JPS5890151A - Direct emission spectrochemical analyzer for large size metal material - Google Patents

Direct emission spectrochemical analyzer for large size metal material

Info

Publication number
JPS5890151A
JPS5890151A JP18886581A JP18886581A JPS5890151A JP S5890151 A JPS5890151 A JP S5890151A JP 18886581 A JP18886581 A JP 18886581A JP 18886581 A JP18886581 A JP 18886581A JP S5890151 A JPS5890151 A JP S5890151A
Authority
JP
Japan
Prior art keywords
plasma
metal material
pipe
metal
tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18886581A
Other languages
Japanese (ja)
Other versions
JPS6214773B2 (en
Inventor
Akihiro Ono
小野 昭紘
Masao Saeki
佐伯 正夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP18886581A priority Critical patent/JPS5890151A/en
Publication of JPS5890151A publication Critical patent/JPS5890151A/en
Publication of JPS6214773B2 publication Critical patent/JPS6214773B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

PURPOSE:To perform a simple and rapid analysis of a metal material, by a method wherein an opening end of a cylinder tube having a plasma arc heater is brought into contact with a metal surface to evaporate it into a metallic fine particle, which, in turn, is conveyed by a gas carrier to an emission spectrochemical analyzer having a plasma exciting source. CONSTITUTION:A surface of a metal material 3 is fused by a plasma arc heater 4 of an enclosure type cylinder tube 2 for producing a fine particle whose opening end is brought into contact with a large size metal material 3, and a metallic fine particle is evaporated. A given quantity of the metallic fine particle is conveyed by a gas carrier through a conveyance gas distributor 12 to an emission spectrochemical analyzer 27 provided with a plasma exciting source to produce a plasma flame 18. This permits the simple and rapid analysis of a large size metal material without cutting of the material to a sample.

Description

【発明の詳細な説明】 本発明は、金属製造業に於て最も活用されておシ、採取
した一定形状の試料片を対象とする固体発光分光分析装
置にかわって、試料片を採取せず大形金属材等を直接分
析する発光分光分析装置に関するものである。
[Detailed Description of the Invention] The present invention is most utilized in the metal manufacturing industry, and is an alternative to a solid-state emission spectrometer that targets sample pieces of a fixed shape. This invention relates to an optical emission spectrometer that directly analyzes large metal materials and the like.

金属製造業に於て金属や合金の製造工程あるいは製品の
品質管理には、その主成分や含有される微量成分の分析
が必須である。この分析には一般に、金属試料片と対電
極間に高電圧をかけてス・や−り放電あるいはアーク放
電等を行わせ、蒸発した各成分に基づく励起光のスペク
トル線強度から試料中の各成分の含有率を求める固体発
光分光分析法が最も活用されている。しかし、本分析法
は放電を行わせる装置構造等から試料形状に一定の制限
を受け、通常15mmφ以上の平面をもった試料片を準
備しなければならない。しかし、金属の製造工程に於て
は、上述のような試料片を切り出すために相当の労力や
時間を要する場合、製品等で試料片の採取を極力避けた
い場合あるいは製造工程の途中でオンラインで迅速に分
析しなければならない場合など試料採取が困難々場合が
多い。このような理由から、分析試料を採取せず金属板
。
In the metal manufacturing industry, analysis of the main components and trace components contained in metals and alloys is essential for quality control of metal and alloy manufacturing processes and products. For this analysis, a high voltage is generally applied between the metal sample piece and a counter electrode to cause a spray discharge or arc discharge, and the spectral line intensities of the excitation light based on the evaporated components are measured. Solid-state emission spectrometry, which determines the content of components, is most commonly used. However, this analytical method is subject to certain limitations on the shape of the sample due to the structure of the device that generates the discharge, etc., and it is usually necessary to prepare a sample piece with a flat surface of 15 mmφ or more. However, in the metal manufacturing process, if it takes a considerable amount of effort and time to cut out the sample pieces as described above, if you want to avoid collecting sample pieces for products as much as possible, or if you want to cut out sample pieces as much as possible, It is often difficult to collect samples when rapid analysis is required. For this reason, samples for analysis were not collected from the metal plate.

角材、棒材等を簡単、迅速に直接分析することができる
新規分析装置の開発が強く要請されていた。
There has been a strong demand for the development of a new analytical device that can directly analyze square timbers, bars, etc. easily and quickly.

本発明はかかる必要性に鑑み、プラズマアーク加熱−蒸
発微粒子搬送−プラズマ励起発光分光分析法を基本原理
とし、大形金属材を直接簡単、迅速に高精度で分析でき
る新規分析方法及び装置を提供するものである。
In view of this need, the present invention provides a new analysis method and device that can directly analyze large metal materials easily, quickly, and with high precision, based on the basic principles of plasma arc heating, evaporated particulate transport, and plasma excitation emission spectrometry. It is something to do.

第1図に示した本発明実施例装置に基づいて本発明の詳
細な説明する。
The present invention will be explained in detail based on the embodiment of the present invention shown in FIG.

本発明装置は大別すると微粒子発生装置1.微粒子搬送
管6.搬送気体分配装置12及びプラズマ励起源を有す
る発光分光分析装置27から構成される。微粒子発生装
置1は金属材表面にプラズマアークを照射して金属面の
一部を加熱溶解し、金属の組成を代表する微粒子を煙状
に蒸発させる働きをする部分である。微粒子発生用円筒
管2は底部が開口しておシ、その端面は水平となってい
て金属材3の表面上に設定すると密閉状態となる。
The apparatus of the present invention can be roughly divided into particulate generators: 1. Particulate transport pipe 6. It consists of a carrier gas distribution device 12 and an emission spectrometer 27 having a plasma excitation source. The particulate generator 1 is a part that irradiates the surface of a metal material with a plasma arc, heats and melts a part of the metal surface, and evaporates particulates representing the composition of the metal in the form of smoke. The cylindrical tube 2 for generating fine particles has an open bottom and a horizontal end surface, so that when it is set on the surface of the metal material 3, it becomes airtight.

プラズマアーク加熱装置4は円筒管2上部に取付けられ
、プラズマ発生管5は金属材3表面に対向して垂直に取
付けられていて両者間は通常5〜10cm程度の間隔が
ある。円筒管2の分析対象金属材面への設定の仕方は金
属相3に対して上方、下方あるいは横の方向からでも差
しつかえない。微粒子発生装置は小型のもので携帯可能
である。金属材3の表面はプラズマアーク加熱装置4の
プラズマ発生管5から発生するプラズマ炎によってその
一部分が短時間で溶解され、過熱状態を呈して金属材の
組成を代表する微粒子を蒸発する。プラズマアークの代
りにス・七−ク放電、アーク放電、電子ビームあるいは
レーザービーム等の加熱源も適用できるが、プラズマア
ーク加熱による方法が金属の溶解が速く、微粒子の蒸発
速度も速く、又加熱湯度も高くできるので蒸発しにぐい
成分も容易に蒸発でき、分析精度の向上及び分析時間の
短縮に有利である。プラズマ炎の発生口5を金属材3表
面に対向した直上位置に設定する理由は、加熱及び微粒
子の蒸発を効率よく行うこと及び蒸発微粒子の搬送管6
への搬送を効率よ〈実施することにある。プラズマ炎を
金属3の表面に対しである傾斜角をもって照射した場合
は、特に蒸発した微粒子はプラズマ炎が金属面で反対方
向に反射される際にそのプラズマ炎の流れに乗って拡散
してし捷い搬送管6への搬送に支障をきたす。蒸発した
微粒子はプラズマ発生管5の外周に狭い隙間をもって同
心円の2重管として設置した微粒子搬送管6へ運び込ま
れる。金属材3表面より煙状となって蒸発する微粒子は
、プラズマ炎の高温による対流から、通常金属材面から
上方に移動してゆき、そのあと一部は上部からプラズマ
炎に入り込み、一部は周囲に拡散する。金属材中の成分
量を分析する本発明に於ては、微粒子を単に補集する場
合とは異なり、蒸発微粒子の全量あるいは常時安定した
一定割合の量を搬送気体と共に分析装置27(5) へ送シ込まなければ々らず、より効率の良い微粒子の搬
送技術が必要になる。本発明では金属面よシ蒸発して直
上方向に立ち昇った微粒子を周囲への拡散を防ぎ、やは
多金属表面の上方を搬送管6の入口へ向って流れる搬送
気体の流れに乗せて迅速に運び去る方法をとった。すな
わち、微粒子はプラズマアークが当って溶解した金属表
面からプラズマ炎を中心に上昇しては再び金属面に戻る
対流を起している。一方、円筒管2の上部ないしは側部
に取付けられた搬送気体吹込み口9よす導入された搬送
気体は出口がプラズマ発生管5の周囲に設けられた微粒
子搬送管6のみなので、プラズマ炎を中心とした金属材
の上方から同搬送管6へ入り込む気体の流れが形成され
ている。従って、蒸発して上昇してきた微粒子はその搬
送気体の気流に引き込捷れて、常時一定の希釈倍率をも
って搬送管6へ送り込まれる。故に第1図に示すように
プラズマアークが照射する金属材表面の直上に搬送管6
を設けるのがよい。プラズマ発生管5の外径は通常10
wnφ程度の小型のものを用い、従っ(6) て搬送管6の外径も15〜20欄φと小径である。プラ
ズマアークの電圧、電流及びArあるいはHe等の気体
の吹込み流量にも左右されるが、通常プラズマアーク発
生管5の長さよりもその外周に設けた搬送管6を多少短
かくすることにより、スプラッシュなどによる粗大粒子
は金属3面へ戻シ微細粒子のみが搬送される。
The plasma arc heating device 4 is attached to the upper part of the cylindrical tube 2, and the plasma generating tube 5 is attached perpendicularly to the surface of the metal material 3, with a distance of usually about 5 to 10 cm between the two. The cylindrical tube 2 may be placed on the surface of the metal material to be analyzed from above, below, or lateral to the metal phase 3. The particle generator is small and portable. A portion of the surface of the metal material 3 is melted in a short time by the plasma flame generated from the plasma generation tube 5 of the plasma arc heating device 4, and the surface becomes overheated, evaporating fine particles representative of the composition of the metal material. Heating sources such as spark discharge, arc discharge, electron beam, or laser beam can be used instead of plasma arc, but plasma arc heating melts metals quickly, evaporates fine particles quickly, and Since the hot water temperature can be increased, components that are difficult to evaporate can also be easily evaporated, which is advantageous in improving analysis accuracy and shortening analysis time. The reason why the plasma flame generation port 5 is set at a position directly above the surface of the metal material 3 is to efficiently heat and evaporate the particles, and to provide a transport tube 6 for the evaporated particles.
The aim is to carry out transportation efficiently. If the plasma flame is irradiated with a certain angle of inclination to the surface of the metal 3, the evaporated particles will be spread along with the flow of the plasma flame when the plasma flame is reflected in the opposite direction from the metal surface. Transfer to the shunting transfer pipe 6 is hindered. The evaporated particulates are carried into a particulate transport pipe 6 which is installed as a concentric double pipe around the outer periphery of the plasma generation tube 5 with a narrow gap. The fine particles that evaporate in the form of smoke from the surface of the metal material 3 usually move upward from the metal surface due to convection caused by the high temperature of the plasma flame, and then some of them enter the plasma flame from above, and some of them evaporate from the surface of the metal material 3. spread to the surrounding area. In the present invention, which analyzes the amount of components in metal materials, unlike the case where fine particles are simply collected, the entire amount of evaporated fine particles or a constantly stable constant proportion is sent to the analyzer 27 (5) together with a carrier gas. Therefore, a more efficient particle transport technology is required. In the present invention, the fine particles that evaporate from the metal surface and rise directly above are prevented from dispersing to the surroundings, and are quickly carried on the flow of the carrier gas flowing above the multi-metal surface toward the entrance of the carrier pipe 6. I took a method to carry it away. That is, the fine particles rise from the metal surface that has been melted by the plasma arc, rise around the plasma flame, and return to the metal surface again, causing convection. On the other hand, the carrier gas introduced through the carrier gas inlet 9 attached to the top or side of the cylindrical tube 2 has only one outlet, the particulate carrier tube 6 provided around the plasma generation tube 5, so that the plasma flame is A gas flow is formed that enters the conveying pipe 6 from above the central metal material. Therefore, the fine particles that have evaporated and risen are drawn into the airflow of the carrier gas and are sent into the carrier pipe 6 at a constant dilution ratio. Therefore, as shown in FIG.
It is good to have a The outer diameter of the plasma generation tube 5 is usually 10
A small pipe of approximately wnφ is used, and therefore, the outer diameter of the conveying tube 6 is also small, 15 to 20 columns φ. Although it depends on the voltage and current of the plasma arc and the flow rate of gas such as Ar or He, by making the conveying tube 6 provided around the outer periphery of the plasma arc generating tube 5 a little shorter than the length of the plasma arc generating tube 5, Coarse particles caused by splashing are returned to the three metal surfaces, and only fine particles are transported.

7はスプリング等による押圧力をもった電極棒で金属3
0表面に接している。通常プラズマアーク加熱装置4に
は負電位が与えられ、金属材3には正電位が与えられる
。円筒管2は電気絶縁性。
7 is an electrode rod with a pressing force such as a spring, and metal 3
0 is in contact with the surface. Normally, a negative potential is applied to the plasma arc heating device 4, and a positive potential is applied to the metal material 3. The cylindrical tube 2 is electrically insulating.

熱伝導性に富む材質のもので製作するのがよく、機械加
工性にも富む窒化ホウ素が最適であったが、アルミナや
マグネシアなどの耐火材でもよい。又、円筒管2け微粒
子の拡散を防止するために極力小径のものを用い、内容
積を小さくする。
It is best to make it from a material with good thermal conductivity, and boron nitride, which has good machinability, was the most suitable material, but it may also be made of a refractory material such as alumina or magnesia. In addition, in order to prevent the diffusion of particles into two cylindrical tubes, a tube with as small a diameter as possible is used to reduce the internal volume.

微粒子の蒸発発生速度及び粒径は、蒸発させる雰囲気の
圧力、加熱温度、雰囲気気体の種類などによって影響さ
れる。微粒子の粒径は、プラズマ励起源を有する発光分
光分析に於て定量精度に影響するので特に重要であり、
粒径を極力小さくしかつその粒度分布を整えることが必
要である。本発明によって鉄鋼を対象に発生させた微粒
子を電。
The evaporation rate and particle size of fine particles are influenced by the pressure of the evaporating atmosphere, the heating temperature, the type of atmospheric gas, and the like. The particle size of fine particles is particularly important as it affects the quantitative accuracy in emission spectroscopic analysis that uses a plasma excitation source.
It is necessary to make the particle size as small as possible and to adjust the particle size distribution. The fine particles generated for steel by the present invention are electrolyzed.

子顕微鏡観察によって調査したところ、その粒径は大略
01μm以下の極めて微細粒子であり、粒度分布の巾も
狭く、プラズマ発光分光分析には最適であった0 蒸発微粒子は搬送気体に乗せられて搬送管6を通って搬
送気体分配装置12に搬送されるが、本発明のように微
粒子を対象に分析を行う場合にはこの部分の内壁等に微
粒子を付着残留させないことが最も重要な問題になる。
When investigated by microscopic observation, the particle size was found to be extremely fine, approximately 0.1 μm or less, and the width of the particle size distribution was narrow, making it ideal for plasma emission spectroscopic analysis.0 The evaporated fine particles were carried on a carrier gas. The gas is conveyed through the pipe 6 to the carrier gas distribution device 12, but when analyzing fine particles as in the present invention, the most important issue is to prevent the fine particles from adhering to and remaining on the inner walls of this part. .

微粒子発生用円筒管2内はプラズマアーク加熱による高
熱によって内壁が加熱されているので微粒子は付着しに
くくあ捷り問題はないが、搬送管6は温度が低下して付
着残留が起り易くなる。微粒子の付着残留は、搬送気体
中の微粒子の#度が変動したり、次の金属材の分析に移
った際のコンタミネーションとなって正確々分析値が得
られなくなる。蒸発微粒子は遅く静かな気体の流れによ
る搬送や温度の低下によって微粒子間の凝集や壁面への
付着残留が起り易くなる。従って、搬送管7はなるべく
小径として搬送気体の流速を速くする必要があわ、第1
図に示す如く加熱装置j1を設けて常時加熱しておく、
あるいは搬送管6内面に加工を施すが、管6を乱線状と
するなどして搬送気体を乱流とする方法などが有効であ
る。又、搬送管を数十mのように長尺とする場合には、
微粒子の多少の残留が起り易くなるが、この場合には微
粒子の残留割合を常時−重化するように搬送条件を考慮
し、なおかつ1試料の分析終了時点でそれらを確実に除
去するようにして次の試料に対するコンタミネーション
を防ぐことができた。種々の実験の結果、管内壁等に付
着した微粒子は付着稜短時間の内に搬送気体を高速で吹
きつけることにより容易に剥離して排除できることが判
明したので、1試料の分析終了直後に搬送気体の吹込み
流量を増大させて除去する方法を採用した。この搬送気
体の流量制御は、円筒管2に取付けられた吹込み管9に
接続する搬送気体供給装M8の流量調節器1oの自動切
(9) 替操作で実施した。搬送気体の流1調節は例えば、分析
すべき金属材に円筒管を設定する時点で10〜1511
y情nで流して円筒管内を不活性雰囲気に置換し、次に
プラズマアーク加熱する時は3〜5717m1nの一定
流童で流して蒸発微粒子を搬送し、数分間以内で行われ
るプラズマ発光強度の測定終了直後に10〜207/m
in  の高速で流して円筒管2.搬送管6.搬送気体
分配装置12等の内部に残存する可能性のある浮遊微粒
子及び付着残留倣粒子を剥離して系外に除去する方法を
採っに0 微粒子搬送管6は搬送気体分配装置12に接続される。
Since the inner wall of the cylindrical particle generating tube 2 is heated by high heat generated by plasma arc heating, particles are difficult to adhere to and there is no problem of sloshing, but the temperature of the conveying tube 6 decreases, making it easier for particles to remain attached. The residual adhesion of fine particles may cause fluctuations in the number of fine particles in the carrier gas, or may cause contamination when the next metal material is analyzed, making it impossible to obtain accurate analytical values. Evaporated fine particles tend to aggregate or remain attached to the wall surface due to transport by slow and quiet gas flow or a drop in temperature. Therefore, it is necessary to make the diameter of the transport pipe 7 as small as possible to increase the flow rate of the transport gas.
As shown in the figure, a heating device j1 is provided to keep heating at all times.
Alternatively, it is effective to process the inner surface of the conveying tube 6, such as by making the tube 6 into a turbulent line shape to create a turbulent flow of the conveying gas. In addition, when the conveyor pipe is long, such as several tens of meters,
It is likely that some fine particles will remain, but in this case, consider the transport conditions so that the proportion of fine particles remaining is constant, and be sure to remove them at the end of the analysis of one sample. Contamination of the next sample could be prevented. As a result of various experiments, it was found that fine particles adhering to the inner wall of the tube can be easily peeled off and removed by blowing carrier gas at high speed within a short period of time on the adhesion edge. A method of removing the gas by increasing the gas blowing flow rate was adopted. This flow rate control of the carrier gas was carried out by automatic switching operation (9) of the flow rate regulator 1o of the carrier gas supply device M8 connected to the blowing pipe 9 attached to the cylindrical pipe 2. The flow 1 adjustment of the carrier gas is, for example, 10 to 1511 at the time of setting the cylindrical tube to the metal material to be analyzed.
The inside of the cylindrical tube is replaced with an inert atmosphere by flowing at a constant flow rate of 3 to 5,717 m1n when plasma arc heating is performed. 10-207/m immediately after measurement
in a cylindrical tube 2. Conveying pipe 6. A method is adopted to remove floating particles and adhered trace particles that may remain inside the carrier gas distribution device 12 etc. and remove them from the system.The particle transfer pipe 6 is connected to the carrier gas distribution device 12. .

搬送気体分配装置12は、搬送管6より搬送気体と共に
送られてきた微粒子を一旦空間部で拡散させ更に絢−化
をはかる、プラズマ部20へ導入する搬送気体の最適流
量を得るためにある一定部分を系外に排出して搬送気体
の分配を行うあるいは搬送されてくる間に凝集が進んで
特に粗大化した粒子を系外に排除して微細粒子のみをプ
ラズマ部20へ送り込むための分粒などを行う働きをす
る部分である。分配装置12ば、外周に加(10) 熱装置11を取付けた小径の円筒管で微粒子搬送管6を
側壁より挿入して管床端部を上向きに、又微粒子導入管
15を円筒管の上部より搬送管末端部と相対するように
一定間隔をもって垂直に取付け、円筒管底部に流量調節
器14を備えた排出管13を取付けである。この3本の
管はいずれも10諭φ程度の細管であり、粗大粒子及び
分配された微粒子は余剰の搬送気体と共に底部排出管1
3より糸外に排出され、残シの微粒子は一定流量の搬送
気体と共に導入管15へ導入される。流量調節器]4は
上述の搬送気体供給装置8の流量調節器10の作動と連
動させる。
The carrier gas distribution device 12 operates at a certain level in order to obtain an optimal flow rate of the carrier gas introduced into the plasma section 20, which once diffuses the fine particles sent together with the carrier gas from the carrier pipe 6 in the space and further agglomerates them. Particle sizing for discharging the part out of the system and distributing the carrier gas, or for sending only fine particles to the plasma section 20 by eliminating particles that have become particularly coarse due to agglomeration progressing while being transported out of the system. This is the part that performs the following functions. The distribution device 12 is heated on the outer periphery (10).The particle transport tube 6 is inserted from the side wall of a small diameter cylindrical tube to which the heating device 11 is attached, with the tube bed end facing upward, and the particle introduction tube 15 is inserted into the upper part of the cylindrical tube. The discharge pipe 13 equipped with a flow rate regulator 14 is installed at the bottom of the cylindrical pipe, and is installed vertically at a constant interval so as to face the end of the conveying pipe. These three pipes are all thin pipes with a diameter of about 10 mm, and coarse particles and distributed fine particles are removed from the bottom discharge pipe along with excess carrier gas.
3 and the remaining fine particles are introduced into the introduction pipe 15 together with a constant flow rate of the carrier gas. The flow rate regulator] 4 is interlocked with the operation of the flow rate regulator 10 of the carrier gas supply device 8 described above.

微粒子導入管】5はプラズマ励起発光分光分析装置27
に接続される。導入された微粒子は図示する如く導入管
15.プラズマガス供給管16゜冷却ガス供給17から
成る3重管のプラズマトーチ18に運び込まれ、高周波
発生装置19によって形成される高温のプラズマ部20
に達して励起発光される。実施例では、プラズマガスに
はArを1〜1.517m1n 、冷却ガスにはArを
10〜1.51Aniru微粒子搬送気体にはArを0
5〜1 l/minで流して実施した。励起された微粒
子の発光スペク]・ルは集光レンズ21によって集めら
れ、スリット、反射鏡232回折格子24からなる分光
器22によって分光され、光電子増巾管から成る検出器
25゜成分含有率算出装置26によって各々のスペクト
ル線強度が測定され、分析試料中の各成分含有が迅速に
求められる。微粒子を励起発光させる分析装置27には
高周波誘導結合型発光分光分析装置が最も適していたが
、そのほかの各種アーク放電。
[Particle introduction tube] 5 is a plasma excitation emission spectrometer 27
connected to. The introduced fine particles are transferred to the introduction pipe 15 as shown in the figure. A high-temperature plasma portion 20 is carried into a triple-pipe plasma torch 18 consisting of a plasma gas supply pipe 16° and a cooling gas supply 17, and is generated by a high-frequency generator 19.
When it reaches this point, it is excited and emits light. In the example, the plasma gas contained 1 to 1.517 ml of Ar, the cooling gas contained 10 to 1.51 ml of Ar, and the particle transport gas contained 0 Ar.
It was carried out at a flow rate of 5 to 1 l/min. The emission spectrum of the excited particles is collected by a condensing lens 21, separated by a spectroscope 22 consisting of a slit, a reflecting mirror 232, and a diffraction grating 24, and a detector 25 consisting of a photomultiplier tube calculates the component content. The intensity of each spectral line is measured by the device 26, and the content of each component in the analysis sample can be quickly determined. Although a high-frequency inductively coupled emission spectrometer was most suitable for the analyzer 27 that excites fine particles to emit light, other types of arc discharge can be used.

グロー放電等のプラズマ励起発光分光分析装置あるいは
原子吸光分析装置などを使用できる。
A plasma excitation emission spectrometer such as a glow discharge or an atomic absorption spectrometer can be used.

本発明によれば、分析すべき金属材表面へ微粒子発生用
円筒管2を設定して微粒子を発生させて試料中の各成分
の含有率を求めるまでの分析所要時間は約5分以内の短
時間でほとんど人手を用いないで簡単に分析することが
できる。定量精度についても試料片を切シ出して発光分
光分析法によって分析する方法に比べて遜色のない良好
な結果が得られた。以上説明したように本発明によって
これ甘で直接分析が困難であった大形の金属材について
試料片の採取などを行わずに簡単、迅速に多成分を同時
に分析できる直接発光分光分析が可能になった。本発明
は鉄鋼スラブの品質管理のための成分偏析分析、異鋼種
連続鋳造に於けるスラブの継目位置を検出するための直
接分析、製品鉄板の鋼種判別のための直接分析、赤熱状
態の半製品の成分チェックのための直接分析あるいは溶
銑や溶鋼のオンライン直接分析などに適用できる。
According to the present invention, the time required for analysis from setting the particle generation cylindrical tube 2 to the surface of the metal material to be analyzed, generating particles, and determining the content of each component in the sample is about 5 minutes or less. It can be easily analyzed in time and with almost no human effort. In terms of quantitative accuracy, good results were obtained that were comparable to the method of cutting out a sample piece and analyzing it by emission spectrometry. As explained above, the present invention has made it possible to perform direct emission spectroscopic analysis, which can easily and quickly analyze multiple components at the same time, without having to collect sample pieces, for large metal materials, which has been difficult to analyze directly. became. The present invention is applicable to component segregation analysis for quality control of steel slabs, direct analysis for detecting the joint position of slabs in continuous casting of different steel types, direct analysis for determining the steel type of product steel plates, and semi-finished products in a red-hot state. It can be applied to direct analysis to check the composition of metals or online direct analysis of hot metal or molten steel.

本発明は試料片の切シ出し等の作業を省略し、金属材中
の各成分量を簡単、迅速に分析できる新規分析装置を提
供したものであり、この分野に於て多大の貢献を成すも
のである。
The present invention provides a new analytical device that can easily and quickly analyze the amount of each component in metal materials by omitting operations such as cutting out sample pieces, and has made a significant contribution to this field. It is something.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明実施例装置の説明図である。 1・・・微粒子発生装置  2・・・微粒子発生用円筒
管3・・・金属材         4・・・プラズマ
アーク加熱装置6・・・微粒子搬送管   7・・・対
電極8・・・搬送気体供給装置 12・・・搬送気体分
配装置15・・・微粒子導入管  18・・・プラズマ
トーチ(13) 22・・・分光器 27・・・プラズマ励起源を有する発光分光分析装置(
■4)
FIG. 1 is an explanatory diagram of an apparatus according to an embodiment of the present invention. 1... Particulate generator 2... Cylindrical tube for particulate generation 3... Metal material 4... Plasma arc heating device 6... Particulate transport tube 7... Counter electrode 8... Carrier gas supply Device 12...Carrier gas distribution device 15...Particle introduction pipe 18...Plasma torch (13) 22...Spectrometer 27...Emission spectrometer having a plasma excitation source (
■4)

Claims (1)

【特許請求の範囲】 上部ないしは側部に流量の調節が自在な微粒子搬送用気
体供給装置に接続する吹込み管及び一端をプラズマ放出
管の外周に狭い隙間をもって同心円状に設けて他端を搬
送気体分配装置に接続した微粒子搬送管を取付け、上部
にプラズマアーク加熱装置に接続する同プラズマ放出管
を金属材表面に垂直に取付け、底部は分析対象となる金
属材表面上に接して設定されるように端面が水平な開放
口を有した微粒子発生装置、該発生装置とを微粒子搬送
管で接続し、該搬送管末端部、発光装置への微粒子導入
管及び流量調節器を備えた余剰搬送気体の排出管を取付
けた搬送気体分配装置、該分配装置とを微粒子導入管で
接続し、微粒子導入管。 高周波誘導結合型プラズマ等のプラズマ励起源を有する
プラズマ発光装置1分光器、検出器、成分含有率演算装
置及び金属材に接したプラズマア−り加熱装置の対極等
から成るプラズマ発光分光分析装置を主体に構成するこ
とを特徴とする大形金属材の直接発光分光分析装置。
[Scope of Claims] A blowing pipe connected to a gas supply device for transporting particulates whose flow rate can be freely adjusted at the top or side, and one end of which is provided in a concentric circle with a narrow gap around the outer periphery of the plasma emission tube, and the other end is used to transport the particles. A particulate transport pipe connected to a gas distribution device is attached, and a plasma discharge tube connected to a plasma arc heating device is attached perpendicular to the metal surface at the top, and the bottom is set in contact with the surface of the metal material to be analyzed. A particulate generator having an open opening with a horizontal end surface as shown in FIG. A carrier gas distribution device is equipped with a discharge pipe, and the distribution device is connected to the particle introduction pipe by a particle introduction pipe. Plasma light emitting device with plasma excitation source such as high-frequency inductively coupled plasma 1 Plasma light emission spectrometer consisting of a spectrometer, a detector, a component content calculation device, a counter electrode of a plasma arc heating device in contact with a metal material, etc. A direct emission spectroscopic analysis device for large metal materials characterized by being mainly configured.
JP18886581A 1981-11-25 1981-11-25 Direct emission spectrochemical analyzer for large size metal material Granted JPS5890151A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18886581A JPS5890151A (en) 1981-11-25 1981-11-25 Direct emission spectrochemical analyzer for large size metal material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18886581A JPS5890151A (en) 1981-11-25 1981-11-25 Direct emission spectrochemical analyzer for large size metal material

Publications (2)

Publication Number Publication Date
JPS5890151A true JPS5890151A (en) 1983-05-28
JPS6214773B2 JPS6214773B2 (en) 1987-04-03

Family

ID=16231214

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18886581A Granted JPS5890151A (en) 1981-11-25 1981-11-25 Direct emission spectrochemical analyzer for large size metal material

Country Status (1)

Country Link
JP (1) JPS5890151A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6113669A (en) * 1999-02-01 2000-09-05 Seltet Llc Method and apparatus for process and quality control in the production of metal
DE10155384B4 (en) * 2001-11-10 2014-12-31 Sms Siemag Aktiengesellschaft Online quality control of continuous casting products using laser analysis

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS545488U (en) * 1977-06-14 1979-01-13

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS545488U (en) * 1977-06-14 1979-01-13

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6113669A (en) * 1999-02-01 2000-09-05 Seltet Llc Method and apparatus for process and quality control in the production of metal
DE10155384B4 (en) * 2001-11-10 2014-12-31 Sms Siemag Aktiengesellschaft Online quality control of continuous casting products using laser analysis

Also Published As

Publication number Publication date
JPS6214773B2 (en) 1987-04-03

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