JPS5776445A - Method for analysis of reducing condition of oxide - Google Patents

Method for analysis of reducing condition of oxide

Info

Publication number
JPS5776445A
JPS5776445A JP55152177A JP15217780A JPS5776445A JP S5776445 A JPS5776445 A JP S5776445A JP 55152177 A JP55152177 A JP 55152177A JP 15217780 A JP15217780 A JP 15217780A JP S5776445 A JPS5776445 A JP S5776445A
Authority
JP
Japan
Prior art keywords
oxide
scanning
section
cross
gamma ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55152177A
Other languages
English (en)
Inventor
Isamu Taguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP55152177A priority Critical patent/JPS5776445A/ja
Publication of JPS5776445A publication Critical patent/JPS5776445A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Blast Furnaces (AREA)
JP55152177A 1980-10-31 1980-10-31 Method for analysis of reducing condition of oxide Pending JPS5776445A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55152177A JPS5776445A (en) 1980-10-31 1980-10-31 Method for analysis of reducing condition of oxide

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55152177A JPS5776445A (en) 1980-10-31 1980-10-31 Method for analysis of reducing condition of oxide

Publications (1)

Publication Number Publication Date
JPS5776445A true JPS5776445A (en) 1982-05-13

Family

ID=15534725

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55152177A Pending JPS5776445A (en) 1980-10-31 1980-10-31 Method for analysis of reducing condition of oxide

Country Status (1)

Country Link
JP (1) JPS5776445A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002139461A (ja) * 2000-11-06 2002-05-17 Murata Mfg Co Ltd Ｘ線透視検査装置の高温観察炉
CN104698014A (zh) * 2015-02-12 2015-06-10 重庆旗能电铝有限公司 锅炉过热器、再热器弯头部位氧化物γ射线检测方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52155086A (en) * 1976-06-18 1977-12-23 Hitachi Ltd Tomographic apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52155086A (en) * 1976-06-18 1977-12-23 Hitachi Ltd Tomographic apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002139461A (ja) * 2000-11-06 2002-05-17 Murata Mfg Co Ltd Ｘ線透視検査装置の高温観察炉
CN104698014A (zh) * 2015-02-12 2015-06-10 重庆旗能电铝有限公司 锅炉过热器、再热器弯头部位氧化物γ射线检测方法

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