JPS5882448A - Electron-gun structure and its manufacture - Google Patents

Abstract

PURPOSE:To automate measurement of the accuracy of the parts of an electron- gun structure, and increase the manufacture efficiency and the assembly accuracy of the electron-gun structure by making the diameters of the electron- beam holes of electrode elements, which don't constitute any electron lens, larger than the diameters of the electron-beam holes of electrode elements, which constitute electron lenses. CONSTITUTION:Among grids and assembly members, the diameters of electron beam holes of electrode elements 482, 483, 484, 486, 493 and 492, which don't constitute any electron lens, are made 0.04-0.30 time larger than the diameters of electron-beam holes of electrode elements 481, 485 and 491, which constitute electron lenses. When the second assembly member 48b of the fifth grid 48 is placed over a cap-like electrode element 491, with a spacer 24 interposed between them, the element 491 and a cap-like electrode element 485 become in homogeneous contact with the spacer 24 since the electron beam holes of a cap- like electrode element 484 and a plate-like electrode element 486 are large. As a result, the assembly accuracy of an electron-gun structure is increased without being influenced by an electron lens formed between the cap-like electrode elements 485 and 491.

Description

[Detailed Description of the Invention] Technical Field of the Invention The present invention relates to an electron gun assembly and a method for manufacturing the same, and in particular to an electron gun assembly that can be assembled effectively by changing the diameter of an electron beam passing hole in a grid that constitutes the electron gun assembly. The present invention relates to an electron gun assembly that can perform

Technical Background of the Invention The mainstream electron gun structures used for color picture tubes include unipotential electron gun structures (hereinafter referred to as UPF) and pipotential electron gun structures (hereinafter referred to as BPF). However, these UPF and BPF have advantages and disadvantages, and it has been difficult to reduce the spot on the screen of a color picture tube over the entire surface.

As a countermeasure to this problem, the applicant first developed an electron gun structure (hereinafter referred to as QPF) in which a unipotential electron lens was used as an auxiliary electron lens and a pipotential type electron lens was used as the main electron lens. By reducing the size of the spot over the entire surface, it is possible to obtain extremely clear reconstructed flesh images with high brightness and high contrast.

Next, the main part of the structure of QPli' will be explained with reference to FIG. That is, the QPF (1) has a cathode (3) equipped with a heater (2) inside, a first grid (4j), and a second grid (4j).
5), a fourth grid (7) consisting of two cap-shaped electrode elements (61) (6 m) and one flat electric tube-shaped electrode element (7z) (7 m), two cap-shaped electrode elements ( 8
*) A first assembly (8a) consisting of (h) and one flat electrode element (8,), and two cap-shaped electrodes (8,);
4) A fifth grid (81) consisting of a second assembly (8b) consisting of one flat electrode element (8,);
8), 2 cap-shaped electrode elements (9 layers) (9m) and 1
The sixth grid (9s) consists of 9 flat electrode elements (9s).
), the heater (2), the cathode (3), the first
grid (4), $2 grid (5), 3rd grid (
6), 4th grid (7), 5th grid (8), 6th grid
The grids (9 grids) are implanted on the insulating support rod α via the implanted part so as to have a predetermined interval between them, and the third grid (6 grids)
), the fourth grid (force), and the fifth grid (8) form a unipotential type electron lens, and the fifth grid (8) and the sixth grid (9) form a pi-potential type electron lens. ing.

The electron gun assembly as shown in FIG. 1 is assembled by the assembly method shown in the numbers 2g to 44. In the figure, the same parts as in FIG. 1 are denoted by the same reference numerals.

First, as shown in FIGS. 2 and 3, a cap-shaped electrode element (8t') that does not constitute an electron lens is placed on the assembly jig 0 in which the surface plate QIIK positioning center rod (Lz) is implanted.

Insert the flat electrode element (8,) and the cap-shaped electrode (8,) that forms the electron lens, and move it from above the cap-shaped electrode (81) in the direction of the arrow (F,) through the jig I. The positioning jig Aa!11, [6,' (lη, al, al
4 provided on the outer periphery of the flat electrode element (86) using
Determine the position of the reference plane (1) and the center rod α.

In this case, as shown in the figure, the positioning jig and est are each connected to a spring in the direction of the arrow (Fl) (
A force of F is applied to the flat electrode element (86).

Next, the cap-shaped electrode elements (84) and (81) and the flat plate-shaped electrode element (8) are subjected to resistance welding or laser welding at the welding point to complete the second assembly (8b).

This manufacturing method is applicable to the third grid (6), JI4 grid (
7), first assembly (8m) of j15 grid (8),
j14! The same applies to grid (9).

Next, the assembly of the electron gun assembly will be explained with reference to FIG. In the figure, the same reference numerals as in FIG. 1 indicate the same parts, and specific explanations thereof will not be given.

That is, the sixth grid (9) and the spacer c! 4. Second assembly (8b), first assembly (8m), and spacer (g) of the fifth grid (8).

4th grid (7), spacer (E), 3rd grid (
6) Stack the spacer (2), second grid (5), spacer (c), j[1 grid (4) in this order, and place the jig (2) on top of this first grid (4). , While tightening with force (P4) from the direction of the arrow, press the insulation support rod (1) with a softened surface from both sides, and implant the implanted part of each grid on this insulation support rod, and then attach the center rod (toward). Each spacer C!4), (c).

- By removing parts (c), (2), and (2), the electron gun assembly shown in FIG. 1 is completed. In Figure 4, the cathode and heater are omitted.

Each grid of the electron gun assembly assembled by the manufacturing method described above, for example, the first assembly (8 heat) of the fifth grid (8)
Taking the second assembly (8b) as an example, the shapes of the second assembly (8b) and the sixth grid (9) are as shown in FIG. The diameter (φ1) of the electron beam passage hole of the plate-shaped electrode element (8,)
6) Diameter (φ, ) of the electron beam passage hole.

The diameter (φS) of the electron beam passage hole of the cap-shaped electrode element (84) that does not constitute an electron lens was formed to be the same.

Problems with the Background Art In this way, the diameter (φ, ) of the electron beam passage hole of each element,
Since (φa) and (φ8) are the same, there are the following problems.

First, it is difficult to automate the determination of the part type f field. That is, optical measurement using transmitted light is the easiest method for automation, but apart from the flat electrode element (8,), the cap-shaped electrode elements (81) and (84) have the same diameter. For,
For example, even if parallel light is passed from the outside of the cap-shaped electrode element (81), a part of this light is blocked by the electron beam passage hole of the cap-shaped electrode element (84), and a clear beam cannot be obtained. Therefore, since such optical measurement is used, there is no noise.Secondly, the productivity of the electron gun assembly is poor. In other words, in the so-called beading process shown in Figure 4, each grid or grid assembly is slid onto the center rod, so when inserting these grids or grid assemblies into the center rod, Poor workability.

Thirdly, the assembly accuracy of the electron gun assembly deteriorates, as shown in FIG.
When using the ζ-deformed one, considering the case where the second assembly (8b) of the fifth grid (8) is placed through the spacer 04J, both of the second assembly (8b) Cap-shaped electrode element (84) (81), sixth grid (
The electron beam passage holes of both the cap-shaped electrode elements (9s) (9,) in 9) have the same diameter, and they slide onto the center rod ■ and are pressed from above in the direction of the arrow (F4). spacer (c) and cap-shaped electrode element (4).
) are in contact only at point 01J and the second assembly (8
b) A stress is applied as shown by the arrow (to) at one point, −
And center stick c! Since the second assembly (8b) moves when removed from the center rod 4 after the beading process, it is likely to be defective as an electron gun assembly.

Fourth, the accuracy of electron gun assembly alignment deteriorates. In other words, an electrode element that does not constitute an electron lens that does not require precision;
In Fig. 6, (8,) and (9) are the electrode elements that constitute the electron lens that requires precision, and in Fig. 6, (8,) and (91)
Since both have the same electron beam passage hole, both the contact type and the optical type interfere with the measurement, resulting in a decrease in measurement accuracy.

#5 Deterioration of focus quality, that is, if the diameter of the electron beam passing hole is the same, and the electron beam passing hole of the electrode element that does not constitute the electron lens is off-center, the electric field forming the electron lens This causes distortion in the electron beam passing through the electron lens, degrading focus quality.

Object and Structure of the Invention The present invention has been made in view of the problems of the above-mentioned background art, and when assembled using a grid or an assembly that makes up the grid, an electronic lens of the grid or an assembly that makes up the grid. Automation of parts precision measurement and production by increasing the diameter of the electron beam passage hole of the electrode element that does not constitute the electron lens by 41 m, or 0.04 to 0.301 m, for the electrode element that constitutes the electron lens. The present invention aims to provide an electron gun assembly that can be expected to improve alignment measurement accuracy and focus quality, and a method for manufacturing the same.

Embodiment of the Invention Next, the main part of the structure of a QPF as an embodiment of the invention will be explained with reference to FIG.

That is, QpyQ& consists of a cathode with a heater wheel installed inside, a first grid, a second grid, two cap-shaped electrode elements (46*), (46m), and one plate-shaped electrode element (468). 3rd grid consisting of 12 cap-shaped electrode elements (471), 4th grid consisting of (47*), 2@ character 4 cap-shaped electrode elements (481)
) - (48t), a first assembly (48a) consisting of one plate-shaped electric element (48m), and two cap-shaped electrode elements (484).

(48m) and a second assembly (48b) consisting of one flat electrode element (48@) - 12 cap-shaped electrode elements (491), (49m)
and a sixth grid 0I consisting of one flat electrode element (49m), and these heaters, cathodes (c), and the first
Grid-1 2nd grid (c), 3rd grid (c)
, 4th grid (4η, 5th grid - 1, 6th grid 4, respectively) are planted on the insulating support rod (to) via the planting part so as to have a predetermined interval, and the 3rd grid (to), the 4th grid (to), The grid (471) and the fifth grid (1+c form a unipotential electron lens, and the fifth grid -
It is almost the same as the conventional one that a pi-potential type electron lens is formed by the and sixth grid (c), but in this example, out of these grids and assemblies, the electron lens is not formed. Electrode element (48*
), (48s) - (48th'), (48・), (4
9), (49*) are the diameters of the electron beam passage holes of the electrode elements (48+), (48,)- that constitute the electron lens.
(49t) is made larger than the rim of the electron beam passage hole, and the degree of this enlargement is 0.04 to 0.30.

Next, how to assemble grids and assemblies is explained in Figures 8 and 9.
This will be explained using figures.

That is, the large diameter II (52t) and the small diameter 81 (52t) are mounted on the surface plate 61).
A cap-shaped electrode element (48,) that does not constitute an electron lens, a flat electrode element (48,), and a cap-shaped electrode that constitutes an electron lens are mounted on an assembly jig in which a positioning center rod 64 having a diameter of 2 m) is implanted. Insert the cap-shaped electrode element (481) in the order of Jig (to), @, 6? ),
@.

- to determine the positions of the four reference planes provided on the outer circumference ζ of the flat electrode element (48a) and the center rod. In this case, use a positioning jig trowel as shown in Figure 1.

In the direction of the arrow (F
, ), (F*) is applied to the flat electrode (48). Next, the cap-shaped electrode element (484)
.

(48s) and the flat electrode element (48・) at the welding point Iυ
Resistance welding or laser welding is then performed to complete the second assembly (48b). This manufacturing method is the same for the #Il assembly (48a) and the sixth grid (9).The other grids are assembled by the same manufacturing method as that of FIG.

A grid having such a structure is assembled as an electron gun assembly in a manner similar to that shown in FIG.
), of the 6th grid 4, for example, the 2nd grid of the 5th grid 4
In the assembly (lb), as shown in Fig. 10, when the diameter of the electron beam passage hole of the cap-shaped electrode element (48 g) constituting the electron lens is set to (φ, ) as in Fig. 1. , the diameter (φ4) (φ,) of the electron beam passage hole of the flat electrode element (48@) and the cap-shaped electrode element (484) that does not constitute an electron lens is formed to be large, for example, φ-
When it is set to 3.9, it becomes (φ4) (φ fly 4.0-).

The electron gun assembly constructed in this manner has the following advantages.

First, it is possible to automate parts accuracy measurement. That is, since the diameter of the electron beam passage hole constituting the electron lens is the minimum diameter, optical measurement using transmitted light is possible with high accuracy.

Second, the productivity of the electron gun assembly is improved. That is.

Beep/Gue I! 4, the only electrode element that slides onto the center rod is that which constitutes the electron lens, allowing for smooth component insertion.

The assembly accuracy of the 31st electron gun assembly is improved. . That is, the first
As shown in Figure 1, in the beading process, a cap-shaped electrode element (491) constituting the fourth electron lens of the sixth grid is deformed as shown in the figure.

When the $I2 assembly (48b) of the fifth grid 4 is placed through the spacer 341, the second assembly (48b)
Cap-shaped electrode element (484), flat plate-shaped electrode element (
48g) has a large electron beam passage hole, the cap-shaped electrode element < 481) and the cap-shaped electrode element (49t
) uniformly hits the spacer, so that the cap-shaped electrode element (48,) and the cap-shaped electrode element (49□
) Assembly accuracy is improved without affecting the electronic lens formed between the two.

Fourth, the electron gun structure alignment measurement stacking is improved. That is, the measurement accuracy is improved because the electron beam passage hole of the electrode element that does not constitute the electron lens does not interfere with the measurement.

Fifth, focus quality is improved. That is, even if an electrode element that does not constitute an electron lens is off-center, the diameter of the electron beam passage hole is large, so the electric field that forms the electron lens is not disturbed, so there is no distortion of the electron beam, and the focus quality is improved. In the example described above, QPF was used as the electron gun structure, but this is not limited to QPF (UP
It also applies to F and BPF.

In addition, although a cylindrical so-called bar 7 ring is used in the electron beam passage hole of the electrode element constituting the electron lens, the present invention is not limited to this, and one side may be a flat electrode element. .

Furthermore, as shown in Fig. 12, instead of the flat electrode element, a flat metal plate (411y) used only for the implanted part may be used. The elements (No. 48) and (481) can be extended to serve as the implanted part (48,), or the implanted part (48.) can be added to the outer periphery of the cap-shaped electrode element (4&) as shown in Fig. 14. Fixed element (4
The same applies to the case where an implanted portion (481) is further provided on the top surface of 84). However, the same reference numerals as in FIG. 10 in FIGS. 12wJ to 15 indicate the same parts or the same diameters, and special numbers will not be explained.

Effects of the Invention As described above, according to the electron gun assembly of the present invention, the diameter of the electron beam passing hole of an electrode element that does not constitute an electron lens is smaller than the diameter of the electron beam passing hole of an electrode element that constitutes an electron lens. By increasing the size of parts) IJf measurement can be automated, improving productivity 1 Improving assembly accuracy, alignment) 8
Its industrial value is extremely large as it improves the 111 constant accuracy and focus quality.

[Brief explanation of the drawing]

1 to 5 are diagrams showing the electron gun assembly of the prior application and its method of use A, in which FIG. 1 is a sectional view of the electron gun assembly, FIG. 2 is a plan view showing the manufacturing process of the assembly, Figure 3 is the same as Figure 2.
- A sectional view taken along the incoming line, and FIG. 4 is an explanatory diagram of the method for manufacturing the electron gun assembly. FIG. 5 is a cross-sectional view of the assembly, FIG. Figure 7 is a cross-sectional view of the electron gun assembly, Figure 8 is a plan view showing the manufacturing process of the assembly, Figure 9 is a cross-sectional view of Figure 8 taken along B-Bli, and Figure 8 is a cross-sectional view of the electron gun assembly. Figure 10 is a cross-sectional view of the assembly, Figure 11g is an explanatory cross-sectional view showing one of the advantages of this embodiment, and Figures 12 to 1s show assemblies applicable to other embodiments of the present invention. FIG. 2.42...Heater 3,43...Cathode 4
．． 44...1st grid 5.45...2nd grid 6.46...3rd grid 7.47...4th grid 8.48=5th grid 8m, 8b, 48m,
48b = assembly 9.49...6th grid 12,2
3.52...Center stick agent Patent attorney Inoue −
Male Figure 1 Figure 2 Figure 4 Figure 5 Figure 7 Figure 7 2/

Claims (3)

[Claims] (1) At least one grid consisting of a plurality of grids and other electrodes, in which at least one of the grids positions and assembles two electrode elements, each of which is provided with an I electron beam passage hole. In the electron gun assembly, the plurality of grids and other electrodes are implanted on an insulating support rod via implantation portions, and one of the electron beam passage holes provided in the assembly is , characterized in that the diameter of the electron beam passage hole of the electrode element that does not constitute the electron lens is larger than the diameter of the electron beam passage hole of the electron a-passage element that constitutes the electron lens. Electron gun structure. (2) The electron gun assembly according to claim 1, wherein the degree of increase is 0.04 to 0.31 Wl. (3) Consisting of a plurality of grids and other electrodes, at least one of the grids being at least one assembly formed by positioning and assembling two electrode elements each provided with an electron beam passage hole. , in the method for manufacturing an electron gun assembly in which the plurality of grids and other electrodes are implanted on an insulating support rod via implantation parts, of the two electrode elements constituting the assembly; forming the diameter of the electron beam passing hole of the electrode element that does not constitute the other electron lens to be larger than the diameter of the electron beam passing hole of one of the electrode elements constituting the lens; 1. A method of manufacturing an electron gun assembly, comprising at least the steps of assembling and fixing, and stacking the plurality of grids and other electrodes via spacers and center rods.