JPS5816553U - Ｘ線小角散乱測定装置用試料加熱装置 - Google Patents

Ｘ線小角散乱測定装置用試料加熱装置

Info

Publication number: JPS5816553U
Authority: JP; Japan
Prior art keywords: scattering measurement; angle scattering; heating device; sample heating; measurement device
Prior art date: 1981-07-24
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

JP11057581U

Other languages

English (en)

Japanese (ja)

Other versions

JPH0323563Y2 (2

Inventor

繁宗川

Original Assignee

理学電機株式会社

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1981-07-24

Filing date

1981-07-24

Publication date

1983-02-01

1981-07-24 Application filed by 理学電機株式会社 filed Critical 理学電機株式会社

1981-07-24 Priority to JP11057581U priority Critical patent/JPS5816553U/ja

1983-02-01 Publication of JPS5816553U publication Critical patent/JPS5816553U/ja

1991-05-22 Application granted granted Critical

1991-05-22 Publication of JPH0323563Y2 publication Critical patent/JPH0323563Y2/ja

Status Granted legal-status Critical Current

Links

238000010438 heat treatment Methods 0.000 title claims description 4
238000005259 measurement Methods 0.000 title claims 3
125000006850 spacer group Chemical group 0.000 claims description 2
238000010586 diagram Methods 0.000 description 1
230000003287 optical effect Effects 0.000 description 1

Landscapes

Analysing Materials By The Use Of Radiation (AREA)

JP11057581U 1981-07-24 1981-07-24 Ｘ線小角散乱測定装置用試料加熱装置 Granted JPS5816553U (ja)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP11057581U JPS5816553U (ja)	1981-07-24	1981-07-24	Ｘ線小角散乱測定装置用試料加熱装置

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP11057581U JPS5816553U (ja)	1981-07-24	1981-07-24	Ｘ線小角散乱測定装置用試料加熱装置

Publications (2)

Publication Number	Publication Date
JPS5816553U true JPS5816553U (ja)	1983-02-01
JPH0323563Y2 JPH0323563Y2 (2)	1991-05-22

Family

ID=29904941

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP11057581U Granted JPS5816553U (ja)	1981-07-24	1981-07-24	Ｘ線小角散乱測定装置用試料加熱装置

Country Status (1)

Country	Link
JP (1)	JPS5816553U (2)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS63125188A (ja) *	1986-11-10	1988-05-28	千代田化工建設株式会社	純水タンクのシ−ル装置
JPS63293452A (ja) *	1987-05-27	1988-11-30	Rigaku Denki Kk	Ｘ線回折試料加熱装置
JPH02110853U (2) *	1989-02-23	1990-09-05
JP2008542751A (ja) *	2005-05-31	2008-11-27	オスミック、インコーポレイテッド	２次元小角ｘ線散乱カメラ
JP2018013485A (ja) *	2016-07-20	2018-01-25	マルバーンパナリティカルビーヴィ	Ｘ線分析のためのサンプルホルダ

Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS484530U (2) *	1971-06-15	1973-01-19

1981
- 1981-07-24 JP JP11057581U patent/JPS5816553U/ja active Granted

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS484530U (2) *	1971-06-15	1973-01-19

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS63125188A (ja) *	1986-11-10	1988-05-28	千代田化工建設株式会社	純水タンクのシ−ル装置
JPS63293452A (ja) *	1987-05-27	1988-11-30	Rigaku Denki Kk	Ｘ線回折試料加熱装置
JPH02110853U (2) *	1989-02-23	1990-09-05
JP2008542751A (ja) *	2005-05-31	2008-11-27	オスミック、インコーポレイテッド	２次元小角ｘ線散乱カメラ
JP2018013485A (ja) *	2016-07-20	2018-01-25	マルバーンパナリティカルビーヴィ	Ｘ線分析のためのサンプルホルダ

Also Published As

Publication number	Publication date
JPH0323563Y2 (2)	1991-05-22

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