JPS5773940A - Levelling method of insulation layer - Google Patents
Levelling method of insulation layerInfo
- Publication number
- JPS5773940A JPS5773940A JP55150179A JP15017980A JPS5773940A JP S5773940 A JPS5773940 A JP S5773940A JP 55150179 A JP55150179 A JP 55150179A JP 15017980 A JP15017980 A JP 15017980A JP S5773940 A JPS5773940 A JP S5773940A
- Authority
- JP
- Japan
- Prior art keywords
- film
- substrate
- films
- etching
- constitution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/06—Planarisation of inorganic insulating materials
- H10P95/062—Planarisation of inorganic insulating materials involving a dielectric removal step
- H10P95/064—Planarisation of inorganic insulating materials involving a dielectric removal step the removal being chemical etching
Landscapes
- Drying Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To decrease unevenness of the surface and permit buried construction of an insulation layer by arranging two layers of insulation films, a film of Si nitride as a principal component for the upper layer, on the uneven surface of the substrate. CONSTITUTION:A thermally oxidized film 2 is formed on a substrate 1, and for example, Al wiring of 1mum thickness is applied on the film 2, and an SiO2 film 41 and an Si nitride film 42 of each thickness of 1mum are attached at low temperature. Then the raised part of the film 41 is etched by 0.5mum by the process of reactive ion etching using a gas mixture of H2 (27%) and CF4. In this etching method, the surface can be leveled because the raised part of the film 42 is etched faster than the recessed part, and etching speed is the same for the films 41 and 42. Also by etching treatment with two layers, the films 41 and 42, arranged as above on the substrate 1 with ditches at the separating region, a constitution of SiO2 film 41 buried in the ditch can be formed evenly without widening or forming birdbeaks.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55150179A JPS5773940A (en) | 1980-10-28 | 1980-10-28 | Levelling method of insulation layer |
| EP81107369A EP0049400B1 (en) | 1980-09-22 | 1981-09-17 | Method of smoothing an insulating layer formed on a semiconductor body |
| DE8181107369T DE3164742D1 (en) | 1980-09-22 | 1981-09-17 | Method of smoothing an insulating layer formed on a semiconductor body |
| US06/304,677 US4377438A (en) | 1980-09-22 | 1981-09-22 | Method for producing semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55150179A JPS5773940A (en) | 1980-10-28 | 1980-10-28 | Levelling method of insulation layer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5773940A true JPS5773940A (en) | 1982-05-08 |
Family
ID=15491225
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55150179A Pending JPS5773940A (en) | 1980-09-22 | 1980-10-28 | Levelling method of insulation layer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5773940A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59191354A (en) * | 1983-04-14 | 1984-10-30 | Nec Corp | Manufacture of semiconductor device |
| JPS6110240A (en) * | 1984-06-20 | 1986-01-17 | Yokogawa Hewlett Packard Ltd | Manufacture of semiconductor element |
| US4587549A (en) * | 1982-06-04 | 1986-05-06 | Tokyo Shibaura Denki Kabushiki Kaisha | Multilayer interconnection structure for semiconductor device |
-
1980
- 1980-10-28 JP JP55150179A patent/JPS5773940A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4587549A (en) * | 1982-06-04 | 1986-05-06 | Tokyo Shibaura Denki Kabushiki Kaisha | Multilayer interconnection structure for semiconductor device |
| JPS59191354A (en) * | 1983-04-14 | 1984-10-30 | Nec Corp | Manufacture of semiconductor device |
| JPS6110240A (en) * | 1984-06-20 | 1986-01-17 | Yokogawa Hewlett Packard Ltd | Manufacture of semiconductor element |
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