JPS5764181A - Method and device for probing of printed substrate - Google Patents

Method and device for probing of printed substrate

Info

Publication number
JPS5764181A
JPS5764181A JP55138823A JP13882380A JPS5764181A JP S5764181 A JPS5764181 A JP S5764181A JP 55138823 A JP55138823 A JP 55138823A JP 13882380 A JP13882380 A JP 13882380A JP S5764181 A JPS5764181 A JP S5764181A
Authority
JP
Japan
Prior art keywords
determined
block
printed substrate
value
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55138823A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6318710B2 (de
Inventor
Masayuki Kawarada
Takeshi Urushibara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55138823A priority Critical patent/JPS5764181A/ja
Publication of JPS5764181A publication Critical patent/JPS5764181A/ja
Publication of JPS6318710B2 publication Critical patent/JPS6318710B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55138823A 1980-10-06 1980-10-06 Method and device for probing of printed substrate Granted JPS5764181A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55138823A JPS5764181A (en) 1980-10-06 1980-10-06 Method and device for probing of printed substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55138823A JPS5764181A (en) 1980-10-06 1980-10-06 Method and device for probing of printed substrate

Publications (2)

Publication Number Publication Date
JPS5764181A true JPS5764181A (en) 1982-04-19
JPS6318710B2 JPS6318710B2 (de) 1988-04-19

Family

ID=15231053

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55138823A Granted JPS5764181A (en) 1980-10-06 1980-10-06 Method and device for probing of printed substrate

Country Status (1)

Country Link
JP (1) JPS5764181A (de)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59134078U (ja) * 1983-02-26 1984-09-07 日本コロムビア株式会社 プリント基板試験装置
JPS62203471U (de) * 1986-06-14 1987-12-25

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54122167A (en) * 1978-03-15 1979-09-21 Fujitsu Ltd Probing mechanism

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54122167A (en) * 1978-03-15 1979-09-21 Fujitsu Ltd Probing mechanism

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59134078U (ja) * 1983-02-26 1984-09-07 日本コロムビア株式会社 プリント基板試験装置
JPS62203471U (de) * 1986-06-14 1987-12-25

Also Published As

Publication number Publication date
JPS6318710B2 (de) 1988-04-19

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