JPS5832475A - Manufacture of amorphous silicon solar cell - Google Patents

Manufacture of amorphous silicon solar cell

Info

Publication number
JPS5832475A
JPS5832475A JP56130188A JP13018881A JPS5832475A JP S5832475 A JPS5832475 A JP S5832475A JP 56130188 A JP56130188 A JP 56130188A JP 13018881 A JP13018881 A JP 13018881A JP S5832475 A JPS5832475 A JP S5832475A
Authority
JP
Japan
Prior art keywords
amorphous silicon
semiconductor layer
silicon semiconductor
forming
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56130188A
Other languages
Japanese (ja)
Inventor
Tatsuo Oota
達男 太田
Masanari Shindo
新藤 昌成
Shigeru Sato
滋 佐藤
Isao Myokan
明官 功
Tetsuo Shima
徹男 嶋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
Original Assignee
Konica Minolta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Inc filed Critical Konica Minolta Inc
Priority to JP56130188A priority Critical patent/JPS5832475A/en
Publication of JPS5832475A publication Critical patent/JPS5832475A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/10Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material
    • H10F71/103Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material including only Group IV materials
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/0021Reactive sputtering or evaporation
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Photovoltaic Devices (AREA)

Abstract

PURPOSE:To form the amorphous silicon semiconductor layer and inverse side conductive region manufacturing solar cell with excellent characteristics by a method wherein the activated hydrogen gas is externally introduced into an evaporator to evaporate silicon impressing negative voltage on the substrate in the evaporator. CONSTITUTION:A vacuum pump is connected to the bell jar as an evaporator through exhaust channel 3 making inside atmosphere of the bell jar highly vacuum while the evaporated substrate 4 arranged inside the bell jar is heated up to specified temperature by means of the heater 5. Then the evaporator 4 is supplied with negaive bias voltage from the DC power supply 6. On the other hand, the hydrogen gas discharge tube 7 is arranged opposite to the evaporator 4 to introduce the activated hydrogen gas from the discharge tube 7 into the bell jar. Then the evaporated substrate 4 is evaporated with silicon, antimony etc. from the heated silicon evaporating agent 8 and antimony, platinum evaporating agents 9, 10 etc. while dangling bond is compensated or enclosed by hydrogen atom forming the excellent amorphous silicon semiconductor layer and the conductive region on the inverse side.

Description

【発明の詳細な説明】 本発明は、シリコン太陽電池の製造方法に関するもので
ある。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing silicon solar cells.

最近において、太陽電池は太陽光エネルギーを直接電気
エネルギーに変換し得るものとして注目を集めている。
Recently, solar cells have attracted attention as a device that can directly convert sunlight energy into electrical energy.

この太陽電池としては、種々の光起電力を生ずるものの
うち、大面積のものを容易に得ることかできて比較的大
きか効率が得られることから、アモルファスシリコン(
以下「1−シリコン」という。)半導体層を有するもの
が実際上鏝も有利とされている〇 従前におけるa−シリコンは、タイ素原子の結合手が未
結合のままのダングリングボンドが形成され、禁止帯中
に約10”/3”・・Vの局在状態が発生し、価電子制
御が困難で且つキャリア易動度が低く、太陽電池用半導
体材料として利用することはできな力・つた。
Among the various types of solar cells that generate photovoltaic power, amorphous silicon (
Hereinafter referred to as "1-silicon". ) Those with a semiconductor layer are considered to be advantageous in practice. In conventional a-silicon, dangling bonds are formed in which the bonds of tie atoms remain unbonded, and the forbidden band has approximately 10"/3''... A localized state of V occurs, making it difficult to control valence electrons and having low carrier mobility, making it impossible to use it as a semiconductor material for solar cells.

し力・しその後、価゛電子制御が可能1j:a−シリコ
ン層の製造方法であって実用化可能な亀のとしていわゆ
るグロー放電法が開発された。これはシランガスを真空
槽内に導入して当該真空槽内でグロ(5) 一放電を生ゼしぬ、シランを分解して活性のシリコン原
子及び水素原子を生成せしめ、真空槽内に設轄た基板上
Kaミーシリコン被着せしめる方法である@このグルー
放電法によって得られるa−シリコンは、ダングリング
ボンドが水素原子によシ補償されて−て−11111、
−81M、の結合を形成し、水素ガスによって濃度50
〜500p、p、wa、 K希釈したホスフィン、ジl
ラン、アルシン等のガスをシランガスと混合してグロー
放電を生ぜしめることKよって価電子制御が可能である
。そして更にその後、a−シリコンが太陽電池の材料と
して有用な可能性を有することが報告されて−る。
Subsequently, the so-called glow discharge method was developed as a practical method for manufacturing a silicon layer that can be controlled electronically. This is done by introducing silane gas into a vacuum chamber, causing no discharge, and decomposing the silane to generate active silicon atoms and hydrogen atoms. The a-silicon obtained by this glue discharge method is a method of depositing Kame silicon on a substrate with dangling bonds compensated by hydrogen atoms.
-81M, and the concentration of 50M is formed by hydrogen gas.
~500 p, p, wa, K diluted phosphine, dil
Valence electron control is possible by mixing a gas such as Ran or Arsine with silane gas to generate a glow discharge. Furthermore, it has since been reported that a-silicon has the potential to be useful as a material for solar cells.

しかしながら上述のグロー放電法にお−てけ、形成され
る龜−シリコンの組織状mがグロー放電のプラズマの状
llK依存するにもかかわらずそのプラズマを安定化す
ることが非常に困ml′&ことがら、均質なa−シリコ
ン膜を形成することは殆ど不可能であり、特に水素の導
入割合を単独に制御することができないために所望の特
性の1−シリコンを得ることはできない。
However, in the above-mentioned glow discharge method, it is extremely difficult to stabilize the plasma even though the structure m of the formed silicon depends on the plasma state of the glow discharge. However, it is almost impossible to form a homogeneous a-silicon film, and in particular, it is impossible to obtain 1-silicon with desired characteristics because the ratio of hydrogen introduction cannot be independently controlled.

(6) 又グロー放電法においては、a−シリコンの製膜速度が
プラズマの状態によって定まシ、しかもこれは数オング
ストローム7秒の程度であって極めて小さく、更に大面
積のa−シリコン層の形成には限度があって基板を相対
的に移動して行なう連続製膜も不可能であり、危険性の
あるシランガス、或いは更に毒性のあるホスフィンガス
、ジlランガス、アルシンガス等を用いるため取扱いが
面倒であり、又前記ガスの公序物質が真空槽内面に地積
し、その後のグロー放電によつ−て解離して、基板上に
形成されるa−シリコン中に混入することとなるため、
所要の特性のa−シリコンが形成されず、均質性も損な
われるようKなシ、結局グロー放電法を利用する場合に
け、実用上の規模に制限があって実際上優れた特性の太
陽電池を有利に製造することはできない・ 本発明は以上のような事情に基いてな畑れた吃のであっ
て、優れた特性を有する太陽電池を有利KM造すること
ができる方法を提供することを目的とする。
(6) In addition, in the glow discharge method, the deposition rate of a-silicon is determined by the state of the plasma, and this is extremely small, on the order of several angstroms per 7 seconds. There are limits to film formation, and continuous film formation by moving the substrates relative to each other is impossible, and it is difficult to handle because it uses dangerous silane gas or even more toxic phosphine gas, dilan gas, arsine gas, etc. This is troublesome, and the gaseous substances accumulate on the inner surface of the vacuum chamber, are dissociated by the subsequent glow discharge, and are mixed into the a-silicon formed on the substrate.
In the end, when using the glow discharge method, there is a limit to the practical scale of the solar cell, which has excellent characteristics in practice. The present invention was developed based on the above-mentioned circumstances, and it is an object of the present invention to provide a method that can advantageously produce solar cells with excellent characteristics. purpose.

(7) 本発明の特徴とするところは、基板上にアモルファスシ
リコン半導体層を有するシリコン太陽電池の製造方法に
おいて、蒸着槽外の装置により活性化した水素ガスを当
該蒸着槽内に導入しながら、当該蒸着槽内において、基
板に負電圧を印加した状態において基板上にシリコンを
蒸着することによシアモルファスシリコン半導体層を形
成する工程と、このアモルファスシリコン半導体層の前
記基板と反対側に導電領域を形成する工程とを含むこと
にある。
(7) A feature of the present invention is that in a method for manufacturing a silicon solar cell having an amorphous silicon semiconductor layer on a substrate, hydrogen gas activated by a device outside the vapor deposition tank is introduced into the vapor deposition tank; A step of forming a shear amorphous silicon semiconductor layer by depositing silicon on the substrate in a state where a negative voltage is applied to the substrate in the vapor deposition tank, and forming a conductive region on the side of the amorphous silicon semiconductor layer opposite to the substrate. and a step of forming.

以下図面によって本発明の実施例について説明する。Embodiments of the present invention will be described below with reference to the drawings.

本発明においては、第1図に示すように、蒸着槽を形成
するペルジャー1にノく夕7ライノくルブ2を有する排
気路3を介して真空lンプ(図示せず)を接続し、これ
Kよル当該ペルジャーl内を例えは10−3〜10−9
丁・rrの高真空状態柔し、当該ペルジャー1内KFi
蒸着基板4を配置してこれをヒーター5によ)温度15
0〜500℃、好ましくは250〜450℃に加熱する
と共に直流電i[6によシ蒸着1柵6o58−3247
5(3)’ 基板4に0〜10kVの負のバイアス電圧を印加する。
In the present invention, as shown in FIG. 1, a vacuum pump (not shown) is connected to a pelger 1 forming a vapor deposition tank via an exhaust path 3 having a cylinder 2. For example, the inside of the perger l is 10-3 to 10-9.
The KFi inside the Pelger 1 is softened to a high vacuum state of 1/rr.
Arrange the vapor deposition substrate 4 and heat it to the heater 5) at a temperature of 15
Heating to 0 to 500°C, preferably 250 to 450°C, and applying DC electricity to vapor deposition 6o58-3247
5(3)' Apply a negative bias voltage of 0 to 10 kV to the substrate 4.

そしてその出口か前記蒸着基板4と対向するようペルジ
ャー1に設けた水素ガス放電管7によシ活性化した水素
ガス即ち活性水素及び水素イオンをペルジャー1内に導
入しながら、前記蒸着基板4と対向するよう設けたシリ
コン蒸発源8を加熱してシリコンを前記蒸着基板4に蒸
着せしめ、これによシダングリングボンドが水素原子に
より補償又は封鎖されたa−シリコン半導体層を形成し
、更にこのa−シリコン半導体層の基板とは反対側の表
面に導電領域を形成して太陽電池を製造する。
Then, while introducing activated hydrogen gas, that is, active hydrogen and hydrogen ions into the Pel jar 1 through a hydrogen gas discharge tube 7 provided in the Pel jar 1 so that its outlet faces the vapor deposition substrate 4, the vapor deposition substrate 4 is The silicon evaporation sources 8 provided opposite to each other are heated to evaporate silicon onto the evaporation substrate 4, thereby forming an a-silicon semiconductor layer in which dangling bonds are compensated or blocked by hydrogen atoms. a- Forming a conductive region on the surface of the silicon semiconductor layer opposite to the substrate to produce a solar cell.

以上における水素ガス放電管7の一例においては、第2
図に示すように、ガス人口21を有する筒状の一方の電
極部材22と、この一方の電極部材22を一端に設けた
、放電空間23を囲繞する例えば筒状ガラス製め放電空
間部材24と、この放電空間部材24の他端に設けた、
出口25を有するリング状の他方の電極部材26とよ構
成り、前記一方の電極部材22と他方の電極部材26と
(9) の間に¥i流又は交流の電圧が印加されることKより、
ガス人口21を介して供給された水素ガスが放電空間2
3においてグロー放電を生じ、これにより電子エネルギ
ー的に賦活された水素原子若しくけ分子より成る活性水
素及びイオン化された水素イオンが出口25より排出さ
れる。この図示の例の放電空間部材24け二重管構造で
あって冷却水を流過せしめ得る構成を有し、27.28
が冷却水入口及び出口を示す、29ti一方の電極部材
22の冷却用フィンである。この例の水素ガス放電管の
材質は例えばアルミニウムであって電極間距離tjlO
〜15傷であシ、他方の電極部材26をアース電位とし
一方の電極部材22に500〜800v好ましくは60
0v程度の交流又Fi会の直流電圧が印加され、放電空
間23の圧力は101?@rr程度とされる。この水素
ガス放電管7に供給する水素ガスとしては純度の高いも
のが用−られ、例えばパラジウムによシ純化されたもの
が好ましいO本発明方法による太陽電池の製造の具体例
を説明すると、第1図に示したように、ペルジャー1(
10) 内にはシリコン蒸発源8のほかKFM期律表第V族元素
の□蒸発源例えばアンチモン蒸発源9、金属の蒸発源飼
えげ白金蒸発源10を設けると共に前記蒸発源8〜10
の各々には開閉自在にシャッター8を設ける。そしてス
テンレス鋼よ構成る基板を蒸着基板として、これを温度
350℃に加熱した状態において、先ず、水素ガス放電
管7よシ活性水素及び水素イオンをペルジャーl内に導
入しながら、ペルジャー1内を2 X 10−’ To
rrの減圧状態に保ち、又蒸着基板に−3kVの直流電
圧を印加した状態でシリコン蒸発118及びアンチモン
蒸発源9を加熱して蒸発源物質を蒸発せしすると共にそ
れらのシャッターSを開き、これKより、第3図に示す
ように、基板30上に水素が導入され且つアンチモンが
不純物として含有されたa−シリコンを蒸着せしめて、
例えば厚さ50〜500λのn型層31を形成する。次
いでアンチモン蒸着@9の加熱を停止してそのシャッタ
ーSを閉じた状態でシリコン蒸発源8による蒸着を継続
し、前記n型層31上に不純物を含有しない龜−シリコ
(11) ンより成る例えば厚さ0.5〜2ミクロンの1J132
を形成する。その後活性水素及び水素イオンの導入を停
止すると共に前記シリコン蒸発源8の加熱を停止してそ
のシャッターBt−閉じ、白金蒸発源10を加熱して白
金を蒸発せしめると共にそのシャッター8を開き、これ
Kよシ前記i層32上に厚さ数百lの金属よ形成る金属
層33を影威し、更にこの金属層33上に必要に応じて
電流収集のための金属より成る電極体層34を餌えば網
状に形成し、以って太陽電池を製造する。
In the above example of the hydrogen gas discharge tube 7, the second
As shown in the figure, one cylindrical electrode member 22 having a gas population 21, and a discharge space member 24 made of, for example, cylindrical glass, surrounding a discharge space 23 and having this one electrode member 22 at one end. , provided at the other end of this discharge space member 24,
The other electrode member 26 is configured with a ring-shaped other electrode member 26 having an outlet 25, and a current or alternating current voltage is applied between the one electrode member 22 and the other electrode member 26 (9). ,
Hydrogen gas supplied through the gas population 21 is supplied to the discharge space 2
3, a glow discharge is generated, whereby active hydrogen consisting of hydrogen atoms or molecules activated by electron energy and ionized hydrogen ions are discharged from the outlet 25. The discharge space member in this illustrated example has a 24-piece double pipe structure and is configured to allow cooling water to flow through it, and 27.28
are the cooling fins of one electrode member 22, where 29ti indicates the cooling water inlet and outlet. The material of the hydrogen gas discharge tube in this example is, for example, aluminum, and the distance between the electrodes is tjlO.
~15 scratches, the other electrode member 26 is set to ground potential, and one electrode member 22 is applied with a voltage of 500 to 800V, preferably 60V.
An AC or DC voltage of about 0 V is applied, and the pressure in the discharge space 23 is 101? It is said to be around @rr. The hydrogen gas to be supplied to the hydrogen gas discharge tube 7 is of high purity, preferably purified by palladium, for example. As shown in Figure 1, Pelger 1 (
10) In addition to the silicon evaporation source 8, a □ evaporation source of an element of group V of the KFM periodic table, such as an antimony evaporation source 9, and a metal evaporation source, a platinum evaporation source 10, are provided, and the evaporation sources 8 to 10 are
A shutter 8 is provided in each of the shutters 8 so as to be openable and closable. Using a substrate made of stainless steel as a vapor deposition substrate and heating it to a temperature of 350°C, first, while introducing active hydrogen and hydrogen ions into the Pel jar 1 through the hydrogen gas discharge tube 7, the inside of the Pel jar 1 is heated. 2 X 10-' To
The silicon evaporation source 118 and the antimony evaporation source 9 are heated to evaporate the evaporation source material while maintaining the reduced pressure state of rr and applying a DC voltage of -3 kV to the evaporation substrate, and open their shutters S. From K, as shown in FIG. 3, a-silicon into which hydrogen was introduced and antimony was contained as an impurity was deposited on the substrate 30.
For example, an n-type layer 31 having a thickness of 50 to 500λ is formed. Next, the heating of the antimony evaporator @ 9 is stopped, and the evaporation by the silicon evaporation source 8 is continued with the shutter S closed, and the n-type layer 31 is coated with silicone (11), for example, which does not contain impurities. 1J132 with thickness 0.5-2 microns
form. Thereafter, the introduction of active hydrogen and hydrogen ions is stopped, the heating of the silicon evaporation source 8 is stopped and its shutter Bt- is closed, and the platinum evaporation source 10 is heated to evaporate platinum, and its shutter 8 is opened. A metal layer 33 made of metal with a thickness of several hundred liters is formed on the i-layer 32, and an electrode body layer 34 made of metal for collecting current is further formed on this metal layer 33 as necessary. If fed, it will be formed into a net shape, thereby producing solar cells.

この第3図に示した構成にお―てけ基板30と襲型層3
1との間にオーミックコンタクトが形成されると共に、
1層32と金属層33との境界においてショットキーバ
リアが形成され、金属層33を透過した光によシ起電力
が現われ、金属層33若しくII′i電極体層34と基
板30との間に電圧が発生する。ここに得られる変換効
率はムMlの光・・:。
In the configuration shown in FIG.
An ohmic contact is formed between 1 and
A Schottky barrier is formed at the boundary between the first layer 32 and the metal layer 33, and an electromotive force appears due to the light transmitted through the metal layer 33, causing an increase in the contact between the metal layer 33 or the II'i electrode body layer 34 and the substrate 30. A voltage is generated between the two. The conversion efficiency obtained here is Ml of light...:.

(100dN/    ) ON射で約3.5sであっ
て十−・秒 分実用に供し得るものである。そして金属層33の形成
のためKは、白金以外にも金、パラジウム等の仕事関数
の大きい金属を用いてもよい。
(100 dN/) ON radiation is approximately 3.5 seconds, which can be used in practical use for 10 seconds. In order to form the metal layer 33, K may be a metal with a large work function such as gold or palladium other than platinum.

尚電極体N34の代シに、又は金属N33及び電極体層
340代、9KITO層と称される8m01 。
In addition, in place of electrode body N34, or metal N33 and electrode body layer 340, 8m01 is referred to as 9KITO layer.

In01等よ形成る透明電極を設けて成る構成としても
よい。この場合において、透明電極のシート抵抗がlO
Ω/d以下で光透過率が85%以上であることが好まし
い。
A structure may also be provided in which a transparent electrode made of In01 or the like is provided. In this case, the sheet resistance of the transparent electrode is lO
It is preferable that the light transmittance is 85% or more at Ω/d or less.

本発明F1以上のよ’lK%、−シリコン半導体層(#
!3’図の例でtin型層31屓び1層32)を、活性
水素及び水素イオンの存在下におけるシリコンの蒸着に
よって形成するものであるため、シリコン蒸発源8或い
け更に第V族元素の蒸発i19の加熱の程度並びに活性
水素の活性化の程度又は水素イオン量及び/又はその導
入量を個別に制御することができて所望の特性のa−シ
リコン半導体層を形成し得ると共に、常に均一な条件の
下で水素を含有したa−シリコン半導体層を形成するこ
とができてその組−若しくは組成を均質なものとするこ
とができる。しかもa−シリコン半導体層の製III速
度はグロー放電法の数十倍以上(例えば(13) 10〜1ooi/秒)とすることが容易であると共に、
大面積の蒸着基板の表面全面にも均一に蒸着することが
でき、更にシリコン蒸発源8に対して蒸着基板4を相対
的に移動せしめることによって連続製膜も可能である。
The present invention F1 or higher, -silicon semiconductor layer (#
! In the example shown in Figure 3', the tin-type layer 31 and layer 32) are formed by vapor deposition of silicon in the presence of active hydrogen and hydrogen ions, so the silicon evaporation source 8 or even the group V element is used. It is possible to individually control the degree of heating of evaporation i19, the degree of activation of active hydrogen, the amount of hydrogen ions and/or the amount of hydrogen ions introduced, and it is possible to form an a-silicon semiconductor layer with desired characteristics, and it is always uniform. It is possible to form a hydrogen-containing a-silicon semiconductor layer under such conditions, and the composition or composition thereof can be made homogeneous. Moreover, the manufacturing speed of the a-silicon semiconductor layer can be easily made several tens of times higher than that of the glow discharge method (for example, (13) 10 to 1 ooi/sec), and
It is possible to uniformly deposit the entire surface of a large-area deposition substrate, and furthermore, by moving the deposition substrate 4 relative to the silicon evaporation source 8, continuous film formation is also possible.

又a−シリコン半導体層の価電子制御のためにシリコン
と共に周期律表第■族元素又は第V族元素を共蒸着する
場合にも、それら蒸発源を設けてその状態をシャッター
8の開閉及び蒸発用加熱電源の0N−OFFのみによシ
容易に制御することができる。従って、本発明によれけ
、優れた特性のa−シリコン半導体層を有し、従って優
れた特性の太陽電池を確実にしかも極めて有利に1即ち
、短時間のうちに所要の面積のものを工業的規模で容易
に製造することができる0 以上にお−て、水素ガス放電管7は、蒸着槽な構成する
ペルジャー1外に位置せしめるのが好ましい。即ち、水
素ガス放電管7#iその動作によシ発熱して1000℃
以上もO高温と表るため、そのままでは当該木葉ガス放
電管7の真空密封用0リングの溶融劣化、電極部材22
,26の溶融劣化を(14) 招くこととなり、従って冷却機構が必要となる2>E、
ペルジャー1の外部に水素ガス放電管7を設ければ、既
述のように4ぞ方の電極部材28をアース電位としてこ
れを水冷によって十分に冷却することが容易であり、電
圧が印加されるために水冷を利用することのできない一
方の電極部組2!11.については、これにフィン29
を設けてファン等によって空冷することKよシ、十分に
冷却することが容易である。併せて、水素ガス放電管7
をペルジャー1外に設けるととKよシ、電極部材2.Z
、26の清掃、真空密封用0リングの交換等の保守を蒸
着”槽内を汚染することなく行危うことができる。
Also, when co-evaporating an element of group Ⅰ or group V of the periodic table together with silicon to control the valence electrons of the a-silicon semiconductor layer, an evaporation source is provided and the state is controlled by opening and closing of the shutter 8 and evaporation. It can be easily controlled by simply turning on and off the heating power source. Therefore, according to the present invention, it is possible to produce a solar cell having an a-silicon semiconductor layer with excellent properties, and therefore with excellent properties, and very advantageously. It is preferable that the hydrogen gas discharge tube 7 is located outside the Pelger 1 which constitutes the vapor deposition tank. That is, hydrogen gas discharge tube 7 #i generates heat due to its operation and reaches 1000°C.
Since the above is also expressed as O high temperature, if left as is, the O ring for vacuum sealing of the Konoha gas discharge tube 7 will melt and deteriorate, and the electrode member 22
, 26 (14), and therefore a cooling mechanism is required.
If the hydrogen gas discharge tube 7 is provided outside the Pelger 1, it is easy to set the four electrode members 28 at ground potential and sufficiently cool them by water cooling, as described above, and a voltage is applied. Therefore, water cooling cannot be used for one electrode assembly 2!11. Regarding this, fin 29
It is easier to provide sufficient cooling than to provide air cooling with a fan or the like. In addition, hydrogen gas discharge tube 7
If K is provided outside the Pelger 1, the electrode member 2. Z
, 26 cleaning, vacuum sealing O-ring replacement, and other maintenance can be performed without contaminating the inside of the deposition tank.

これに対し、ペルジャーl内に水素ガス放電管を位置せ
しめると、電極部材等の金属部分からの原子の飛散が生
ずるため、相当に強力な冷却機構を必要とする上、電圧
を印加すべき電極部材につペルジャー1内に配設するこ
と社、機構上大きな障害があシ、蒸着条件も厳しいもの
となる。併せ了15) て、水素ガス放電管の保守に際し、ペルジャー1内を汚
染する可能性が大きく、膳素、窒素、遷移金属等の好着
しくない不純物がペルジャーl内に導入されるように’
&夛、これによって形成されるa−シリコンは、暗抵抗
が小さく々つたシ光応答性が減少する等特性が劣ったも
のとなる0本発明方決によって製造される太陽電池は、
光起電力を生ずべき空乏層がa−シリコン半導体層によ
〕形成される型のものであれけ、その具体的#I威はW
kIiに及ぶ。例えば第3図の詞において更K1層32
と金属層33との藺Ktooi以下の81へ或−は81
N等′の絶縁層を形成して成るモツ)バリアによシ光起
電力を生ずる構成としてもよいし、又II4図に示すよ
うに、ガラス板40上にシーシ抵抗が109,4−以下
のITO膜、8mO3膜又は1m1O@膜より威る透明
導電層41を形成したもの、又#1前記透明導電層41
上K11百l厚の高仕事間1[,1 1kO金属層を形成したもOをシリコンの蒸着における
基板として用いて、当該基板上に厚さ0.5〜2ミクロ
ン01941更にその上に、オーミツ特開昭58−32
475(5)・ クコンタクトを得るためのU型層43を介して例えば厚
さ数百Aの金属よシ成る導電層44を設けて成る構成、
第5図に示すように、#!3WJの例と同様に、金属基
板50上に厚さ50’〜400 A C) m型層51
を介して厚さ0.2〜2文クロンの1層52を形成し、
この1層52上KfIlえげアル1=ウムを不純物とし
て含有する厚さ50〜3001のa−シリコンよシ成る
p型層53を影成し、その上に第3図の例におけると同
様に透明導電層54及び電極体層55又は透明導−電層
54を設けて空間電荷の電界が形成されるようにした構
成又はこの構、裁において1層42を設けずKp型層及
びII型層のみとして接合が形成されるようにした構成
、第6図に示すように第3図の例における3M層31と
1層32との間に、1層32との境界にシ曹ットキーバ
リアを形成する、仕事関数の高い金属例えば金、白金、
パラジウム等よ形成る厚さ100λ程度の透明金属層6
0を設け、五層32上にけI’rO導i層61及び電極
体層62を設けた構成、その他の構成としてもよい。
On the other hand, if a hydrogen gas discharge tube is placed inside a Pelger l, atoms will scatter from metal parts such as electrode members, so a fairly powerful cooling mechanism is required, and the electrodes to which voltage must be applied Disposing the members in the Pelger 1 poses a major mechanical problem, and the deposition conditions are also severe. 15) When maintaining the hydrogen gas discharge tube, there is a high possibility that the inside of the Pel Jar 1 will be contaminated, and undesirable impurities such as food, nitrogen, and transition metals may be introduced into the Pel Jar 1.
The a-silicon thus formed has poor characteristics such as low dark resistance and decreased photoresponsiveness.The solar cell manufactured by the method of the present invention has the following properties:
Even if the depletion layer that generates photovoltaic force is of the type formed by the a-silicon semiconductor layer, its specific power is W.
It extends to kIi. For example, in the words in Figure 3, further K1 layer 32
and metal layer 33 below 81 or 81
It is also possible to use a structure in which a photovoltaic force is generated by a barrier formed by forming an insulating layer of N or the like, or as shown in Fig. A transparent conductive layer 41 that is more powerful than an ITO film, an 8mO3 film, or a 1m1O@ film, or #1 the transparent conductive layer 41
A 1[,1 1kO metal layer with a thickness of 0.5 to 2 microns is formed on the substrate, and a layer of 01941 with a thickness of 0.5 to 2 microns is applied on the substrate. Japanese Patent Publication No. 58-32
475(5) - A structure in which a conductive layer 44 made of metal and having a thickness of several hundred amps, for example, is provided through a U-shaped layer 43 for obtaining a contact,
As shown in Figure 5, #! Similar to the 3WJ example, an m-type layer 51 with a thickness of 50' to 400 cm is formed on the metal substrate 50.
Form one layer 52 with a thickness of 0.2 to 2 cm through the
A p-type layer 53 made of a-silicon with a thickness of 50 to 300 mm and containing KfIl as an impurity is formed on this layer 52, and a p-type layer 53 made of a-silicon with a thickness of 50 to 300 mm is formed on this layer 52, and a p-type layer 53 made of a-silicon containing KfIl as an impurity is formed, and a p-type layer 53 made of a-silicon containing KfIl as an impurity is formed thereon. A structure in which a transparent conductive layer 54 and an electrode body layer 55 or a transparent conductive layer 54 are provided to form a space charge electric field, or in this structure, one layer 42 is not provided and a Kp type layer and a type II layer are formed. As shown in FIG. 6, a silicon barrier is formed between the 3M layer 31 and the first layer 32 in the example of FIG. 3 at the boundary with the first layer 32. , metals with high work functions such as gold, platinum,
Transparent metal layer 6 with a thickness of about 100λ made of palladium or the like
0, and an I'rO conductive layer 61 and an electrode body layer 62 are provided on the five layers 32, or other configurations may be used.

(17) 以上における1層、’a型層及びP型層は何れも既述の
ように、活性水素及び水素イオンの存在下におけるシリ
コンの蒸着による1−シリコン半導体層によシ形成され
%ml!層においてはリン、ヒ素、アンチモン、ビスマ
ス等の第■族元素が、又pl!層においてはホウ素、ア
ルミニウムlガリウム、インジウム、タリウム等の第1
族元素が不純物として、シリコンと同様に蒸着によル混
入せしめられる0又金属よシ成る導電層等を形成するた
めに#−i任意の方法を利用することができるが、本発
明においては、特に金属の蒸着決を利用することが便利
であや、従って、第1図に示したように四つの蒸発源8
〜11を配置してそれらをシリコン蒸発源、金属蒸発源
、第璽族元素蒸発源及び第■族元素蒸発源として用い、
その個々のシャッターの開閉制御を含めて各蒸発源によ
る蒸着を制御することにより、種々の層構成を有する太
陽電池を製造することができる。ここに各蒸発源の加熱
は、電子銃加熱方式、抵抗加熱方式等の任意の方式を採
用することができる。又基板として金属板(18) を用いるときは、ステンレス鋼のほか、モリブデン、タ
ングステン等を用−ることができる0又基板としては、
ガラス板、石英板上にモリブデン、タングステン、クロ
ム等の金属層を設けたもの、厚さ数百^の金、潰噛=白
金及び/又FiI丁0膜、8mOB膜、ImtOmml
等の透明電極層を設けたものを用−てもよい。
(17) As described above, the 1 layer, the 'a type layer and the P type layer are all formed by a 1-silicon semiconductor layer by vapor deposition of silicon in the presence of active hydrogen and hydrogen ions. ! In the layer, group Ⅰ elements such as phosphorus, arsenic, antimony, bismuth, etc. are also present in pl! In the layer, primary materials such as boron, aluminum, gallium, indium, thallium, etc.
Any method can be used to form a conductive layer or the like made of a metal in which group elements are mixed as impurities by vapor deposition in the same way as silicon, but in the present invention, In particular, it is convenient to use metal evaporation, and therefore, four evaporation sources 8 are used as shown in FIG.
- 11 are arranged and used as a silicon evaporation source, a metal evaporation source, a group P element evaporation source and a group Ⅰ element evaporation source,
By controlling the evaporation by each evaporation source, including the opening/closing control of the individual shutters, solar cells having various layer configurations can be manufactured. Here, each evaporation source may be heated by any method such as an electron gun heating method or a resistance heating method. When using a metal plate (18) as a substrate, in addition to stainless steel, molybdenum, tungsten, etc. can be used as the substrate.
Glass plate, quartz plate with metal layer such as molybdenum, tungsten, chromium, etc., several hundred thick gold, platinum and/or FiI 0 film, 8mOB film, ImtOmml
It is also possible to use a device provided with a transparent electrode layer such as the above.

以上のように本発明によれば、活性水素及び水素イオン
を真空槽内に導入しながらシリフンの蒸着を行なってa
−シリコン半導体層を形成することによシ太陽電池を製
造することができ、結局、優れた特゛性の太陽電池を有
利に製造することができる。
As described above, according to the present invention, silicon hydroxide is deposited while introducing active hydrogen and hydrogen ions into a vacuum chamber.
- A solar cell can be manufactured by forming a silicon semiconductor layer, and as a result, a solar cell with excellent characteristics can be advantageously manufactured.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明シリコン太陽電池の製造に用φる蒸着装
置の構成を示す説明用断面図、第2!!!!!轄水素ガ
ス放電管の一例を示す説明用断面図、#I3図〜第6図
は本発明方法によって製造される太陽電池の構成例を示
す説明用断面図である。 1・・・ペルジャー    3・・・排気路(19) 4・・・蒸着基板     5・・・ヒーター7・・・
水素ガス放電管  21・・・ガス人口22・・・電極
部材    23・・・放電空間24・・・放電空間部
材  26・・・電極部材30・・・基板      
31・・・渦原層32・・・1層       33−
・・金属層40・・・ガラス板    41・・・透明
導電層42・・・1層       43・・・*W1
1層44・・−導電層      50・・・金属基板
51・・・1111層      52・・・1層53
・・・pH層      54・・・透明導電層60・
・・透明金属層    61・・・ITO導電導電層間
8開昭582475(6) 第1図 第2図 水東力゛ス
FIG. 1 is an explanatory cross-sectional view showing the configuration of a vapor deposition apparatus used for manufacturing the silicon solar cell of the present invention, and FIG. ! ! ! ! An explanatory sectional view showing an example of a hydrogen gas discharge tube, and Figures #I3 to 6 are explanatory sectional views showing an example of the configuration of a solar cell manufactured by the method of the present invention. 1... Pelger 3... Exhaust path (19) 4... Evaporation substrate 5... Heater 7...
Hydrogen gas discharge tube 21... Gas population 22... Electrode member 23... Discharge space 24... Discharge space member 26... Electrode member 30... Substrate
31... Vortex formation layer 32... 1 layer 33-
...Metal layer 40...Glass plate 41...Transparent conductive layer 42...1 layer 43...*W1
1 layer 44...-conductive layer 50...metal substrate 51...1111 layer 52...1 layer 53
...pH layer 54...transparent conductive layer 60.
...Transparent metal layer 61...ITO conductive conductive interlayer 8 1982-475 (6) Figure 1 Figure 2 Suito Forces

Claims (1)

【特許請求の範囲】 1)基板上にアモルファスシリコン半導体層を有するシ
リコン太陽電池の製造方法において、蒸着槽外の装置に
よシ活性化した水素ガスを当該蒸着槽内に導入しながら
、当該蒸着槽内において、基板に負電圧を印加した状I
Iにおいて当該基板上にシリコンを蒸着することKよル
了モル7アスシリコン半導体層を形成する工程と、この
アモルファスシリコン半導体層の前記基板と反対@に導
電領域を形成する工程とを含むことを特徴とするアモル
ファスシリコン太11fi池の1IIfi[方法・2)
前記アモルファスシリコン半導体層を形成する工程がシ
リコンを単独に蒸着してアモルファスシリコン単独半導
体層を形成する工程及び/又は周期律表第1族元素及び
IIV族元素の一方から成るドープ剤をシリコンと共に
蒸着して前記ドープ剤によシドープされたアモルファス
シリコン牛(2) 導体層を形成する工程から成る特許請求の範囲第1項記
載のアモルファスシリコン太1li1[池の製造方法。 3)前記アモルファスシリコン半導体層を形成する工程
が、前記基板上に、周期律表第1族元素及び第■族元素
の一方から成る第10ドープ剤をドープした第1のアモ
ルファスシリコン半導体層、アモルファスシリコン単独
半導体層及び前記第1族元禦及び第■族元素の他方から
成る第2のドープ剤をドープした第2のアモルファスシ
リコン半導体層を積層して形成する工程から成り、前記
アモルファスシリコン真性半導体層中に空間電荷の電界
が形成されるようにした特許請求の範囲第1項記載のア
モルファスシリコン太陽電池の製造方法・ 4)前記アモルファスシリコン半導体層を形成する工程
が、前記基板上に1周期律表第1族元禦及び第■族元素
の一方から成るIIIのドープ剤をドープした第1のア
モルファスシリコン半導体層及び第璽族及び第■族元素
の他方から成る第2の(3) ドープ剤をドープした第2のアモルファスシリコン半導
体層を積層して形成する工程から成シ、前記tIM1の
アモルファスシリコン半導体層とIII!2C)アモル
ファスシリコン半導体層との関に接合を形成した特許請
求の範囲第1項記載のアモルファスシリコン太陽電池の
製造方法。 5)前記アモルファスシリコン半導体層を形成する工程
が、前記第2のアモルファスシリコン半導体響上に、前
記第20ドープ剤を第2のアモルファスシリコン半導体
層よシ高濃度にドープした館3のアモルファスシリコン
半導体層を積層して形成する工程を含む特許請求の範囲
第4項記載のアモルファスシリコン太陽電池osH,方
法。 6)前記導電領域を形成する工程が、前記アモルファス
シリコン半導体層上に光透過性導電材料を蒸着する工程
から威シ、前記導電領域に空間電荷の電算が形成される
ようK ’L・ηた特許請求の範囲第1項、1112項
、#I3項、第4項又#を第5項記載のアモルファスシ
リコン太陽電池の製造方法。
[Claims] 1) In a method for manufacturing a silicon solar cell having an amorphous silicon semiconductor layer on a substrate, the vapor deposition is performed while introducing activated hydrogen gas into the vapor deposition tank using a device outside the vapor deposition tank. State I in which a negative voltage is applied to the substrate in the tank
The step of depositing silicon on the substrate in step I includes the steps of forming a silicon semiconductor layer and forming a conductive region on the opposite side of the amorphous silicon semiconductor layer from the substrate. Features of amorphous silicon 1IIfi [Method 2]
The step of forming the amorphous silicon semiconductor layer is a step of vapor-depositing silicon alone to form an amorphous silicon-only semiconductor layer, and/or vapor-depositing a dopant consisting of one of a Group 1 element and a Group IIV element of the periodic table together with silicon. 2. A method for manufacturing an amorphous silicon layer according to claim 1, comprising the step of forming a conductor layer on the amorphous silicon layer doped with the dopant. 3) The step of forming the amorphous silicon semiconductor layer includes forming a first amorphous silicon semiconductor layer on the substrate doped with a tenth dopant consisting of one of a group 1 element and a group Ⅰ element of the periodic table; The process comprises stacking and forming a silicon-only semiconductor layer and a second amorphous silicon semiconductor layer doped with a second dopant consisting of the other of the group 1 element and the group Ⅰ element; A method for manufacturing an amorphous silicon solar cell according to claim 1, wherein an electric field of space charges is formed in the layer. 4) The step of forming the amorphous silicon semiconductor layer is performed on the substrate for one cycle A first amorphous silicon semiconductor layer doped with a dopant III consisting of one of Group 1 elements and Group II elements of the Table of Contents, and a second (3) dopant consisting of the other of Group I elements and Group II elements. Formed from the step of laminating and forming a second amorphous silicon semiconductor layer doped with an agent, the amorphous silicon semiconductor layer of tIM1 and III! 2C) The method for manufacturing an amorphous silicon solar cell according to claim 1, wherein a junction is formed in relation to the amorphous silicon semiconductor layer. 5) The step of forming the amorphous silicon semiconductor layer comprises doping the second amorphous silicon semiconductor layer with the 20th dopant at a higher concentration than the second amorphous silicon semiconductor layer. The amorphous silicon solar cell OSH and method according to claim 4, which includes the step of forming layers by laminating them. 6) The step of forming the conductive region is separated from the step of depositing a light-transmissive conductive material on the amorphous silicon semiconductor layer, and the conductive region is formed by K′L·η so that a space charge is formed in the conductive region. A method for manufacturing an amorphous silicon solar cell according to claim 1, 1112, #I3, 4 or #5.
JP56130188A 1981-08-21 1981-08-21 Manufacture of amorphous silicon solar cell Pending JPS5832475A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56130188A JPS5832475A (en) 1981-08-21 1981-08-21 Manufacture of amorphous silicon solar cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56130188A JPS5832475A (en) 1981-08-21 1981-08-21 Manufacture of amorphous silicon solar cell

Publications (1)

Publication Number Publication Date
JPS5832475A true JPS5832475A (en) 1983-02-25

Family

ID=15028175

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56130188A Pending JPS5832475A (en) 1981-08-21 1981-08-21 Manufacture of amorphous silicon solar cell

Country Status (1)

Country Link
JP (1) JPS5832475A (en)

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