JPS5931459A - Method and apparatus for inspecting printed circuit board - Google Patents
Method and apparatus for inspecting printed circuit boardInfo
- Publication number
- JPS5931459A JPS5931459A JP57052642A JP5264282A JPS5931459A JP S5931459 A JPS5931459 A JP S5931459A JP 57052642 A JP57052642 A JP 57052642A JP 5264282 A JP5264282 A JP 5264282A JP S5931459 A JPS5931459 A JP S5931459A
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- inspection
- board
- printed circuit
- pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 15
- 238000007689 inspection Methods 0.000 claims abstract description 31
- 238000012360 testing method Methods 0.000 claims description 12
- 238000001514 detection method Methods 0.000 claims description 5
- 230000006378 damage Effects 0.000 claims 1
- 210000004907 gland Anatomy 0.000 claims 1
- 239000000523 sample Substances 0.000 description 7
- 238000000605 extraction Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- IRUJZVNXZWPBMU-UHFFFAOYSA-N cartap Chemical compound NC(=O)SCC(N(C)C)CSC(N)=O IRUJZVNXZWPBMU-UHFFFAOYSA-N 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 210000001217 buttock Anatomy 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
【発明の詳細な説明】
本発明はブ１）ント配線（トｉの検沓方法旋びその検査
用装置に係り、さらに詳ｌ〜くけ、被検査物である７゜
１１ント配線板の表裏両面に加圧尋″「１イゴムのシー
ト状物を圧締１．て検査用治珪板の左６両端のコネク
タから’「Ｉｉ気を涌祐゛することにより、プリント配
線板のパターンの断線又はパターン間の尋１１１ｊ短絡
の有無を迅速簡便にしかも精度よく検査することのでへ
るプリント配線板の検査方法及びその検査用装置全提供
することを１」的とするものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to (1) a method for testing printed circuit boards (i) and an apparatus for inspecting the same, and more specifically, the present invention relates to a By pressurizing a sheet of rubber and squirting air from the connectors at both ends of the silica board for inspection, the patterns on the printed wiring board can be disconnected. Another object of the present invention is to provide a method for inspecting a printed wiring board and an apparatus for the inspection, which can quickly, easily, and accurately inspect the presence or absence of a short circuit between patterns.
従来、プリント配線板のバダ〜ンの断線又はこＩｚらパ
ターンｊ１１１の短絡の有無を検査する１４ｆ気尊フイ
検々−は、第１図に示すように隆触プ「Ｊ−ブをＦ下の
固定絶縁板を介１−てブ１１ント配、１．！ｉ！ 、Ｊ
ｉｌ、； ’＋ｆ＃のパターン端に挿入する方法によっ
て行われて−だ。Conventionally, the 14F test for inspecting the printed circuit board for disconnections or short circuits in the pattern J111 was carried out by pressing the bulge ``J'' under F as shown in Figure 1. 1.!i!, J
This is done by inserting it at the end of the pattern of '+f#.
しか；７ながら、接ｔｒｉ：Ｉじ７°ロープ（イ）０よ
１１０常直径がＩＪ膳から２．（Ｈ塀程度であるため、
２０鴎以下の間１爾のパッド間の”ボ気専電検査はきわ
めて困＠なものであつ乞
また 接触１０−ブは１０〜２０騙程度の厚さの絶縁板
に固定する必要があり、その固定用の絶縁板に接触プロ
ーブを挿入し７て固定することにより使用されている。However, the contact tri: Iji 7° rope (A) 0 to 110 normal diameter is 2. (Since it is about H wall,
It is extremely difficult to conduct a proprietary electrical inspection of the ``bore'' between the pads of less than 20mm, and the contact 10-branches must be fixed to an insulating plate with a thickness of about 10~20mm. It is used by inserting a contact probe into the fixing insulating plate 7 and fixing it.
そのため、固定用絶縁板−１１ｃ接触１０−ブを固定す
るだめの、化を多数あける作業が必要であり、この作業
は厳格な管理のもとにおかれた特別の専用孔明けｌｈ具
を必要としていた。Therefore, it is necessary to drill a large number of holes for fixing the fixing insulating plate-11c contact 10-b, and this work requires a special dedicated hole-drilling tool that is under strict control. It was.
一方、近年プリント配線板の回路密度が増加するにつれ
て、従来の孔に部品のリード線を挿入１〜半ＩＢ付けを
する実装方法においては、機器の小型化が作成できなく
なり、プリント配線基板トにフラノトパノケ〜ジＩＣな
どの平面素子付けを行ったり、壕だ直接液晶表示体を装
着する技術が要求されるに至った。On the other hand, as the circuit density of printed wiring boards has increased in recent years, the conventional mounting method of inserting component lead wires into holes and attaching 1 to 1/2 IBs has become impossible to miniaturize devices. Techniques for attaching planar elements such as flannel top panel ICs and for attaching liquid crystal displays directly into trenches have come to be required.
コ（７）様ナプリント配線板においては、接１’１４ｔ
−７”ローブを被検査用のプリント配線板Ｃ１の表裏両
面から接触させることが必要である。(7) For the printed wiring board, contact 1'14t
It is necessary to bring the -7" lobe into contact with both the front and back surfaces of the printed wiring board C1 to be inspected.
しかしながら、接触プローブ（イ）をプ１１ント配線板
の表裏両面から接触させることは、接触圧力が不均一に
なり、両面に存在するパターン回路の末端部分去左一般
に、検査すべきパターン回路の数と接触プローブとの関
係は、孤立した回路の約２倍の接触プＴＶ−ブの数を必
要とＬで増血するものであり、このような斂多くの接触
７゛１１〜プを被検査用のプ１）ント配線板の表裏両面
に配置する作業はＩｌ、ｑ雑であった。However, if the contact probe (A) is brought into contact with both the front and back surfaces of the printed circuit board, the contact pressure will be uneven, and the ends of the pattern circuits on both sides will be removed.In general, the number of pattern circuits to be tested will be The relationship between the contact probe and the contact probe requires approximately twice the number of contact probes as in an isolated circuit. 1) The work of placing printed circuit boards on both the front and back sides was tedious.
蓼た。このように、従来の検査方法ではパターン回路の
数が増加すＺ、に伴ｂプローブの使用数も増加し、また
−項線縁板に１．１；ｉ定さｆ７た接触７°ローブは容
易に再使用で缶ないなどの理由により、検査に要する費
用が非常にコスト高になるなどの欠截があった。I walked out. In this way, in the conventional inspection method, as the number of pattern circuits increases, the number of b probes used also increases, and the contact 7° lobe with a constant f7 of 1.1; Due to reasons such as the fact that the cans cannot be easily reused, the costs required for inspection are extremely high.
本発明はト記従来の７°１１ント配線板の検査方法の欠
をを解消（７、被検査物であるプリント配線板の両面の
パターンの断線又ｉｔパターン間の導通短絡の有無など
を同時に迅速容易にかつ精度よく、しかも、２．０鵡以
下の間隔で配置されｆＣ做密なパターン回路のブ１１ン
１〜配線板でも安ｆｉｌｆｉな費用で検査することので
きる検査方法及びそのｌ：、ｉ査用装置を提供するもの
である。The present invention solves the deficiencies in the conventional 7° 11 nt wiring board inspection method (7. Simultaneously checks for disconnections in patterns on both sides of the printed wiring board to be inspected, conduction short circuits between IT patterns, etc.) An inspection method that can quickly, easily, accurately, and inexpensively inspect even wiring boards with fC dense pattern circuits arranged at intervals of 2.0 cm or less, and the method thereof: , provides an i-inspection device.
次に本発明の実権例を図面に基いて説明する。Next, a practical example of the present invention will be explained based on the drawings.
第２図は、本発明のプリント配線板の検査方法及びその
検査用装置の一実施例を示す被検査物である）”リント
配線板の表裏両面に加圧導電ゴムのシート状物を圧締し
、パターン回路の検査端と検査用治具板の測定端とを正
対させた検査端に導通する外部収出用パターンと外部取
出用コネクターの一部の縦１＃？而を示すものである。Fig. 2 shows an object to be inspected showing an embodiment of the printed wiring board inspection method and inspection apparatus of the present invention.) A sheet of pressurized conductive rubber is pressed onto both the front and back surfaces of the lint wiring board. This shows the vertical 1# of a part of the external extraction pattern and the external extraction connector that are electrically connected to the inspection end where the inspection end of the pattern circuit and the measurement end of the inspection jig plate are directly opposed. be.
そして第３図は、上記＠２図の縦（折面１図とほぼ対１
、んする本発明の）゛１１ント配線板の検査方法に使用
大ねる装置の一例を示す斜視図である。And Fig. 3 is vertical (almost parallel to the folded surface Fig. 1) of Fig. @2 above.
11 is a perspective view showing an example of an apparatus used in the method of inspecting an component wiring board according to the present invention; FIG.
ト記第２図において、まず棹涌トた査をする彼検査板で
ちるプリント配線板（１）のパターン回路の端（ｊ″、
ｌ−ド、検査端という）のパッドと、これと相対応する
パターン回路を検出端（？）として検査用治具回路板（
３）の表面トに形成し、同時に外部引出用コネクタパッ
ド（４）と、前記コネクタパッド（４）と検出端（２）
とを接続するパターン、すな−ｂち、外部引出用パター
ン（５）を形成する。In Fig. 2, the edge (j'',
The pad of the test jig circuit board (referred to as the test end) and the corresponding pattern circuit are used as the detection end (?).
3), and at the same time a connector pad (4) for external extraction, the connector pad (4) and the detection end (2).
A pattern for connecting the external drawer pattern (5), namely, -b, is formed.
そして検査用治具回路板（３）と被検査物であるプ１１
ント配線板（１）との間に、加圧導電ゴムのシート状物
（６）を挟着する。つまり、前記プリント配線板（１）
の表裏両面に加圧尊重ゴムのシート状物（６）が圧締さ
れるように載置する。Then, the test jig circuit board (3) and the test object 11
A sheet-like material (6) of pressurized conductive rubber is sandwiched between the contact wiring board (1) and the printed circuit board (1). In other words, the printed wiring board (1)
A sheet-like material (6) of pressurized rubber is placed on both the front and back sides so as to be pressed.
このようにセットした後に、これら一体物のＦ部（ｉｌ
ｌと下部側とから一定の圧力を加え、前記コネクタパッ
ド（４） Ｋ ｄｆ気を涌市゛することにより、フ゛１
；ント配線板におけるパターンの断線又はパターン間の
短絡の何カ！曖を迅速簡便に［７て、しかも精度よく安
価に検査することができる。これは、第２図に示す様に
、被検査物である７°１１ント配紳板のパターン回路の
検査端と、検査用冶具回路板（３）との間に挟着さｈた
加圧導”ゼプムのシート状物（６）の１４査嬬と検出端
（２）との部分が圧締されることにより、該部分のゴム
のシート状物（６）の一部すなわち、加圧導電部分（７
）に“電流が流れることになるからである。すなわち、
Ａｉｌ記コネクタパッド（４）に電気を浦市すると検査
用治具回路板（３）を介して電流が流れ、７ｊｌｌ工導
軍ゴムのシート状物（６）のｆＪｉｒ記加圧面加圧通電
部分を通１〕でθだ検査物であるブ１１ント配線板のパ
ターン回路に電気が流れることになるという原理を応用
して、Ｅ記パターン回路の断線又はパターン間の尋涌短
絡の有無を検査するものである・
次に、本発明の７゛リント配線板の検査用装置〜につい
て説明する。After setting in this way, install the F section (il
By applying constant pressure from the bottom side of the connector pad (4) and pumping air into the connector pad (4),
; How many disconnections or short circuits between patterns occur on a component wiring board? It is possible to quickly and easily test for ambiguity [7], with high accuracy and at low cost. As shown in Fig. 2, this is the pressure applied between the inspection end of the pattern circuit of the 7°11-ant distribution board that is the object to be inspected and the inspection jig circuit board (3). By compressing the part of the conductive sheet (6) between the 14 probe and the detection end (2), the part of the rubber sheet (6) at that part, that is, the pressurized conductive Part (7
) because “current will flow through it. In other words,
When electricity is applied to the Ail connector pad (4), a current flows through the inspection jig circuit board (3), and the pressurized surface of the 7Jll conductive rubber sheet (6) is electrically conductive. Applying the principle that electricity will flow through the pattern circuit of the print wiring board, which is the object to be inspected, when θ is θ at 1], the presence or absence of a disconnection in the pattern E pattern circuit or a short circuit between patterns is inspected. Next, an apparatus for inspecting a 7-lint wiring board according to the present invention will be described.
溶３図において、被検査物である７゛リント配線板（１
）の表裏両面には、加用導マイゴムのシート状物（６）
を甲締するだめの検査ＩＩＪｉｎ具回路板（コ（）を切
“ｈえてひり、１）１［記（φ査用ｌｌ！１貝回路板Ｃ
４１＆−を加圧するだめの油田用ｖ１〕白８）に１つ−
Ｃ支持される。−まだ、ｒｔｉｌ記検査用治具回路４ｆ
ｉ （３１の表面１−に−け外部を伐出／’＋＋パダー
ン（５）と、こ７″Ｌト’ｊＪ ＩＴｎ ｆ １ ’４
ｉ’ｌ＜引出１４１′−１ネクタハノド（４）と全イ
イ１１斤−てしり、プリント剛椀板とその表裏面に圧締
される加「Ｆ導゛【１イゴムのシート状物（６）とのｉ
＋ｆ＋軍部分（７）に導通するように配設され−Ｃいる
６そして、４ｉｌ記検配用のプリント配置＋’４ ＋Ｆ
ｊ （１１の検査端と、検査用冶具回路板（３）の険出
瑞（２）とｋｊ、正対するように少くとも配置されて成
ることを特６１μするものである。In Fig. 3, the 7゛ lint wiring board (1
) is coated with a sheet of added conductive rubber (6) on both the front and back sides.
Inspection of the circuit board IIJin tool circuit board (K ())
41&- for pressurizing oil field v1] white 8) one -
C supported. -Not yet rtil inspection jig circuit 4f
i (Cut down the outside on the surface 1- of 31/'++ padan (5) and this 7''L to'jJ ITn f 1 '4
i'l < Drawer 141'-1 Nectar hanger (4) and all 11 sheets of rubber sheet (6), which is pressed onto the printed hard bowl board and its front and back surfaces. and i
+f+Arranged so as to be electrically conductive to the military part (7) -C 6 And print arrangement for 4il inspection distribution +'4 +F
It is particularly preferred that the inspection end of the test jig (11) and the protrusion (2) of the test jig circuit board (3) are arranged at least so as to face each other directly.
また、肢検ｔｉ勤プリント配線板を製作するために使用
さｈる′Ｊ４真フイｌレムを使用ｊノ乙前記検査用回路
板（３）を作成することができる。すなわち、前記外用
Ｎ−７具回路〜ｌｄ′呑易にかつ安１１１ａに咋・成す
ることができる。In addition, the test circuit board (3) can be made using J4 true film, which is used to produce a printed wiring board for physical examination. That is, the external N-7 device circuit 111a can be easily and easily constructed.
一方、本発明において１′ψ１［１する加圧尋゛直了ｌ
、のシート状物（６）は、一般に異方向性の加ＩＥ尋′
［１１臀１゛ムＨ料と１．て市売されて（八るものであ
ってもよく、人手が容易であり、しかも内Ｉｌｌ用かで
きるなどの利点があって、どのように緻密なパターン回
路を有するプ１１ント配ＹＯＪ板゛Ｖこ一ついても汎用
１４があるため冶具交換などの際にも経済１−有利であ
るなＦのり１果がある。On the other hand, in the present invention, 1'ψ1[1]
The sheet-like material (6) of
[11 Buttocks 1mm H fee and 1. It has the advantages of being commercially available (even if it is eight types), being easy to work with, and being able to be used internally. Even if there is one V, there is a general-purpose 14, so there is an economic advantage when replacing jigs, etc.
第１図は従来の１１１ント配線板の導通検査をする一η
法の一例を示す縦断面図、第２図は本発明のプリントＩ
”Ｉ旧ｌｉｊ板のｈ’ｉｔ徨〕ｉ法の一例を示す縦断１
６１（ツ１、第３図は本発明の７゛１１ント酎〈″ＩＩ
肘ｉの４’Ｚ釘査方法に１す１用する装置の斜視図であ
る。
Ｊ二Ｍｅ ｌ＊Ｉ ｉ４ｉにおいて、（１）・−ｙ”リ
ンｌ−配、ｓｉ！４ｗ、（２”ｌ 、、。
検出瑞、（３） 検査用冶具回路板δ板、（４）・・
外部引出Ｊ４１ コ＊ ｙ ｙ ハツト、（５）・・
外部引出用パターン、（６）・・・加ｔＣＪｇ石；了ｌ
、のジートイに仙ｆ、（７） 同シート状物の専゛
ボ部分、（８） 加ｎ月１１０ソト。
り、１Ｆ、作出願人
４１斐川市゛気Ｔ業株式会社
代表／７多賀４’、’−１一部Figure 1 shows a conventional 111-nt wiring board continuity test.
A vertical cross-sectional view showing an example of the method, FIG. 2 is a print I of the present invention.
``I old lij board's h'it error'' Longitudinal section 1 showing an example of the i method
61 (Figures 1 and 3 are the 7゛11 point chuu of the present invention〈''II
It is a perspective view of the apparatus used for the 4'Z nail examination method of the elbow i. In J2 Me l*I i4i, (1)・-y” ring l-arrangement, si!4w, (2”l,...) Detection, (3) Inspection jig circuit board δ board, (4)・
External drawer J41 * y y hat, (5)...
External drawer pattern, (6)...added CJg stone; completed
(7) Exclusive part of the same sheet, (8) 110 pieces per month. 1F, Applicant: 41 Hikawa City, Representative of Ki T Gyo Co., Ltd./7 Taga 4', '-1 Part
Claims (2)
板のｌ＊ ｈ☆）Ｍと検だ用〆ｈ貝回路板の検出端とを
１Ｆ対させ、１１１１記ア１１ント配腺イ没と検査用治
緩板とのＩｔｌＪに加ＰＥ専軍コ゛ムのシーｉ・１に物
を挟着して、７”１１ント配線板（１）パターンの断線
又はパターン間の４１ｉ、格の有無を１に査すＺ）こと
を特徴とする一ノ°１１ント配線板の１・１１査方法。(1) Pair the l*h☆)M of the bullet circuit board for inspection with the detection end of the circuit board for inspection, and set the In addition to the ItlJ of the gland destruction and inspection control board, insert an object into the seam I/1 of the PE dedicated comb to prevent disconnection of the 7" 11-nt wiring board (1) pattern, 41i between the patterns, or the gap. A 1.11 inspection method for a one-node 11-point wiring board, characterized in that Z) inspects the presence or absence of.
リント配置ｐｉ板の表裏両面に加１Ｆ導゛イプムを／Ｅ
ｉ’箭するだめの検査用１冶具Ｆ川路板を備え、前記治
ト（回路板は少くとも外部取出ＪＨ／（グーンと導通ず
る外部引出用コネクタバンドとをイ；ａＩえ、Ａｉｌ記
外部引出用パターンはＡｉｌ記治具回路板の表面にに形
成され、ｎＩｌ検九用プＩＩソト配線板の検査端と１・
央Ｎ用治具回路板の検出端とが正対するようにＩ’ｉ［
！置されて成る）゛リント配線板の検査用装置Ｎ。(2) J8waku1jj! At the 11th point where dE is to be done, add 1F guide plume to both the front and back sides of the printed layout pi board for i.
i' Equipped with 1 jig F for testing the circuit board, the circuit board is at least connected to the external drawer connector band that is electrically conductive. The pattern is formed on the surface of the Ail marking jig circuit board, and is connected to the inspection edge of the nIl inspection board and the 1.
I'i[
! An apparatus N for inspecting a printed wiring board (which consists of a lint wiring board)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57052642A JPS5931459A (en) | 1982-03-30 | 1982-03-30 | Method and apparatus for inspecting printed circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57052642A JPS5931459A (en) | 1982-03-30 | 1982-03-30 | Method and apparatus for inspecting printed circuit board |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5931459A true JPS5931459A (en) | 1984-02-20 |
| JPH0244035B2 JPH0244035B2 (en) | 1990-10-02 |
Family
ID=12920486
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57052642A Granted JPS5931459A (en) | 1982-03-30 | 1982-03-30 | Method and apparatus for inspecting printed circuit board |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5931459A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01102377A (en) * | 1987-10-16 | 1989-04-20 | Daiwa Seiko Kk | Method, apparatus and jig for inspecting printed circuit board |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5429053A (en) * | 1977-08-08 | 1979-03-03 | Nippon Electric Co | Inspecting apparatus for print substrate pattern |
| JPS54156760U (en) * | 1978-04-25 | 1979-10-31 |
-
1982
- 1982-03-30 JP JP57052642A patent/JPS5931459A/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5429053A (en) * | 1977-08-08 | 1979-03-03 | Nippon Electric Co | Inspecting apparatus for print substrate pattern |
| JPS54156760U (en) * | 1978-04-25 | 1979-10-31 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01102377A (en) * | 1987-10-16 | 1989-04-20 | Daiwa Seiko Kk | Method, apparatus and jig for inspecting printed circuit board |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0244035B2 (en) | 1990-10-02 |
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