JPS5771055A - Program test system - Google Patents
Program test systemInfo
- Publication number
- JPS5771055A JPS5771055A JP55146824A JP14682480A JPS5771055A JP S5771055 A JPS5771055 A JP S5771055A JP 55146824 A JP55146824 A JP 55146824A JP 14682480 A JP14682480 A JP 14682480A JP S5771055 A JPS5771055 A JP S5771055A
- Authority
- JP
- Japan
- Prior art keywords
- program
- passage
- address
- flag
- bbb
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Prevention of errors by analysis, debugging or testing of software
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Debugging And Monitoring (AREA)
Abstract
PURPOSE:To debug a program easily by knowing display by a non-passage detecting circuit when an address which is not entered in a passage-path flag is addressed. CONSTITUTION:An address path storage part 103 sets passage-path flag ''1'' to an address expected to passed through, e.g., AAA, BBB, YYY, and ZZZ from an external writing device 301 under the control of a write control circuit 101. During the execution of a test program, when a program to be tested, after passing through addresses AAA and BBB, passes an address CCC, having a flag ''0'', which is not to be passed through, a non-passage detecting circuit 104 detects and displays that on an external non-passage display device 302. Consequently, the unexpected access of the program to be tested is detected and the contents of the internal register of a stored-program controller 201 are read to know its caused easily.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55146824A JPS5771055A (en) | 1980-10-22 | 1980-10-22 | Program test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55146824A JPS5771055A (en) | 1980-10-22 | 1980-10-22 | Program test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5771055A true JPS5771055A (en) | 1982-05-01 |
Family
ID=15416351
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55146824A Pending JPS5771055A (en) | 1980-10-22 | 1980-10-22 | Program test system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5771055A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61123942A (en) * | 1984-11-21 | 1986-06-11 | Yokogawa Electric Corp | Debug device for microprocessor |
| JPH09153594A (en) * | 1995-09-29 | 1997-06-10 | Nec Corp | Semiconductor device and its manufacture |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS519543A (en) * | 1974-07-13 | 1976-01-26 | Fujitsu Ltd | |
| JPS5559562A (en) * | 1978-10-30 | 1980-05-06 | Mitsubishi Electric Corp | Program development device |
-
1980
- 1980-10-22 JP JP55146824A patent/JPS5771055A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS519543A (en) * | 1974-07-13 | 1976-01-26 | Fujitsu Ltd | |
| JPS5559562A (en) * | 1978-10-30 | 1980-05-06 | Mitsubishi Electric Corp | Program development device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61123942A (en) * | 1984-11-21 | 1986-06-11 | Yokogawa Electric Corp | Debug device for microprocessor |
| JPH09153594A (en) * | 1995-09-29 | 1997-06-10 | Nec Corp | Semiconductor device and its manufacture |
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