JPS5776546A - Transfer mask for x-ray exposure - Google Patents

Transfer mask for x-ray exposure

Info

Publication number
JPS5776546A
JPS5776546A JP15260480A JP15260480A JPS5776546A JP S5776546 A JPS5776546 A JP S5776546A JP 15260480 A JP15260480 A JP 15260480A JP 15260480 A JP15260480 A JP 15260480A JP S5776546 A JPS5776546 A JP S5776546A
Authority
JP
Japan
Prior art keywords
film
pattern
deposited
mask
silicon nitride
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15260480A
Other languages
English (en)
Inventor
Yasuo Iida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP15260480A priority Critical patent/JPS5776546A/ja
Publication of JPS5776546A publication Critical patent/JPS5776546A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/22Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP15260480A 1980-10-30 1980-10-30 Transfer mask for x-ray exposure Pending JPS5776546A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15260480A JPS5776546A (en) 1980-10-30 1980-10-30 Transfer mask for x-ray exposure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15260480A JPS5776546A (en) 1980-10-30 1980-10-30 Transfer mask for x-ray exposure

Publications (1)

Publication Number Publication Date
JPS5776546A true JPS5776546A (en) 1982-05-13

Family

ID=15544030

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15260480A Pending JPS5776546A (en) 1980-10-30 1980-10-30 Transfer mask for x-ray exposure

Country Status (1)

Country Link
JP (1) JPS5776546A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60132323A (ja) * 1983-12-21 1985-07-15 Hitachi Ltd X線露光用マスクの製造方法
JPS63200530A (ja) * 1987-02-17 1988-08-18 Matsushita Electronics Corp X線マスクの製造方法
US20210397081A1 (en) * 2020-06-22 2021-12-23 Tongji University Method for manufacturing grating reference materials having a self-traceability

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53134367A (en) * 1977-04-28 1978-11-22 Toppan Printing Co Ltd Xxray mask

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53134367A (en) * 1977-04-28 1978-11-22 Toppan Printing Co Ltd Xxray mask

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60132323A (ja) * 1983-12-21 1985-07-15 Hitachi Ltd X線露光用マスクの製造方法
JPS63200530A (ja) * 1987-02-17 1988-08-18 Matsushita Electronics Corp X線マスクの製造方法
US20210397081A1 (en) * 2020-06-22 2021-12-23 Tongji University Method for manufacturing grating reference materials having a self-traceability

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