 12. Thus, the film thickness is measured nondestructively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13490680A JPS6037402B2 (en) | 1980-09-27 | 1980-09-27 | How to measure film thickness |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13490680A JPS6037402B2 (en) | 1980-09-27 | 1980-09-27 | How to measure film thickness |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5759111A true JPS5759111A (en) | 1982-04-09 |
| JPS6037402B2 JPS6037402B2 (en) | 1985-08-26 |
Family
ID=15139286
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13490680A Expired JPS6037402B2 (en) | 1980-09-27 | 1980-09-27 | How to measure film thickness |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6037402B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02229577A (en) * | 1989-03-02 | 1990-09-12 | Mitsubishi Electric Corp | Coating device |
-
1980
- 1980-09-27 JP JP13490680A patent/JPS6037402B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02229577A (en) * | 1989-03-02 | 1990-09-12 | Mitsubishi Electric Corp | Coating device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6037402B2 (en) | 1985-08-26 |
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