JPS5832073A - sintered body - Google Patents
sintered bodyInfo
- Publication number
- JPS5832073A JPS5832073A JP56130291A JP13029181A JPS5832073A JP S5832073 A JPS5832073 A JP S5832073A JP 56130291 A JP56130291 A JP 56130291A JP 13029181 A JP13029181 A JP 13029181A JP S5832073 A JPS5832073 A JP S5832073A
- Authority
- JP
- Japan
- Prior art keywords
- sintered body
- aluminum nitride
- boron nitride
- room temperature
- powder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
本発明は高熱伝導率と電気絶縁性を併せ有する焼結体に
関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a sintered body having both high thermal conductivity and electrical insulation.
近年、半導体工業の進歩ば「1ざ捷しく、大規模集積回
路等に使用される絶縁基板は回路構成要素が高密度に形
成されるようになってきた。さらに最近では小型化に対
する要請も大きく、単位面積当りの発!$量が大幅に増
加してきた。一方では大型のシリコンチップが接着可能
な熱膨張係数がシリコンのそれに近い絶縁基板材料の開
発が望1れでいる。従来、絶縁基板材料としてアルミナ
の焼結体が使用された。しかし、アルミナ基板は熱放散
性が悪く、熱膨張係数が大きいため、はぼ限界に達した
。このため、熱放散性が良好で、しかも熱膨張係数がシ
リコンの値に近い新規な絶縁基板材料の開発が要請され
るようになってきた。In recent years, the semiconductor industry has progressed rapidly, with insulating substrates used for large-scale integrated circuits having circuit components formed in high density.Furthermore, there has been a growing demand for miniaturization. , the amount of energy generated per unit area has increased significantly.On the other hand, it is desirable to develop an insulating substrate material with a coefficient of thermal expansion close to that of silicon, to which large silicon chips can be bonded. An alumina sintered body was used as the material. However, the alumina substrate has poor heat dissipation properties and a large coefficient of thermal expansion, so it reached its limit. There is a growing demand for the development of new insulating substrate materials whose coefficients are close to those of silicon.
絶縁基板材料が具備すべき条件としては(1)電気絶縁
性が大きいこと。The conditions that the insulating substrate material must meet are (1) high electrical insulation;
(2)熱伝導率が大きいこと。(2) High thermal conductivity.
(3)熱膨張係数がシリコンに近いこと。(3) The coefficient of thermal expansion is close to that of silicon.
(4)機械的強度が大きいこと。(4) High mechanical strength.
等が挙げられる。etc.
ところで、窒化アルミニウムはその熱膨張係数が約5X
10−’/℃でアルミナ焼結体のそれの約7 X 1
o= 7℃に比べて小さく、シリコンの熱膨張係数組3
.3 x i 0−67 ℃に近い。寸だ、機械的強度
も曲げ強さで約50kg/cm2を有し、アルミナ焼結
体の約20kg/Cm2に比べ高強度であることが知ら
れている。さらに都゛気絶縁性にも優れた材料である。By the way, aluminum nitride has a coefficient of thermal expansion of approximately 5X.
Approximately 7 x 1 of that of the alumina sintered body at 10-'/°C
It is smaller than o = 7℃, and the thermal expansion coefficient of silicon is set 3.
.. Close to 3 x i 0-67 °C. It is also known that the mechanical strength is approximately 50 kg/cm2 in terms of bending strength, which is higher than the approximately 20 kg/cm2 of alumina sintered body. Furthermore, it is a material with excellent air insulation properties.
従来公知である窒化アルミニウム焼結体の製造方法には
反応焼結法、常圧焼結法、ホットプレス焼結法がある。Conventionally known methods for producing aluminum nitride sintered bodies include a reaction sintering method, an atmospheric pressure sintering method, and a hot press sintering method.
このうち、反応焼結法は金属アルミニウムの成形体を窒
素ガス雰囲気中で窒化反応させながら焼結する方法であ
る。反応焼結法では窒化反応が窒素ガスの拡散律速であ
ることから肉厚の製品の場合、中心部に未反応金属が残
ることと、多孔質であるため、電気絶縁材としては使用
できない。常圧焼結法では窒化アルミニウム粉末に酸化
イツトリウムと希土類酸化物、酸化イットリウノ・と二
酸化ケイ素、ニッケル、酸化カルンウノ、などの粉末を
添加して混合したのち成形体としプレス焼結法では窒化
アルミニウノ、粉本に酸化アルミニウム、酸化イノトリ
ウノ、と二酸化ケイ素などの粉末を添加して混合し7/
このち成形体とし、加圧下で加熱して焼結体を得る。従
来公知である常圧焼結法及びホットプレス焼結法によノ
′1ば緻密化した窒化アルミニウノ、焼結体をイ(Iる
ことかでき、焼結体は高強度で、電気絶縁+1及び低→
)(膨張係数を有する。しかし、上記の方法で製造した
焼結体の熱伝導率は小さく、通常007cン1 l/C
1’l! @ S・℃(室温)であり、大きいものでも
0.1 c、 ;l 1!−7(゛(口・S・℃である
。これらの点から、窒化アルミニウム焼結体は」:り高
熱伝導路を・有するものが開発されると、大規模集積回
路などの絶縁基板イ」別として極めて有用である。Among these, the reactive sintering method is a method in which a molded body of metal aluminum is sintered while undergoing a nitriding reaction in a nitrogen gas atmosphere. In the reactive sintering method, the nitriding reaction is rate-limited by the diffusion of nitrogen gas, so if the product is thick, unreacted metal remains in the center, and the product is porous, so it cannot be used as an electrical insulator. In the pressureless sintering method, powders such as yttrium oxide, rare earth oxides, yttrium oxide, silicon dioxide, nickel, and calunium oxide are added to aluminum nitride powder and mixed, and then a molded body is formed.In the press sintering method, aluminum nitride, Add powders such as aluminum oxide, inotriuno oxide, and silicon dioxide to the powder and mix.7/
Thereafter, the molded body is formed and heated under pressure to obtain a sintered body. By using the conventional pressureless sintering method and hot press sintering method, it is possible to produce a sintered body made of densified aluminum nitride, which has high strength and electrical insulation +1. and low →
) (has an expansion coefficient. However, the thermal conductivity of the sintered body produced by the above method is small, and is usually 0.07 cm/1 l/C.
1'l! @S・℃ (room temperature), even the largest ones are 0.1 c, ;l 1! -7 (゛(口・S・℃) From these points, aluminum nitride sintered bodies will be used as insulating substrates for large-scale integrated circuits, etc., if those with high thermal conductivity paths are developed. Apart from that, it is extremely useful.
本発明の]]的は熱伝導率が大きく、電気絶縁用基板何
科として好適な性能を有する材$□1及びその製造方法
を提供するにある。The object of the present invention is to provide a material having high thermal conductivity and suitable performance as an electrically insulating substrate, and a method for manufacturing the same.
本発明は窒化ホウ素を0.05〜30重Id係添加して
成る窒化アルミニウノ、の焼結体にある。該焼結体にJ
、室温に;j、・ける熱伝導率が0.3 chz、7c
m−s −’CI7. l−で、室温における電気抵抗
率が10′2ΩC1n以上で、室部から300℃におけ
る平均熱膨張係数が6X10−’/℃以下で、窒化アル
ミニウムの理論密度の90チ以十の密度を有する。The present invention resides in a sintered body of aluminum nitride which is doped with boron nitride in an Id ratio of 0.05 to 30. J to the sintered body
, the thermal conductivity at room temperature is 0.3 chz, 7c
m-s-'CI7. 1-, the electrical resistivity at room temperature is 10'2 ΩC1n or more, the average thermal expansion coefficient at 300°C from the chamber is 6×10-'/°C or less, and the density is 90 cm or more, which is the theoretical density of aluminum nitride.
また、本発明は・(l jり粒径が2 Q /(nl以
下である窒化アルミニウム粉末に、平均粒径が5 Q
lt m以下である窒化ホウ素粉末を0.05〜3o@
量係添加して混合(7た粉末を成形体となし、非酸化性
雰囲気中で1600〜2000℃の温度で常圧焼結する
か、1. (i 00〜2000℃の温度と1. OO
kg/ cm2以上の加圧下でホットプレスして窒化ア
ルミニウノ・の理論密度の90係以上の密度を得るに七
分な時間焼結して成る高熱伝導で電気絶縁性の優れた窒
化アルミニウム焼結体の製造方法にある。In addition, the present invention provides aluminum nitride powder with an average particle size of 5 Q / (nl or less).
lt m or less boron nitride powder from 0.05 to 3 o@
The powder is mixed (7) into a compact and sintered under normal pressure at a temperature of 1,600 to 2,000°C in a non-oxidizing atmosphere, or 1.
Aluminum nitride sintered body with high thermal conductivity and excellent electrical insulation properties, which is hot-pressed under pressure of kg/cm2 or more and sintered for 7 minutes to obtain a density of 90 or more of the theoretical density of aluminum nitride Uno. It is in the manufacturing method.
本発明において窒化ホウ素の添加量を0.05〜30重
用係としたのは、0.05重@係より少ないと緻密な焼
結体が得られないためである。寸だ、30重′1ft%
よりも多いと焼結体は熱膨張係数が大きくなり、特にシ
リコン−゛1′導体素子用の絶縁基板として使用する場
合に間:tαになるためで2らる。The reason why the amount of boron nitride added is set to 0.05 to 30% in the present invention is that if it is less than 0.05%, a dense sintered body cannot be obtained. It's 30 weight'1ft%
If the amount is more than 2, the coefficient of thermal expansion of the sintered body becomes large, and especially when used as an insulating substrate for a silicon-1 conductor element, the distance tα becomes 2.
捷だ、本発明において壁化アルミニウム粉末d:平均粒
径が20μm以下、91寸しく何1. Otr…以下の
粒径を有する粉末を使用する。In the present invention, the walled aluminum powder d: average particle size is 20 μm or less, 91 mm, and 1. Otr...Use a powder having the following particle size.
窒化ホウ素を添加混合した窒化アルミニウム粉末成形体
の焼成条件も重要である。焼成は非酸化性の雰囲気中で
行う。酸化性の’r?囲気中で焼成すると窒化アルミニ
ウムが酸化してし甘い所望の焼結体をイnることかでき
ない。The firing conditions for the aluminum nitride powder compact containing boron nitride are also important. Firing is performed in a non-oxidizing atmosphere. Oxidizing 'r? If fired in an ambient atmosphere, the aluminum nitride will oxidize, making it impossible to form the desired sintered body.
焼成時の温度は1600〜2000℃、好斗しく1は1
700〜1900℃が有効である。温度が1ri00℃
より低い場合は緻密な焼結体が(4Jられす、2000
℃より高い場合は過焼成になってしJ−うほか、!14
別な効果は得られない。寸だ、焼成は常圧焼結法でも良
いし、ホットプレス法に、1:っても良い。もし、−軸
加圧式のホットプレス法で焼結体を製造する場合、収縮
は加圧軸方向にしか起らず、寸法精度が高く、高強度を
有する焼結体を14jることかでき、この場合、1.0
0 k g/ cm2以上の荷重を加えることが必要で
ある。丑だ、焼成時間に関して(1使用する原料粉末の
粒径、窒化ホウ素の添加ffl、17171度、焼成時
に加える荷重の有無及びその大きさにより最適植が決る
。一般的には原料粉末の粒径が小さく、湯度が高く、焼
成+17i i/(:荷重を加えた場合、特に加える荷
重が大きいほど短i寺間で緻密なへ11:結体を子!す
ることができる。The temperature during firing is 1600-2000℃, 1 is 1
A temperature of 700 to 1900°C is effective. Temperature is 1ri00℃
If the temperature is lower than that, a dense sintered body (4J Lesu, 2000
If it is higher than ℃, over-firing will occur. 14
No other effect can be obtained. The firing may be performed by normal pressure sintering or by hot pressing. If a sintered body is manufactured using a hot pressing method using -axis pressure, shrinkage will occur only in the axial direction of the press, making it possible to produce a sintered body with high dimensional accuracy and high strength. In this case, 1.0
It is necessary to apply a load of 0 kg/cm2 or more. Regarding the firing time (1) The optimum firing time is determined by the particle size of the raw material powder used, the addition of boron nitride ffl, 17171 degrees, and the presence or absence of load applied during firing and its size.In general, the particle size of the raw material powder When the temperature is small, the hot water temperature is high, and a load is applied during firing, the larger the applied load, the more dense the structure can be.
次に実施例を示しJL体的に、fl2明する。Next, an example will be shown and explained in JL format.
実施例1
平均粒径が2μm11の窒化アルミニウム粉末に平均粒
径が17+mの大方品系の結晶形を有する窒化ホウ素粉
末を0.03〜50市吊係添加し混合した。Example 1 Boron nitride powder having an average particle size of 17+m and having a crystalline form of the Oriental type was added to aluminum nitride powder with an average particle size of 2 μm11 in an amount of 0.03 to 50 μm and mixed.
次いで、該混合粉末を室温で]、QQOkg/cm2の
IF力を加えて成形体とした。該成形体C2次に焼成炉
中で減圧度lXl0=〜IX]、0−’!。rlの真空
中で曽:成した。加熱は室温から1800℃捷で約11
1でy1温し、1800℃で0.511保1.5シたの
ち放冷した。十記によって製箔した窒化アルミニウム焼
結体の特性を第1表に示す。Then, an IF force of QQO kg/cm2 was applied to the mixed powder at room temperature to form a compact. The molded body C2 is then placed in a firing furnace at a reduced pressure lXl0=~IX], 0-'! . Zeng: was completed in the vacuum of RL. Heating is about 11 degrees from room temperature to 1800℃.
The sample was heated to y1 at 1,800°C for 1.5 hours at 0.511, and then allowed to cool. Table 1 shows the properties of the aluminum nitride sintered body produced by the method described in Table 1.
第1表
この結果より、窒化アルミ−ラムに添加する窒化ホウ素
の量が0.1〜30重量係重量へ、焼結体は相対密度が
90係以−]ム室温に′13・ける熱伝導率がQ、 2
ca、4/cm、 S 、 ’C以上、雷気M抗率が
101−2Q C1n以−に、熱膨張係数が6 X 1
0−”7℃以下を有することがわかる。Table 1 From the results, it can be seen that the amount of boron nitride added to the aluminum nitride lamb is 0.1 to 30% by weight, and the relative density of the sintered body is 90% or more for thermal conductivity at room temperature. The rate is Q, 2
ca, 4/cm, S, 'C or higher, lightning M resistivity is 101-2Q C1n or higher, thermal expansion coefficient is 6 x 1
It can be seen that the temperature is 0-7°C or less.
実施例2
実施例1に記載したものと同じ窒化アルミニウム粉末と
窒化ホウ素粉末を用い、窒化ホウ素の添力[目i−を3
重量係として混合し、成形体を得た。該成形体は真空中
で焼成条件を変えて焼結体とした。Example 2 The same aluminum nitride powder and boron nitride powder as those described in Example 1 were used, and the boron nitride addition [I-3] was used.
The mixture was mixed by weight to obtain a molded body. The molded body was made into a sintered body by changing the firing conditions in a vacuum.
第2表は焼結体の製造条件と得らi″Lだ焼結体の相7
J密度の関係を示す表である。Table 2 shows the manufacturing conditions of the sintered body and the phase 7 of the obtained sintered body.
It is a table showing the relationship between J density.
第2表
焼結体は相対密度が90%以上に緻密化した場合、室温
における熱伝導率が0.2 c r+ l−7cm *
s・℃以上、電気抵抗率がto12ΩCIll以1−
1熱膨張係数が6xlO−67℃以下を有した。When the sintered body in Table 2 is densified to a relative density of 90% or more, the thermal conductivity at room temperature is 0.2 cr + l-7 cm *
s・℃ or more, electrical resistivity is to12ΩCIll or more 1-
1 had a coefficient of thermal expansion of 6xlO-67°C or less.
実施例3
実施例2に記載したものと同じ様にして窒化アルミニウ
ムの成形体をイ!また。該焼結体は実施例1に記載した
ものと同様にして焼結体をイ(Iた。実施例3に於ては
焼結体の製造117#の雰囲気をアルゴンガス、ヘリウ
ムガス、窒素ガス、水素ガスとした。Example 3 An aluminum nitride molded body was prepared in the same manner as described in Example 2. Also. The sintered body was prepared in the same manner as described in Example 1. In Example 3, the atmosphere of the sintered body 117# was changed to argon gas, helium gas, or nitrogen gas. , hydrogen gas.
得られた焼結体はいずれも実施例1に記載した焼結体の
うち窒化ホウ素の添加1仕が3重量係のものと同様の特
性を有した。All of the obtained sintered bodies had characteristics similar to those of the sintered bodies described in Example 1, in which one amount of boron nitride was added by three weights.
実施例4
実施例1と同じ様にして窒化アルミニウムに対して平均
粒径が11tmである立方晶系の結晶形を有する窒化ホ
ウ素粉末を加え成形体をflまた3、該成形体は実施例
1と同様にして焼結体をイkIだ。該焼結体は窒化ホウ
素の添加部が同一の場合、立方晶□ 系の窒化ホウ素粉
末を用いたときの方が熱伝導率(10)
の値が実施例1に記載したものより大きいほか、他の特
性は同様であった。Example 4 In the same manner as in Example 1, boron nitride powder having a cubic crystal form with an average particle size of 11 tm was added to aluminum nitride to form a compact. Prepare the sintered body in the same manner as above. When the sintered body has the same amount of boron nitride added, the value of thermal conductivity (10) is higher when cubic □ system boron nitride powder is used than that described in Example 1. Other characteristics were similar.
実施例5
平均粒径の異なる窒化アルミニウム粉末に大方晶系の窒
化ホウ素を3重量%添加し、実施例1と同様にして焼結
体を得た。第3表は得られた焼結体の相対密度で窒化ア
ルミニウムの平均粒径が20μm以下のとき相対密度が
90%以上である焼結体が得られる。Example 5 A sintered body was obtained in the same manner as in Example 1 except that 3% by weight of orthogonal boron nitride was added to aluminum nitride powders having different average particle sizes. Table 3 shows the relative density of the obtained sintered body, and when the average grain size of aluminum nitride is 20 μm or less, a sintered body with a relative density of 90% or more can be obtained.
第3表
この焼結体はいずれも実施例1に記載した窒化(11)
ホウ素の添加量が3重年係の場合とほぼ同様の特性を有
した。Table 3 These sintered bodies had almost the same characteristics as those described in Example 1 when the amount of boron nitride (11) added was 3 years.
実施例6
本発明になる電気絶縁基板の具体的な鏑/−11例とし
て、実施例1で得た窒化ホウ素の添加量が3重量係の窒
化アルミナ基板、焼結体を絶縁基板として用いた半導体
パワーモジュールにより説明する。Example 6 As a specific example of the electrically insulating substrate of the present invention, the alumina nitride substrate and sintered body obtained in Example 1 with an added amount of boron nitride of 3% by weight was used as the insulating substrate. This will be explained using a semiconductor power module.
第1図は従来構造の組立断面図である。導体4とヒート
シンク6及びヒートシンク6と金属支持板8の間を有機
絶縁物5及びアルミナ基板7で絶縁し、捷た、シリコン
素子1とヒートシンク6との熱膨張係数の差によるひず
みを緩和するためにモリブデンスペーザ−3を介在させ
である。第2図は本発明になる絶縁基板を用いたモジュ
ールの組立断面図である。絶縁基板15はシリコン素子
11と直接ろう付けされており、極めて簡単な構造にな
っている。FIG. 1 is an assembled sectional view of a conventional structure. The conductor 4 and the heat sink 6 and the heat sink 6 and the metal support plate 8 are insulated by the organic insulator 5 and the alumina substrate 7 to alleviate strain caused by the difference in thermal expansion coefficient between the silicon element 1 and the heat sink 6. A molybdenum spacer 3 was interposed therein. FIG. 2 is an assembled sectional view of a module using an insulating substrate according to the present invention. The insulating substrate 15 is directly brazed to the silicon element 11, and has an extremely simple structure.
上記半導体装置を一60℃で30分保持したのち室温で
5分保持し、さらに125℃に昇温して30分保持する
ヒートサイクルを加えた。従来法(12)
になる半導体装置(第1図)は20回のヒートサイクル
で半田付箇所にはがれが生じた。本発明になる半導体装
置(第2図)は150回のヒートサイクルの後でも異常
が認められなかった。The semiconductor device was held at −60° C. for 30 minutes, then held at room temperature for 5 minutes, and then subjected to a heat cycle in which the temperature was raised to 125° C. and held for 30 minutes. The semiconductor device (FIG. 1) using the conventional method (12) suffered from peeling at the soldered area after 20 heat cycles. No abnormality was observed in the semiconductor device according to the present invention (FIG. 2) even after 150 heat cycles.
比較例
平均粒径が’11tmの窒化アルミニウム粉末に酸化イ
ツトリウムを10重重量部加して混合したのち成形体と
した。該成形体はI X 10−” orrの真空中で
温度1800℃、荷重300 kg 7cm2 、時間
0.5 hホットプレスして焼結体とした。該焼結体は
相対密度99係に緻密化した。該焼結体のその他の特性
は熱伝導率が0107Cat/Cm−5・℃(室温)、
電気抵抗率が10”Ωcm(室温)、熱膨張係数が5
x 10−”7℃(室温〜300℃)であった。Comparative Example 10 parts by weight of yttrium oxide was added to aluminum nitride powder having an average particle size of 11 tm and mixed to form a compact. The compact was hot-pressed in a vacuum of I x 10-" orr at a temperature of 1800°C, a load of 300 kg 7 cm2, and a time of 0.5 h to form a sintered body. The sintered body was densified to a relative density of 99. Other properties of the sintered body include thermal conductivity of 0107Cat/Cm-5°C (room temperature);
Electrical resistivity is 10”Ωcm (room temperature), thermal expansion coefficient is 5
x 10-''7°C (room temperature to 300°C).
本発明になる窒化アルミニウム焼結体は緻密化しており
、高熱伝導率、高電気抵抗弁、低熱膨張係数を併せ有す
るという特徴を有する。従って、前述した通り電気絶縁
用基板材料として有用であるばかりでなく、すyに耐熱
、耐酸化性、耐薬品性 □(13)
が要求される部材、面j熱@撃性が要求される部材、高
温において高強度が要求される部材としても好適な材料
である。The aluminum nitride sintered body of the present invention is dense and has the characteristics of high thermal conductivity, high electrical resistance, and low coefficient of thermal expansion. Therefore, as mentioned above, it is not only useful as an electrically insulating substrate material, but also a member that requires heat resistance, oxidation resistance, and chemical resistance (13), and surface heat impact resistance. It is also a suitable material for parts that require high strength at high temperatures.
第1図は従来法によるシリコン半導体装置の組立図、第
2図は本発明になる基板を用いたシリコン半導体装置の
組立図である。
1.11・・・シリコン素子、2.12・・・リード線
、3・・・モリブデンスベーザー、4・、−・14・・
・導体、5・・・有機絶縁物、6・・・ヒート//り、
7・・・アルミナ基板、8・・・支持板、9,10.1
3・・・半田、15(14)FIG. 1 is an assembly diagram of a silicon semiconductor device according to a conventional method, and FIG. 2 is an assembly diagram of a silicon semiconductor device using a substrate according to the present invention. 1.11...Silicon element, 2.12...Lead wire, 3...Molybdenum baser, 4., -14...
・Conductor, 5...Organic insulator, 6...Heat//ri,
7... Alumina substrate, 8... Support plate, 9, 10.1
3...Solder, 15 (14)
Claims (1)
30重ffr%添加して成ることを特徴とする焼結体。 2 窒化アルミニウムの理論密度に対して90%以」−
の密度を有することを特徴とする特許請求の範囲m1項
記載の焼結体。 3、室温における熱伝導率が0,2 Cat/CmaS
・℃以上であることを特徴とする特許請求の範囲第1項
記載の焼結体。 4、室温における電気抵抗率が1013ΩCm以」−で
あることを特徴とする特許請求の範囲第1項記載の焼結
体。 5、窒化ホウ素は立方晶窒化ホウ素または六万品窒化ホ
ウ素であることを特徴とする特許請求の範囲第1項記載
の焼結体。[Claims] 1. Boron nitride is added from 0.1 to aluminum nitride.
A sintered body characterized by adding 30% by weight of ffr. 2 90% or more of the theoretical density of aluminum nitride
The sintered body according to claim m1, which has a density of . 3. Thermal conductivity at room temperature is 0.2 Cat/CmaS
- The sintered body according to claim 1, characterized in that the temperature is at least ℃. 4. The sintered body according to claim 1, which has an electrical resistivity of 10<13 >[Omega]Cm or more at room temperature. 5. The sintered body according to claim 1, wherein the boron nitride is cubic boron nitride or solid boron nitride.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56130291A JPS5832073A (en) | 1981-08-21 | 1981-08-21 | sintered body |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56130291A JPS5832073A (en) | 1981-08-21 | 1981-08-21 | sintered body |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5832073A true JPS5832073A (en) | 1983-02-24 |
Family
ID=15030797
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56130291A Pending JPS5832073A (en) | 1981-08-21 | 1981-08-21 | sintered body |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5832073A (en) |
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59131583A (en) * | 1982-12-24 | 1984-07-28 | ヴエ−・ツエ−・ヘレウス・ゲゼルシヤフト・ミツト・ベシユレンクタ−・ハフツング | Ceramic carrier |
| US4519966A (en) * | 1982-12-24 | 1985-05-28 | W. C. Heraeus Gmbh | Low-contamination AlN crucible for monocrystal pulling and method |
| US4533645A (en) * | 1983-08-01 | 1985-08-06 | General Electric Company | High thermal conductivity aluminum nitride ceramic body |
| US4537863A (en) * | 1983-08-10 | 1985-08-27 | Nippon Electric Glass Company, Ltd. | Low temperature sealing composition |
| JPS60195058A (en) * | 1984-03-15 | 1985-10-03 | 株式会社トクヤマ | Manufacture of aluminum nitride sintered body |
| US4547471A (en) * | 1983-11-18 | 1985-10-15 | General Electric Company | High thermal conductivity aluminum nitride ceramic body |
| US4585706A (en) * | 1981-04-30 | 1986-04-29 | Hitachi, Ltd. | Sintered aluminum nitride semi-conductor device |
| US4627815A (en) * | 1983-10-15 | 1986-12-09 | W.C. Heraeus Gmbh | Ceramic temperature stabilization body, and method of making same |
| US4642298A (en) * | 1984-03-15 | 1987-02-10 | Tokuyama Soda Kabushiki Kaisha | Composite nitride sintered body |
| JPS63260866A (en) * | 1987-04-20 | 1988-10-27 | 電気化学工業株式会社 | Composite sintered body and manufacture |
| JPH01131069A (en) * | 1987-11-14 | 1989-05-23 | Denki Kagaku Kogyo Kk | Complex compact calcined under ordinary pressure |
| JPH02252662A (en) * | 1989-03-27 | 1990-10-11 | Nippon Steel Corp | Boron nitride-aluminum nitride-based composite calcined compact and production thereof |
| JPH046162A (en) * | 1990-04-25 | 1992-01-10 | Nippon Steel Corp | Aln-bn-based composite sintered body and production thereof |
| JP2014007407A (en) * | 2012-06-25 | 2014-01-16 | Alstom Transport Sa | Electric circuit directly connectable to high voltage |
| CN105164085A (en) * | 2013-04-30 | 2015-12-16 | 六号元素有限公司 | Composite material, articles comprising same and method for making same |
| JP2024044502A (en) * | 2022-09-21 | 2024-04-02 | 株式会社トクヤマ | Aluminum nitride sintered substrate, its manufacturing method, and insulating substrate for electronic circuits |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53117386A (en) * | 1977-03-23 | 1978-10-13 | Sumitomo Electric Ind Ltd | Sindered body for heat and sink production of the same |
-
1981
- 1981-08-21 JP JP56130291A patent/JPS5832073A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53117386A (en) * | 1977-03-23 | 1978-10-13 | Sumitomo Electric Ind Ltd | Sindered body for heat and sink production of the same |
Cited By (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4585706A (en) * | 1981-04-30 | 1986-04-29 | Hitachi, Ltd. | Sintered aluminum nitride semi-conductor device |
| JPS59131583A (en) * | 1982-12-24 | 1984-07-28 | ヴエ−・ツエ−・ヘレウス・ゲゼルシヤフト・ミツト・ベシユレンクタ−・ハフツング | Ceramic carrier |
| US4519966A (en) * | 1982-12-24 | 1985-05-28 | W. C. Heraeus Gmbh | Low-contamination AlN crucible for monocrystal pulling and method |
| US4591537A (en) * | 1982-12-24 | 1986-05-27 | W. C. Heraeus Gmbh | Combination of AlN-Y2 O3 heat conductive ceramic substrate and electronic component |
| US4533645A (en) * | 1983-08-01 | 1985-08-06 | General Electric Company | High thermal conductivity aluminum nitride ceramic body |
| US4537863A (en) * | 1983-08-10 | 1985-08-27 | Nippon Electric Glass Company, Ltd. | Low temperature sealing composition |
| US4627815A (en) * | 1983-10-15 | 1986-12-09 | W.C. Heraeus Gmbh | Ceramic temperature stabilization body, and method of making same |
| US4547471A (en) * | 1983-11-18 | 1985-10-15 | General Electric Company | High thermal conductivity aluminum nitride ceramic body |
| JPS60195058A (en) * | 1984-03-15 | 1985-10-03 | 株式会社トクヤマ | Manufacture of aluminum nitride sintered body |
| US4642298A (en) * | 1984-03-15 | 1987-02-10 | Tokuyama Soda Kabushiki Kaisha | Composite nitride sintered body |
| JPS63260866A (en) * | 1987-04-20 | 1988-10-27 | 電気化学工業株式会社 | Composite sintered body and manufacture |
| JPH01131069A (en) * | 1987-11-14 | 1989-05-23 | Denki Kagaku Kogyo Kk | Complex compact calcined under ordinary pressure |
| JPH02252662A (en) * | 1989-03-27 | 1990-10-11 | Nippon Steel Corp | Boron nitride-aluminum nitride-based composite calcined compact and production thereof |
| JPH046162A (en) * | 1990-04-25 | 1992-01-10 | Nippon Steel Corp | Aln-bn-based composite sintered body and production thereof |
| JP2014007407A (en) * | 2012-06-25 | 2014-01-16 | Alstom Transport Sa | Electric circuit directly connectable to high voltage |
| CN105164085A (en) * | 2013-04-30 | 2015-12-16 | 六号元素有限公司 | Composite material, articles comprising same and method for making same |
| US20160068444A1 (en) * | 2013-04-30 | 2016-03-10 | Element Six Limited | Composite material, articles comprising same and method for making same |
| JP2016522142A (en) * | 2013-04-30 | 2016-07-28 | エレメント シックス リミテッド | COMPOSITE MATERIAL, ARTICLE CONTAINING THE SAME, AND METHOD FOR MAKING THE SAME |
| US10202308B2 (en) | 2013-04-30 | 2019-02-12 | Element Six Limited | Composite material, articles comprising same and method for making same |
| JP2024044502A (en) * | 2022-09-21 | 2024-04-02 | 株式会社トクヤマ | Aluminum nitride sintered substrate, its manufacturing method, and insulating substrate for electronic circuits |
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