JPS58116743A - ボンディング検査装置 - Google Patents
ボンディング検査装置Info
- Publication number
- JPS58116743A JPS58116743A JP56212446A JP21244681A JPS58116743A JP S58116743 A JPS58116743 A JP S58116743A JP 56212446 A JP56212446 A JP 56212446A JP 21244681 A JP21244681 A JP 21244681A JP S58116743 A JPS58116743 A JP S58116743A
- Authority
- JP
- Japan
- Prior art keywords
- photocurrent
- modulated light
- lead
- semiconductor
- bonding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
- H10W70/682—Shapes or dispositions thereof comprising holes having chips therein
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07531—Techniques
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07541—Controlling the environment, e.g. atmosphere composition or temperature
- H10W72/07551—Controlling the environment, e.g. atmosphere composition or temperature characterised by changes in properties of the bond wires during the connecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/59—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/753—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between laterally-adjacent chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Wire Bonding (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56212446A JPS58116743A (ja) | 1981-12-25 | 1981-12-25 | ボンディング検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56212446A JPS58116743A (ja) | 1981-12-25 | 1981-12-25 | ボンディング検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58116743A true JPS58116743A (ja) | 1983-07-12 |
| JPS6347261B2 JPS6347261B2 (2) | 1988-09-21 |
Family
ID=16622743
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56212446A Granted JPS58116743A (ja) | 1981-12-25 | 1981-12-25 | ボンディング検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58116743A (2) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63175439A (ja) * | 1987-01-16 | 1988-07-19 | Toshiba Corp | 半導体装置の製造方法 |
-
1981
- 1981-12-25 JP JP56212446A patent/JPS58116743A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63175439A (ja) * | 1987-01-16 | 1988-07-19 | Toshiba Corp | 半導体装置の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6347261B2 (2) | 1988-09-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6570390B2 (en) | Method for measuring surface leakage current of sample | |
| CN101354366B (zh) | 故障解析方法及故障解析装置 | |
| US6395580B1 (en) | Backside failure analysis for BGA package | |
| JPH04139850A (ja) | 半導体集積回路装置及びその検査方法 | |
| JP3424489B2 (ja) | 半導体過電流検知回路とその検査方法 | |
| JPS59134841A (ja) | 電子部品へのボンデイングのためのオン・ライン検査方法およびシステム | |
| JPS58116743A (ja) | ボンディング検査装置 | |
| US7931849B2 (en) | Non-destructive laser optical integrated circuit package marking | |
| US8907691B2 (en) | Integrated circuit thermally induced noise analysis | |
| US4661771A (en) | Method of screening resin-sealed semiconductor devices | |
| JP2004327858A (ja) | 半導体装置の検査方法および検査装置 | |
| JP2009115461A (ja) | 半導体素子解析方法 | |
| JPH07167924A (ja) | 半導体集積回路内部相互配線の検査装置 | |
| JP4599776B2 (ja) | ワイヤボンディング評価方法とそれに用いる評価用治具 | |
| US20020125473A1 (en) | Semiconductor device and method of analyzing same | |
| US6028434A (en) | Method and apparatus for detecting emitted radiation from interrupted electrons | |
| JPH04312942A (ja) | Obic電流検出方法 | |
| JP2814953B2 (ja) | 故障モードの特定方法 | |
| JP2589876B2 (ja) | 半導体集積回路装置 | |
| KR100548002B1 (ko) | 와이어 본딩 모니터링 시스템을 이용한 자재 오염 검출방법 | |
| JPH10107109A (ja) | 半導体素子及びその評価方法 | |
| JPS59184540A (ja) | パツシベ−シヨン膜の欠陥検査方法 | |
| Ahmad et al. | Identification Of Recovering Idss Failure Mode Via Novel Comprehensive Failure Analysis Technique For Mosfet Device | |
| JP2021118191A (ja) | 半導体装置、半導体装置の検査方法、半導体装置の製造方法および検査装置 | |
| SU1493428A1 (ru) | Способ контрол качества микросварных соединений в процессе контактной сварки |