JPS5771131A - Formation of conductor for aluminum electrode - Google Patents
Formation of conductor for aluminum electrodeInfo
- Publication number
- JPS5771131A JPS5771131A JP55148690A JP14869080A JPS5771131A JP S5771131 A JPS5771131 A JP S5771131A JP 55148690 A JP55148690 A JP 55148690A JP 14869080 A JP14869080 A JP 14869080A JP S5771131 A JPS5771131 A JP S5771131A
- Authority
- JP
- Japan
- Prior art keywords
- film
- electrode
- repeated
- al2o3
- air
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/02—Pretreatment of the material to be coated
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/01—Manufacture or treatment
- H10D64/011—Manufacture or treatment of electrodes ohmically coupled to a semiconductor
- H10D64/0111—Manufacture or treatment of electrodes ohmically coupled to a semiconductor to Group IV semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To suppress the progress with the passage of time of heat or electricity caused changes by a method wherein a process of vapor depositing 1/n of a prescribed thickness t of Al and of exposing the resultant thin film to air is repeated n times so that the Al layer is intentionally provided with oxide films. CONSTITUTION:A semiconductor substrate upon which Al is vapor deposited and exposed to air to provide a thin film of Al2O3. This process is repeated n times to acquire a film of prescribed thickness. Then photoetching is performed to complete an Al electrode. The Al2O3 film, constituting a barrier to migration, prevents the Al from recrystalizing into larger grains. The result is a highly reliable Al electrode that is thermally, electrically stable.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55148690A JPS5771131A (en) | 1980-10-22 | 1980-10-22 | Formation of conductor for aluminum electrode |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55148690A JPS5771131A (en) | 1980-10-22 | 1980-10-22 | Formation of conductor for aluminum electrode |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5771131A true JPS5771131A (en) | 1982-05-01 |
Family
ID=15458415
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55148690A Pending JPS5771131A (en) | 1980-10-22 | 1980-10-22 | Formation of conductor for aluminum electrode |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5771131A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61193441A (en) * | 1985-02-20 | 1986-08-27 | Mitsubishi Electric Corp | Method of forming metal thin film and therefor device |
| JPS62133735A (en) * | 1985-12-05 | 1987-06-16 | Nec Corp | Manufacture of semiconductor device |
| JPS6413740A (en) * | 1987-03-23 | 1989-01-18 | Toshiba Corp | Formation of wiring layer in semiconductor device |
-
1980
- 1980-10-22 JP JP55148690A patent/JPS5771131A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61193441A (en) * | 1985-02-20 | 1986-08-27 | Mitsubishi Electric Corp | Method of forming metal thin film and therefor device |
| JPS62133735A (en) * | 1985-12-05 | 1987-06-16 | Nec Corp | Manufacture of semiconductor device |
| JPS6413740A (en) * | 1987-03-23 | 1989-01-18 | Toshiba Corp | Formation of wiring layer in semiconductor device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| SE420914B (en) | PROCEDURE FOR COATING AN INSULATIVE SUBSTRATE WITH AN OXID LAYER OF AT LEAST ONE METAL THROUGH REACTIVE ION DEPOSITION | |
| JPS51145390A (en) | Manufacturing method of a coated layer of oxygen senser | |
| JPS5334484A (en) | Forming method for multi layer wiring | |
| JPS5637635A (en) | Manufacture of semiconductor device | |
| JPS5771131A (en) | Formation of conductor for aluminum electrode | |
| JPS57113411A (en) | Thin-film head | |
| JPS5748249A (en) | Semiconductor device | |
| GB1338337A (en) | Cadmium sulphide thin film sustained conductivity device and method for making same | |
| JPS52131484A (en) | Semiconductor device | |
| JPS57145340A (en) | Manufacture of semiconductor device | |
| GB1267975A (en) | Thin film electronic components on flexible substrates and the apparatus and process for producing same | |
| JPS575328A (en) | Growing method for semiconductor crystal | |
| JPS57149751A (en) | Semiconductor device | |
| JPS533066A (en) | Electrode formation method | |
| JPS52147992A (en) | Manufacture of semiconductor device | |
| JPS558036A (en) | Electrode formation | |
| JPS52123871A (en) | Thin film forming method | |
| JPS57106124A (en) | Wiring electrode | |
| JPS5272162A (en) | Production of semiconductor device | |
| JPS5587439A (en) | Manufacture of semiconductor device | |
| JPS5516452A (en) | Method of manufacturing semiconductor device | |
| JPS53130979A (en) | Manufacture for semiconductor device | |
| JPS55138833A (en) | Manufacture of semiconductor device | |
| JPS5546533A (en) | Method of producing insulating film of silicon oxide | |
| JPS5314555A (en) | Depositing method of impurity to silicon wafersa |