JPS59201420A - Carrier rotating type water flow tank - Google Patents

Carrier rotating type water flow tank

Info

Publication number
JPS59201420A
JPS59201420A JP58076412A JP7641283A JPS59201420A JP S59201420 A JPS59201420 A JP S59201420A JP 58076412 A JP58076412 A JP 58076412A JP 7641283 A JP7641283 A JP 7641283A JP S59201420 A JPS59201420 A JP S59201420A
Authority
JP
Japan
Prior art keywords
carrier
water
water tank
water flow
pure water
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58076412A
Other languages
Japanese (ja)
Inventor
Hiroaki Yasaka
八坂 浩昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP58076412A priority Critical patent/JPS59201420A/en
Publication of JPS59201420A publication Critical patent/JPS59201420A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0414Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles

Landscapes

  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To improve the efficiency of washing by water by rotating the carrier accommodating wafers within the water flow tank. CONSTITUTION:The rotating force of a motor is transmitted to a gear 26 with a belt for rotate both carrier setting base 17 and carrier 16 at the specified speed. The pure water is injected from the holes 12 to wash the rotating wafers 15 by water. Thereby, the groove of carrier 16 can also be washed sufficiently, and the entire surface of wafer can be uniformly washed. Accordingly, washing efficiency can be improved and water flow time can be curtailed, thus saving the amount of water to be used.

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明は半導体製造1穆において、半導体ウェハの水
洗いに使用されるキャリア回転形光水槽に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a carrier rotation type optical water bath used for washing semiconductor wafers in semiconductor manufacturing.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

従来、半導体ウェハの水洗いは第1図に示すような流水
槽1により行われていた。この流水槽1は、底部に設け
られた純水供給口2,2・・・から純水を噴出し、第2
図乃至第4図に示すようにキャリア3に収納された複数
の半導体ウェハ4,4・・・の水洗いを行うものである
Conventionally, semiconductor wafers have been washed with water using a running water tank 1 as shown in FIG. This flowing water tank 1 spouts pure water from pure water supply ports 2, 2, etc. provided at the bottom, and
As shown in FIGS. 4 to 4, a plurality of semiconductor wafers 4, 4, . . . housed in a carrier 3 are washed with water.

しかしながら、この従来の流水槽lKあっては、純水供
給口2,2・・・から噴出した純水は決まった半導体ウ
ェハ4,4・・・間を通るため、キャリア3の溝部3a
、3a・・・の水洗効率が悪く、また各半導体ウェハ4
の全面を均一に水洗いすることができず、流水時間が長
くなり、純水供給流量が増大するという欠点があった。
However, in this conventional running water tank lK, since the pure water spouted from the pure water supply ports 2, 2... passes between fixed semiconductor wafers 4, 4..., the groove 3a of the carrier 3
, 3a... have poor water washing efficiency, and each semiconductor wafer 4
It is not possible to uniformly wash the entire surface with water, and the water running time becomes long, resulting in an increase in the pure water supply flow rate.

〔発明の目的〕[Purpose of the invention]

この発明は上記冥情に禿みてなされたもので、その目面
(r−1,手尋体ウェハの水洗効率を向上させることの
できるキャリア回転形光水槽を提供することにちる。
The present invention was made in response to the above-mentioned circumstances, and its object is to provide a carrier rotating type optical water tank that can improve the efficiency of washing wafers with water.

〔発明の概袂〕[Summary of the invention]

この発明は、内部に向けて純水を噴出する流水槽と、複
数の半導体ウェハを収納したキャリアを前記流水槽内に
おいて回転させるキャリア回転機構とを具備し、半導体
ウーエハを回転tながら水洗いを行うものである。
The present invention includes a running water tank that spouts pure water inward, and a carrier rotation mechanism that rotates a carrier containing a plurality of semiconductor wafers in the running water tank, and performs water washing while rotating the semiconductor wafers. It is something.

〔発明の実施例〕[Embodiments of the invention]

以下、図面を参照してこの発明の一実施例を説明する。 Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

第5図は有底円筒状の流水槽11を示すものである。こ
の流水槽11の底部には第6図に平面状態で示すように
複数の純水供給口12.12・・・が設けられており、
純水管13により送られてきた純水がこれら純水供給口
12゜12・・・から第7図に示すように垂直方向及び
斜め方向に噴出するようになっている。
FIG. 5 shows a cylindrical running water tank 11 with a bottom. A plurality of pure water supply ports 12, 12, . . . are provided at the bottom of the running water tank 11, as shown in a plan view in FIG.
The pure water sent by the pure water pipe 13 is spouted from these pure water supply ports 12, 12, etc. in vertical and diagonal directions as shown in FIG.

第8図は上記流水槽11にキャリア回転機構1−4と共
に、複数の半導体ウェハ15,1.5・・・を収納した
キャリア16を入れ、半導体ウェハ15.15・・・の
水洗いをしている状態を示すものである。
FIG. 8 shows that the carrier rotation mechanism 1-4 and the carrier 16 containing a plurality of semiconductor wafers 15, 1.5... are placed in the running water tank 11, and the semiconductor wafers 15, 15... This indicates the state of being.

キャリア回転機構14は、キャリア16が載置されるキ
ャリア載置台ノアとこのキャリア載置台17を水平に回
転させる水平駆動部18により構成されている。キャリ
ア載置台17は、懸吊板19の四隅にそれぞれ固定され
た細長い支持棒20・・・により載置部材21を支持し
てなる。また、水平駆動部18は、基端部において上記
懸吊板19に固定されると共に頭部に拡幅部22を有し
、吊し台23に設けられた孔24から吊り下げられた軸
25と、この軸25の外周部に設けられたギヤ26と、
駆動モータ(図示せず。)と、この駆動モータとギヤ2
6との間を連結するベルト27により構成されている。
The carrier rotation mechanism 14 includes a carrier mounting base noah on which the carrier 16 is placed, and a horizontal drive unit 18 that horizontally rotates the carrier mounting base 17. The carrier mounting table 17 supports the mounting member 21 by elongated support rods 20 fixed to each of the four corners of the suspension plate 19. The horizontal drive unit 18 is fixed to the suspension plate 19 at the base end, has a widened part 22 at the head, and has a shaft 25 suspended from a hole 24 provided in the suspension base 23. , a gear 26 provided on the outer periphery of this shaft 25;
A drive motor (not shown), this drive motor and gear 2
6 and a belt 27 connecting the two.

なお、28は軸25と吊し台23との間を封止するシー
ルでおる。
Note that 28 is a seal that seals between the shaft 25 and the hanging stand 23.

すなわち、この流水槽1ノにおいては、図示しない駆動
モータを駆動させると、その回転力がベルト27により
ギヤ26に伝達され、キャリア載置台17と共にキャリ
ア16が所定の速度で回転する。しかして、純水供給口
12.12・・・から純水カ噴出され、回転中の半導体
ウェハ1−5.15・・・の水洗いを行うものである。
That is, in this running water tank 1, when a drive motor (not shown) is driven, its rotational force is transmitted to the gear 26 by the belt 27, and the carrier 16 together with the carrier mounting table 17 rotates at a predetermined speed. Thus, pure water is jetted out from the pure water supply ports 12, 12, and washes the rotating semiconductor wafers 1-5, 15, and so on.

このようにこの流水槽11においては、半導体ウェハ1
5,15・・・を回転させながら水洗いを行うものであ
り、キャリア16の溝部も充分に水洗いすることができ
、また各半導体ウェハ15の全面を均一に水洗いするこ
とができる。
In this way, in this running water tank 11, the semiconductor wafer 1
5, 15, . . ., the grooves of the carrier 16 can be sufficiently washed with water, and the entire surface of each semiconductor wafer 15 can be uniformly washed with water.

従って、水洗効率が向上し、その結果流水時間が短かく
て済み、純水供給流量をも減少させることができる。
Therefore, the water washing efficiency is improved, and as a result, the water flow time can be shortened, and the pure water supply flow rate can also be reduced.

尚、上記実施例においては、キャリア回転機構14の水
平駆動部18を流水槽11の上方部に設けるようにした
が、流水槽11の底部に軸挿通用の孔を設け、水平駆動
部18を流水槽11の下部に設けるようにしてもよい。
In the above embodiment, the horizontal drive section 18 of the carrier rotation mechanism 14 is provided above the running water tank 11, but a hole for shaft insertion is provided at the bottom of the running water tank 11, and the horizontal drive section 18 is provided at the bottom of the running water tank 11. It may also be provided at the bottom of the running water tank 11.

〔促明の効果〕[Effect of promotion]

以上のようにこの発明によれば、キャリア内の半導体ウ
ェハを回転させながら水洗いを行うようにしたので、水
洗効率が向上する。′
As described above, according to the present invention, since the semiconductor wafer in the carrier is washed with water while being rotated, the washing efficiency is improved. ′

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の流水槽の構成を示′を斜視図、第2図は
第1図の流水槽にキャリアを収容し、た状態を示す平面
図、第3図は同じく側面図、第4図は同じく正面図、第
5図はこの兄明の一実施例に係る流水槽の構成を示す斜
視図、第6図は第5図の流水槽における純水供給口の配
置を示す図、第7図は同じく純水の噴出状態を示す図、
第8図は第5図の流水槽にキャリア回転機構を収容した
状態を示す斜視図である。 11・・・流水槽、12・・・純水供給口、13・・・
純水管、1−4・・・キャリア回転機構、15・・・半
導体ウェハ、16・・・キャリア。 出願人代即人 弁理9士 鈴 江 武 彦第5図   
   第6図
Fig. 1 is a perspective view showing the configuration of a conventional running water tank, Fig. 2 is a plan view showing a state in which the carrier is accommodated in the running water tank of Fig. 1, and Fig. 3 is a side view of the same; The figure is a front view, FIG. 5 is a perspective view showing the configuration of a flowing water tank according to an embodiment of this invention, FIG. 6 is a diagram showing the arrangement of the pure water supply port in the flowing water tank of FIG. Figure 7 is a diagram showing the pure water spouting state as well.
FIG. 8 is a perspective view showing a state in which the carrier rotation mechanism is accommodated in the running water tank of FIG. 5. 11... Running water tank, 12... Pure water supply port, 13...
Pure water pipe, 1-4...Carrier rotation mechanism, 15...Semiconductor wafer, 16...Carrier. Takehiko Suzue, 9th patent attorney, on behalf of the applicant Figure 5
Figure 6

Claims (1)

【特許請求の範囲】[Claims] 内部に向けて純水を噴出する流水槽と、複数の半導体ウ
ェハを収納したキャリアを前記流水槽内において回転さ
せるキャリア回転機構とを具備したことを特徴とするキ
ャリア回転形光水槽。
A carrier rotation type optical water tank comprising: a running water tank that spouts pure water toward the inside; and a carrier rotation mechanism that rotates a carrier containing a plurality of semiconductor wafers in the running water tank.
JP58076412A 1983-04-30 1983-04-30 Carrier rotating type water flow tank Pending JPS59201420A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58076412A JPS59201420A (en) 1983-04-30 1983-04-30 Carrier rotating type water flow tank

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58076412A JPS59201420A (en) 1983-04-30 1983-04-30 Carrier rotating type water flow tank

Publications (1)

Publication Number Publication Date
JPS59201420A true JPS59201420A (en) 1984-11-15

Family

ID=13604514

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58076412A Pending JPS59201420A (en) 1983-04-30 1983-04-30 Carrier rotating type water flow tank

Country Status (1)

Country Link
JP (1) JPS59201420A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0325936A (en) * 1989-06-16 1991-02-04 American Teleph & Telegr Co <Att> Cleaning of semiconductor wafer and device therefor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0325936A (en) * 1989-06-16 1991-02-04 American Teleph & Telegr Co <Att> Cleaning of semiconductor wafer and device therefor

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