JPS5896745A - Testing jig changing mechanism in automatic handler for electrical parts tester - Google Patents

Abstract

PURPOSE:To permit a testing jig to be easily changed in accordance with parts, by a method wherein a testing jig is positioned at a predetermined location, and a substrate mounted thereon is driven from one side thereof so as to be connected and secured to a signal transfer unit at the forward side thereof, and is separated therefrom by retraction. CONSTITUTION:Rails 7, 8 connected to a guide rail 6 incorporated in a testing jig 5 are fitted into grooves 20 formed in slide blocks 18 of a mounted substrate 16 thereby to prevent the displacement of the jig 5. At a portion 28, air nipples 34 and couplers 27 are coupled to each other, and a connector 36 is connected to a plug 35. When a pushbutton 37 is depressed, air flows in to advance a rod 25 until a table 16 is brought into contact with a damper 26 while being guided by rods 21. As a result, an edge 41 of a printed board 40 in the jig 5 is inserted into a connector 31 in a signal transfer unit 29 and secured. When a pushbutton 38 is depressed, the rod 25 is retracted to undo the insertion, and the jig 5 stops when abutting against the damper 26. The jig 5 can be lifted upward to be taken out. The constitution makes it possible to readily change the jig 5 with a jig having a proper guide rail 6 in accordance with a sample.

Description

Detailed Description of the Invention (1) Technical Field of the Invention The present invention is capable of testing the characteristics of electronic components such as integrated circuits (hereinafter referred to as RLCJ) and determining the quality of the test results by connecting to an electronic component desk. In an autohandler for an electronic component tester that processes automatically, the test jig can be exchanged as appropriate depending on the shape, size, etc. of the electronic component to be tested, and when replacing the test jig, the test jig can be transferred to the signal delivery section. This invention relates to a test jig exchange mechanism that allows easy connection and disconnection.

(2) Background of the technology Regarding ICs, especially SIP type ICs, the mounting position, shape, dimensions, etc. of the heat sink vary depending on the manufacturer, and the current situation is that the overall shape and dimensions of the SIP type I metal C are different. It is. Conventionally, SIPs with such various shapes and dimensions
When performing characteristic tests on type ICs, etc., there are few devices that automatically supply the SIP type IC to the measurement unit or automatically store the SIP type IC in a predetermined location after measurement. Tests were carried out by manually inserting and removing them one by one. For this reason, S of various shapes and dimensions as mentioned above.
There is a demand for an autohandler for electronic component testers that can automatically process electronic components such as IP type ICs and DIP type ICs. There is a need for a test jig conversion mechanism that allows for exchange.

(3) Purpose of the Invention The present invention has been made in response to the above-mentioned circumstances, and it is necessary to test a test jig in an autohandler for an electronic component tester that automatically processes electronic components of various shapes and sizes. It is an object of the present invention to provide a test jig exchange mechanism that allows the exchange of test jig as appropriate depending on the shape, size, etc. of electronic parts, and also allows the test jig to be easily connected to or detached from a signal transfer section when exchanging the test jig. .

(4) Structure and object of the invention According to the invention, there is provided a table inclined to one side adjacent to a control unit installed on a pedestal;
The table has a component guide rail provided in the central part of the table that runs along the inclination direction of the table, and also has a shutter section for feeding and blocking electronic components along the component guide rail, a measuring section, and a determining section. And it is replaceable.
A test jig installed at the top of the table, a supply side yatoi in which component cases containing electronic components to be tested are arranged and stored and moved horizontally by a feeding mechanism, and a supply side jig installed at the bottom of the table. The parts cases that store the electronic components after the test are arranged and stored, and the receivers, which are pitch-moved in the horizontal direction in conjunction with the supply side yato by a feeding mechanism, are located at the center of the side yatoi and the upper and lower ends of the table. The supply side yap and the receiver are respectively protruded from the side yam and have a docking mechanism section that pushes down each component case one step downward and connects it to the component guide rail of the test jig. In an autohandler for an electronic component tester, a mounting board for positioning and mounting the test jig at a predetermined position is provided at the set position of the test jig, and a drive source connection point is provided on one side of the mounting board. forward in the lateral direction by a drive device,
A retractably movable jig mounting station is provided, and a signal transfer section is provided adjacent to the setting position of the test jig on the forward side of the jig mounting station,
By placing the test jig on the jig mounting station and moving it forward, it is connected and fixed to the connector of the signal transfer section.
This is achieved by providing a test jig exchange mechanism in an autohandler for an electronic component tester, which is characterized in that it is detached by moving backward.

(5) Embodiments of the invention Hereinafter, embodiments of the invention will be described in detail with reference to the accompanying drawings.

FIG. 1 is a perspective view showing the entire autohandler for electronic component testing according to the invention. A pedestal 1 serves as a pedestal for supporting the autohandler, and a control section 2 is installed on the top surface of the pedestal 1. This control unit 2 controls the operation of the autohandler, and a control panel 3 is provided on the top surface of the control unit 2.
is provided.

A table 4 is provided on the side of the control section 2 and adjacent to the control section 2. The table 4 is inclined to one side and has an appropriate width and length. This table 4 is for setting the test jig 5, the supply side yatoi 9, the receiving side yatoi 12, etc., which will be described later.
The inclination is, for example, about 45 degrees so that electronic components such as ICs to be tested flow from the supply side to the receiving side under the action of gravity.

A test jig 5 is replaceably attached to the central portion of the table 4 in the longitudinal direction. This test jig 5 has a component guide rail 6 (see FIG. 4) provided inside thereof along the longitudinal direction, that is, the inclination direction, of the table 4, and an IC etc. The shirt has four parts that feed and cut off the air, and the center part has a measuring part where the contact bottle comes in contact with the leads of ICs, etc., and the downstream part determines whether the test results are good or bad. ,
It has a determination section that selects defective products. The upper and lower ends of the component guide rail 6 are provided with a supply (I), which will be described later.
T! The yoke 9 and the receiver are each provided with a docking guide rail 7.8 (see FIG. 4) which is shaped like a vine and into which the ends of the component cases 10.10 which are aligned and stored in the side yoke 12 are inserted. Note that this test jig 5 can be detached from the table 40 at a predetermined position and replaced with another test jig 5 having a component guide rail 6 according to the shape and dimensions of the IC, etc. to be tested. I can do it.

A supply side yatoi 9 is provided on the upper part of the table 4. This supply side yatoi 9 supplies ICs to be tested to the test jig 5, and as shown in FIG. Component cases 10 containing ICs and the like are arranged and stored. The component case 10 is formed into an elongated cylindrical shape, such as a rectangular cross section, depending on the shape and dimensions of the ICs and the like to be accommodated. The supply side yatoi 9 is moved in pitch in the direction of arrow A%B by a feeding mechanism including a drive motor, a ball screw, etc. provided in the hole 11 of the table 4.

At the bottom of the table 4, a side support 12 is provided. The side support 12 receives the IC etc. sent out from the test jig 5 after the test is completed, and as shown in FIG. Component cases 10 similar to those described above for storing ICs and the like after the test are arranged and stored. And this Ukeha side Yatoi 12 is table 4
The pitch movement is made in the direction of the arrow A%B by a feeding mechanism similar to that described above provided in the hole 13.

From the center of the upper and lower ends of the table 4, as shown in FIG.
and the docking guide rail 7.8, and the supply side gear 9 and the receiver are arranged parallel to the table 4 along the longitudinal direction above the parts case 10.10 of the side gear 12. A side docking mechanism portion 15 protrudes from the mechanism portion 14 and the receiver.

These two docking mechanism parts 14.15 are arranged in the parts cases 10.1 and stored in the above-mentioned respective gears 9.12.
0 is successively pushed downward by pressing down the presser bar provided on the lower surface thereof, and connected to the dotting guide rails 7.8 provided on the upper and lower ends of the component guide rail 6 of the test jig 5. It is something.

Test jig 5 at the longitudinal center of the table 4
As shown in FIGS. 2 and 3, a jig mounting station 16 is provided at the set position. This jig mounting station 16 is for mounting the test jig 5, and has prismatic slide blocks 1B, 1B on the upper and lower edges of the mounting board 17, and has a prismatic slide block 1B on the lower surface of the mounting board 17. It has a drive device 19 such as an air cylinder. A positioning groove 20.20 is bored in the middle of the slide block 18.1B, into which docking guide rails 7 and 8 (see Fig. 4) provided on the component guide rail 6 of the test jig 5 are fitted. has been done. This slide block 1
A hole is drilled in the shaft center of 8.18 to form a linear motion bearing, and a guide ball 21 is inserted into this hole.
．． 21 is inserted through and reaches the left and right sides [22, 23]. And the air hose 24, 24' of the drive device 19
The rod 25 expands and contracts as air or the like flows in from the guide ball 21.
21 as a guide to move forward or backward in the lateral direction, that is, in the directions of arrows C and D. At this time, a damper 26 made of urethane rubber or the like is provided at a predetermined position to reduce the impact at the most advanced position or the most retracted position. On one side of the mounting board 1T, there is a drive source connection portion 28 to which a drive source such as an air coupler 27 is connected.

As shown in FIGS. 2 and 3, a signal delivery section 29 is provided at a location adjacent to the setting position of the test jig 5 on the forward side of the jig mounting station 16. This signal delivery section 29 is for sending a signal from the measurement section of the test jig 5 to the electronic component tester, and includes a printed board connector 31 provided on the top of the mounting plate 30 or the like. In FIG. 3, reference numeral 32 is a signal line going from the printed board connector 31 to the electronic component tester, and reference numeral 33
is a shield cover.

Next, the operation of the test jig exchange mechanism in the autohandler for electronic component tester according to the present invention will be explained. First, to attach the test jig 5 to a predetermined position in the center of the table 4, as shown in FIGS. 4 and 5, the test jig 5 is brought above the jig mounting station 16.
The docking guide rails 7.8 provided at the upper and lower ends of the component guide rail 6 built into the test jig 5 are connected to the slide block 18 of the jig mounting station 16.
．． It fits into the positioning groove 20.20 drilled in 18 and is placed there. At this time, the upper end side surface and lower end extension of the test jig 5 come into contact with the inner surfaces of the upper slide block 1B and the lower slide block 18, respectively. Therefore, the test jig 5 is mounted on the upper surface of the jig mounting station 16 so as not to be displaced vertically and horizontally. Next, the air coupler 27 is connected to the air nipple 34 of the test jig 5 at the drive source connection site 28, and the connector 36 is connected to the plug 35 of the test jig 5. In this state, jig mounting station 1
When the forward side operation box 37 of 6 is pressed, the air hose 39
Air flows into the cylinder from the air hose 24 of the drive device 19 via the air coupler 27 and the air nipple 34, and the rod 25 extends in the direction of arrow C. At this time, the jig mounting station 16 has a test jig 5 on its upper surface.
The robot moves forward toward the signal delivery section 29 using the guide ball 21 as a guide.

When the jig mounting station 16 moves forward the most, as shown in FIG. The inflow of
Its advance stops. At this time, the edge portion 41 at the tip of the printed board 40 provided inside the test jig 5 shown in FIG. 5 is inserted into the printed board connector 31 of the signal transfer section 29. As a result, as shown in FIG. 6, the component guide rail 6 and docking guide rail 7.8 of the test jig 5 are located on the same axis as the supply side docking mechanism section 14 and the side docking machine section 4 section 15. Then test jig 5
is fixed at a predetermined position in the center of the table 4.

Next, to remove the test jig 5 from the table 4, press the operation button 38 on the backward side of the jig mounting station 16 shown in FIG. Air flows into the cylinder from the air hose 24' of the drive device 29 through the rod 34, and the rod 25 contracts in the direction of the arrow. At this time,
The jig mounting station 16 has a test jig 5f on its upper surface.
In the mounted state, it retreats from the signal delivery section 29 using the guide ball 21 as a guide. This retreat causes the edge portion 41 of the printed board 40 of the test jig 5 to separate from the connector 31 of the signal transfer section 29, as shown in FIG. When the jig mounting station 16 is moved back the most, as shown in FIG. The inflow of water stops and its retreat stops. In this state, if the air coupler 27 and connector 36 are disconnected from the test jig 5, the test jig 5 can be lifted upward and removed. In this way, it is possible to replace the test jig 5 with another test jig 5 having a component guide rail 6 having an appropriate shape, size, etc., depending on the shape, size, etc. of the electronic component such as an IC to be tested.

(6) Effects of the Invention Since the present invention is configured as described above, the test jig 5 can be replaced as appropriate depending on the shape, size, etc. of the electronic component to be tested. Therefore, by exchanging the test jig 5 as described above with one autohandler, characteristic tests can be performed on electronic components of various shapes and sizes. Signal transfer section 2 of the test jig 5 that was cut
Since the connection to and disconnection from the test jig 9 is performed by the drive device 19 by button operation, it is easy to insert and disconnect the edge portion 41 of the printed board 40 from the printed board connector 31, and the test jig 5 can be easily replaced. can. Furthermore, since the air coupler 27 and connector 36 are connected to the test jig 5 at the drive source connection part 28 of the jig mounting station 16, noise sources such as solenoid valves that control air inflow, cutoff, etc. It can be provided at a location away from the test jig 5, and the influence of noise on the test jig 5 due to various operations of the autohandler can be almost eliminated.

[Brief explanation of drawings]

Fig. 1 is a perspective view showing the entire autohandler for electronic component tester according to the present invention, Fig. 2 is an enlarged plan view showing the jig mounting station section, and Fig. 3 is a section III-III of Fig. 2.
Line sectional view, Figure 4 is an enlarged plane M showing the state where the test jig is placed on the jig mounting station, and Figure 5 is the v of Figure 4.
6 is a cross-sectional view of the same portion as FIG. 5, showing a test jig connected to the signal transfer section. 1... Frame, 2... Control unit, 4.
...Table, 5...Test jig,
6... Parts guide rail, 7.8...
... Dotting guide rail, 9 ... Supply side Yatoi, 10 ... Parts case, 1
2...The receiver is the side gear, 14...The supply side docking mechanism part, 15...The receiver is the side docking mechanism part, 16...The jig mounting station. , 17... Mounting board, 18...
Slide block, 19... Drive device,
20... Positioning groove, 21... Guide ball, 28... Drive source t=i thread part,
29...Signal delivery section, 31...Printed board connector, 37.38...Operation button, 40...Printed board, 41...
・Edge Applicant Fujitsu Limited (18)

Claims (1)

[Claims] A table provided adjacent to a control unit installed on a pedestal and inclined to one side, and a component guide rail provided in the center of the table and inside thereof along the direction of inclination of the table, and the component. , a replaceable test jig that has a shutter section for feeding and blocking electronic components along a guide rail, a measuring section, and a determining section; The supply side Yatoi, in which the stored component cases are stored in alignment and moved horizontally by a feeding mechanism, and the component cases installed at the bottom of the table to store electronic components after the test are stored in alignment and transported. The holder, which moves in pitch in the lateral direction in conjunction with the supply side yato by the mechanism, is jutted out above the side yato from the center of the upper and lower ends of the table, respectively. In an autohandler for an electronic component tester, the automatic handler has a docking mechanism section that sequentially pushes down each component case and connects it to the component guide rail of the test jig. The mounting board has a mounting board on which the jig is positioned and placed at a predetermined position, and one side of the mounting board has a drive source connection part, so that it can be moved laterally forward and backward by a drive device. A signal delivery section is provided adjacent to the setting position of the test jig on the forward side of the jig mounting station, and the test jig is placed on the jig mounting station. A test jig exchange mechanism for an autohandler for an electronic component tester, characterized in that it is connected and fixed to a connector of a signal transfer section by moving forward, and detached by moving backward.