JPS58172562A - プリント基板検査装置 - Google Patents

プリント基板検査装置

Info

Publication number
JPS58172562A
JPS58172562A JP57055365A JP5536582A JPS58172562A JP S58172562 A JPS58172562 A JP S58172562A JP 57055365 A JP57055365 A JP 57055365A JP 5536582 A JP5536582 A JP 5536582A JP S58172562 A JPS58172562 A JP S58172562A
Authority
JP
Japan
Prior art keywords
board
output
inspected
information
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57055365A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0257676B2 (2
Inventor
Yoshio Ooyama
義男 大山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Automob Antipollut & Saf Res Center
Automobile Appliance Anti Pollution and Safety Research Center
Astemo Ltd
Original Assignee
Automob Antipollut & Saf Res Center
Hitachi Automotive Engineering Co Ltd
Automobile Appliance Anti Pollution and Safety Research Center
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Automob Antipollut & Saf Res Center, Hitachi Automotive Engineering Co Ltd, Automobile Appliance Anti Pollution and Safety Research Center filed Critical Automob Antipollut & Saf Res Center
Priority to JP57055365A priority Critical patent/JPS58172562A/ja
Publication of JPS58172562A publication Critical patent/JPS58172562A/ja
Publication of JPH0257676B2 publication Critical patent/JPH0257676B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57055365A 1982-04-05 1982-04-05 プリント基板検査装置 Granted JPS58172562A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57055365A JPS58172562A (ja) 1982-04-05 1982-04-05 プリント基板検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57055365A JPS58172562A (ja) 1982-04-05 1982-04-05 プリント基板検査装置

Publications (2)

Publication Number Publication Date
JPS58172562A true JPS58172562A (ja) 1983-10-11
JPH0257676B2 JPH0257676B2 (2) 1990-12-05

Family

ID=12996456

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57055365A Granted JPS58172562A (ja) 1982-04-05 1982-04-05 プリント基板検査装置

Country Status (1)

Country Link
JP (1) JPS58172562A (2)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60148136A (ja) * 1984-01-12 1985-08-05 Toshiba Corp 半導体試験装置
JPH01292270A (ja) * 1988-05-19 1989-11-24 Tokyo Electron Ltd プローブ装置
US4965515A (en) * 1986-10-15 1990-10-23 Tokyo Electron Limited Apparatus and method of testing a semiconductor wafer
US4967143A (en) * 1986-09-09 1990-10-30 Fiat Auto S.P.A. System for diagnosing anomalies or breakdowns in a plurality of types of electronic control systems installed in motor vehicles
US5086270A (en) * 1988-07-08 1992-02-04 Tokyo Electron Limited Probe apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60148136A (ja) * 1984-01-12 1985-08-05 Toshiba Corp 半導体試験装置
US4967143A (en) * 1986-09-09 1990-10-30 Fiat Auto S.P.A. System for diagnosing anomalies or breakdowns in a plurality of types of electronic control systems installed in motor vehicles
US4965515A (en) * 1986-10-15 1990-10-23 Tokyo Electron Limited Apparatus and method of testing a semiconductor wafer
JPH01292270A (ja) * 1988-05-19 1989-11-24 Tokyo Electron Ltd プローブ装置
US5086270A (en) * 1988-07-08 1992-02-04 Tokyo Electron Limited Probe apparatus

Also Published As

Publication number Publication date
JPH0257676B2 (2) 1990-12-05

Similar Documents

Publication Publication Date Title
JPS6256540B2 (2)
JP2002538465A (ja) 単一のテスターチャンネルを使用して複数のデバイスの同時テストを行うための分散型インターフェース
JPS6311634B2 (2)
US4926425A (en) System for testing digital circuits
US4335425A (en) Data processing apparatus having diagnosis function
US4847838A (en) Circuit for testing the bus structure of a printed wiring card
JPS58172562A (ja) プリント基板検査装置
US4703482A (en) Universal apparatus for detecting faults in microprocessor systems
JP3200565B2 (ja) マイクロプロセッサおよびその検査方法
US3814920A (en) Employing variable clock rate
CN111562998A (zh) 一种集成电路的内存诊断方法、诊断设备及存储介质
US6738940B1 (en) Integrated circuit including a test signal generator
JPS63502061A (ja) 制御装置の自動検査方法
JPH08136614A (ja) 回路試験装置
JP2009069036A (ja) プリント基板の不良解析システム
KR960010762B1 (ko) 가전기기의 버튼 동작 검사방법
JPS62206468A (ja) プローブポイント決定装置
JP3197523B2 (ja) 給湯機器の故障診断システム
JP2859065B2 (ja) プリンタインターフェース回路試験装置
JP2906417B2 (ja) マイクロコンピュータの試験方式
SU911531A1 (ru) Система дл контрол и диагностики цифровых узлов
JP2001208807A (ja) 複数のスロットを持つボードの検査方式
JP2002022806A (ja) 回路基板検査装置
JPH0755894A (ja) プリント回路板試験装置
JPH04128661A (ja) 線路ディレイ試験装置